Spectral reconstruction algorithm

A spectrum reconstruction and algorithm technology, applied in color/spectral characteristic measurement, absorption/scintillation/reflection spectrum, spectrum investigation, etc., can solve the problem of low reconstruction accuracy, incomplete reflection of object reflectance change characteristics, and poor performance Reflect the boundary color spectrum characteristics and other issues, to achieve the effect of high reconstruction accuracy

Inactive Publication Date: 2015-05-20
UNIV OF SHANGHAI FOR SCI & TECH
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Problems solved by technology

However, in the prior art, the principal component analysis method only uses a set of principal components to predict the spectral reflectance of all objects or within a pre-selected range, and the spectral reconstru...

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Embodiment Construction

[0013] In order to make the technical means, creative features, goals and effects of the present invention easy to understand, the following embodiments will specifically illustrate the spectrum reconstruction algorithm of the present invention in conjunction with the accompanying drawings.

[0014] figure 1 is a flowchart of the spectrum reconstruction algorithm in the embodiment of the present invention.

[0015] like figure 1 As shown, in this embodiment, the spectral reconstruction algorithm 100 is used to reconstruct and calculate the spectral value of the object to be tested (ie, the sample set to be tested) according to the Munsell color system (ie, the training sample set). In this algorithm, the Munsell color system color block is used as the reference object, that is, the training sample, and the reference spectral value is obtained by collecting the training sample through a spectrophotometer. The specific steps of the spectral reconstruction algorithm 100 are as ...

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Abstract

The invention provides a spectral reconstruction algorithm. The spectral reconstruction algorithm comprises the following steps: (1) acquiring a CIE XYZ value of the CIE color space of a sample to be tested; (2) converting the CIE XYZ value of the sample to be tested into a CIEL*C*H* value according to preset rules; (3) carrying out sorting on a reference spectral value set formed by reference spectral values to obtain a corresponding subarea spectral value set; (4) according to a main-component analysis method, selecting three main components with large contribution rate in a subarea spectral value set as a first group of main components and calculating out a primary spectral value according to a reconstruction formula; (5) selecting subarea spectral values in the subarea spectral value set according to the primary spectral value, and selecting obtained screening spectral values to form a screening spectral value set; and (6) according to the main-component analysis method, selecting three main components with large contribution rate as a second group of main components in the screening spectral value set, and calculating to obtain a tested spectral value.

Description

technical field [0001] The invention relates to a spectral reflectance reconstruction algorithm, in particular to a spectral reconstruction algorithm. Background technique [0002] Spectral reflectance is an inherent property of an object, and the spectral reflectance of different objects is different, which can be called the "fingerprint" of the object. Spectral reflectance information of objects is often involved in the fields of printing, artwork reproduction, textiles and electronic commerce. Therefore, it is of great significance to measure the spectral reflectance of an object. In the prior art, the spectral reflectance of an object can be accurately measured by a spectrophotometer. However, the equipment such as a spectrophotometer is expensive and has low measurement efficiency, and the measurement can only be performed on objects with a certain size in a contact manner. Measure flat objects. [0003] In recent years, the method of predicting the object's spectral...

Claims

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Application Information

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IPC IPC(8): G01N21/25G01J3/42
Inventor 吴光远申晓莹叶程张建青刘真刘攀于海琦
Owner UNIV OF SHANGHAI FOR SCI & TECH
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