IC card service life testing method and device

A technology of life test and card reader, which is applied in the field of mechatronics, can solve the problem that the clamping position is not easy to fit the card reader, and achieve the effects of easier plugging and unplugging, saving human resources and convenient operation

Inactive Publication Date: 2015-03-25
NINGXIA UNIVERSITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The embodiment of the present invention provides a method and device for testing the service life of an IC card, which is used to solve the proble

Method used

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  • IC card service life testing method and device
  • IC card service life testing method and device
  • IC card service life testing method and device

Examples

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Example Embodiment

[0034] In order to provide an implementation scheme for automatically sucking and clamping an IC card and accurately fixing the position of the IC card, the embodiment of the present invention provides a method and device for testing the service life of an IC card. The preferred embodiments of the present invention will be described below with reference to the drawings. .

[0035] Refer to figure 1 As shown, an IC card service life test method provided by an embodiment of the present invention includes the following steps:

[0036] Step 100: After the power is turned on, the IC card is inserted, and the rubber roller of the clamping mechanism rotates to wind the IC card and clamp it.

[0037] Specifically, the IC card service life testing device includes a housing. From the outside, the housing is provided with a card insertion slot corresponding to the position where the IC card is rolled, so that the IC card can be inserted into the correct position. After the power is turned on, t...

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PUM

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Abstract

The invention discloses an IC card service life testing method and device. The problem that large friction is produced between an IC card and a card reader by a manual clamping device in the prior art is solved. The device comprises a clamping mechanism, a plug-pull unit, a card reader and a control unit. The clamping mechanism is used for involving an IC card in and clamping the IC card after the IC card is plugged. The plug-pull unit is used for driving a lead screw nut to move front and back along a lead screw through a stepping motor, the lead screw nut drives the clamping mechanism connected with the lead screw nut to move front and back, and the IC card can move front and back. The card reader is used for carrying out reading and writing operation on the IC card. When the reading or writing operation is not accurately executed, the stepping motor stops working. The IC card can be plugged into or pulled out of the card reader when the IC card moves front and back. The control unit is used for controlling the clamping mechanism, the plug-pull unit and the card reader to work cooperatively, and counting the reading operation or writing operation frequency. The IC card service life testing device can automatically clamp the IC card, the clamping position is standard, fiction between the device and the card reader is small, and the plug-pull situation approximates the actual plug-pull situation.

Description

technical field [0001] The invention relates to the field of machinery and electronics, in particular to a method and device for testing the service life of an IC card. [0002] Background technique [0003] At present, with the wide application of IC cards, it is necessary to test the plug-in life of IC cards and card readers. Most of the existing IC card plug-in test devices use manual clamping devices. Inserting and fixing IC cards in batches not only requires multiple users to insert and fix manually each time, but also the position of the clamping varies with each operation, which may easily cause conflicts between the IC card and the card reader. Large friction, it is not easy to align the card reader of the test IC card. When inserting, the card reader may be damaged, which consumes a lot of manpower and material resources. [0004] Contents of the invention [0005] The embodiment of the present invention provides a method and device for testing the service life...

Claims

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Application Information

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IPC IPC(8): G01R31/00
Inventor 陈晓峰刘小彦杨敏陈立福高宇康刘珍珍
Owner NINGXIA UNIVERSITY
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