Automatic judgment method of analytical instrument measurement results based on limited control application

An analytical instrument and automatic judgment technology, applied in the direction of material analysis, instruments, measuring devices, etc. using wave/particle radiation

Inactive Publication Date: 2017-08-29
SHENZHEN UNIQUE METRICAL TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] For this reason, the object of the present invention is to provide a kind of analysis instrument measurement result automatic judgment method based on limit control application, to solve the measurement measurement value of analysis instrument falls near the limit value, due to the existence of random error, the judgment whether qualified or not exists risk issues

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  • Automatic judgment method of analytical instrument measurement results based on limited control application

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Embodiment Construction

[0024] In order to illustrate the idea and purpose of the present invention, the present invention will be further described below with reference to the accompanying drawings and specific embodiments.

[0025] The method for judging the measurement results of an analytical instrument based on a limited control application provided by the embodiment of the present invention is applicable to any analytical instrument. The algorithm to obtain the standard deviation of each test, obtain the test content of the sample and obtain the standard deviation of the restricted component content, and then calculate based on the obtained standard deviation and the confidence degree. The value is compared and judged, so as to solve the judgment of the sample passing or exceeding the standard when the measured value measured by the analytical instrument falls near the limit value.

[0026] See figure 1 shown, figure 1 This is a flow chart of the automatic determination method for the measure...

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Abstract

The invention discloses a method for automatically determining a measurement result of an analytical instrument based on limited control application. The method comprises the following steps: by virtue of an algorithm through which detected standard deviation each time can be obtained, obtaining the detected content of a sample and the standard deviation of the content, combining the obtained standard deviation and a confidence coefficient, and performing comparative judgment on the combining result and the limit value of physical quantity of limited components in the sample, thereby judging whether the sample is qualified or exceeds the standard. Compared with the prior art, the method disclosed by the invention has the advantages that the risk problem existing in the process of judging whether the sample is qualified due to a random error because the measured value of the analytical instrument is nearby the limit value is effectively solved.

Description

Technical field: [0001] The invention relates to a method for judging the measurement results of an analytical instrument, in particular to a method for automatically judging the measurement results of an analytical instrument based on a limit control application. Background technique: [0002] As we all know, the measurement results of analytical instruments always contain systematic errors and random errors. Through reasonable quantitative algorithms, systematic errors can be reduced or even eliminated as much as possible (the following descriptions are based on the absence of systematic errors), but random errors are inevitable. There will be, but there will only be a problem of random error size due to different specific methods. [0003] At present, limit control is widely used in judging the measurement results of analytical instruments. Limit control means that a certain limit of the test result is specified. If the content is higher than the limit, it is unqualified...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/223
Inventor 殷家祥刘小东
Owner SHENZHEN UNIQUE METRICAL TECH
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