Automatic judgment method of analytical instrument measurement results based on limited control application
An analytical instrument and automatic judgment technology, applied in the direction of material analysis, instruments, measuring devices, etc. using wave/particle radiation
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[0024] In order to illustrate the idea and purpose of the present invention, the present invention will be further described below with reference to the accompanying drawings and specific embodiments.
[0025] The method for judging the measurement results of an analytical instrument based on a limited control application provided by the embodiment of the present invention is applicable to any analytical instrument. The algorithm to obtain the standard deviation of each test, obtain the test content of the sample and obtain the standard deviation of the restricted component content, and then calculate based on the obtained standard deviation and the confidence degree. The value is compared and judged, so as to solve the judgment of the sample passing or exceeding the standard when the measured value measured by the analytical instrument falls near the limit value.
[0026] See figure 1 shown, figure 1 This is a flow chart of the automatic determination method for the measure...
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