Space effect test board, test system and method for testing device space effect

Abstract

The invention provides a space effect test board which comprises a processor, a control module, a detection module and an adapter, wherein the control module is correlated with the processor; the detection module is correlated with the control module; the adapter is correlated with the detection module and the control module and is used for bearing a Flash type FPGA device; the processor sends a corresponding test signal to the control module according to an instruction of a master control unit; the control module motivates the Flash type FPGA device borne by the adapter according to the test signal and controls the detection module to obtain output current information / logic coding of the Flash type FPGA device borne by the adapter; the detection module transmits the obtained current information / logic coding to the processor; and the processor processes the current information / logic coding and feeds back to the master control unit. Moreover, the invention also discloses a space effect system and a method for testing the space effect of the Flash type FPGA device. According to the space effect test board, the space effect system and the method, when the tested Flash type FPGA device undergoes single event latch-up or single event upset can be correctly recorded, and the test personnel can be helped to effectively estimate the performance of the tested Flash type FPGA device.

Description

technical field [0001] The invention relates to the field of semiconductors, in particular to a test board for Flash FPGA. Background technique [0002] FPGA (Field Programmable Gate Array) is an important tool widely used in modern communication technology, electronic technology, computer technology, and automation technology. It occupies an important position in aerospace integrated circuits. It is mainly divided into antifuse type, SRAM type and Flash type. There are three types. The programmable unit of the Flash-type FPGA is a Flash storage unit, which uses the floating gate in the transistor to store programming information. Flash-type FPGAs do not require an additional PROM when used, and the power-on time is also very short. In addition, Flash-type FPGAs are less prone to single-event flips than SRAMs, so Flash-type FPGAs are very suitable for aerospace applications. [0003] Before the Flash FPGA is used in a space system, it must be fully tested and evaluated for...

AI Technical Summary

Problems solved by technology

[0005] The modules of the space effect test board provided by the present invention are related to each other, and can be externally connected to the main control computer through the network, so as to store, analyze, compare and display the detection logic code in real time, overcoming the logic that only the peripheral interface can only be observed in the conventional technology, The ability to observe internal unit flips is limited, and the number of single event flips cannot be effectively evaluated, and the implementation is complicated and difficult to debug.

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