Frequency response characteristic calibration method, device and system of waveform generator

A waveform generator and frequency response characteristics technology, applied in the field of waveform generator frequency response characteristics calibration, can solve the problems of amplitude oscillation attenuation, low-pass, uneven frequency response characteristics, etc., to achieve the effect of improving calibration accuracy and flatness

Active Publication Date: 2015-06-03
SHENZHEN CITY SIGLENT TECH
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Problems solved by technology

[0003] Since the analog devices used in the signal channel, such as operational amplifiers and multipliers, exhibit low-pass and in-band uneven frequency response characteristic

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  • Frequency response characteristic calibration method, device and system of waveform generator
  • Frequency response characteristic calibration method, device and system of waveform generator
  • Frequency response characteristic calibration method, device and system of waveform generator

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[0019] Hereinafter, the present invention will be further described in detail through specific embodiments in conjunction with the drawings.

[0020] The method, device and system of the present application are applicable to waveform generators. In the embodiments of the present application, arbitrary waveform generators are taken as an example for description. In other embodiments, they are also applicable to other specific waveform generators, such as sine waves and sawtooth waves. Generator etc.

[0021] Please refer to figure 2 , This embodiment discloses a structural schematic diagram of a waveform generator frequency response characteristic calibration system. The system includes: a power meter 3 and a frequency response characteristic calibration device 1, wherein the power meter 3 is used to communicate with the waveform generator 2 to be calibrated. Connected, the power meter 3 detects the designated frequency point f of the waveform generator to be calibrated 2 n The act...

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Abstract

The invention relates to a frequency response characteristic calibration method and a device of a waveform generator. The method comprises the steps of obtaining an ideal output amplitude of frequency response at a designated frequency point and an actual output amplitude of frequency response at the current moment of the waveform generator to be calibrated, calculating a frequency response error at the current moment of the designated frequency point, and determining that calibration data provided to the designated frequency point is a sum of the frequency response error of the current moment and a frequency response error of a previous moment if the frequency response error of the current moment is less than or equal to a preset threshold. Since the calibration data of the waveform generator is obtained by a successive approximation calibration manner, an error between the actual output amplitude after calibration and the ideal amplitude is within a preset threshold scope, the calibration accuracy is improved, and further, the flatness of a frequency response characteristic amplitude of the waveform generator is improved.

Description

technical field [0001] The invention relates to the field of detection source instruments, in particular to a method, device and system for calibrating frequency response characteristics of a waveform generator. Background technique [0002] The basic composition of the existing waveform generator can be equivalent to figure 1 As shown in the block diagram, the basic flow of the waveform generator to generate signals is that the CPU configures the FPGA to generate waveform data and sends it to the DAC. π-type resistance attenuation, etc.) to adjust the amplitude to obtain a waveform signal output that conforms to the user's settings. [0003] Since the analog devices used in the signal channel, such as operational amplifiers and multipliers, exhibit low-pass and in-band uneven frequency response characteristics (referred to as frequency response characteristics), when the output signal is output, the amplitude will increase with the increase of the output frequency. Shock ...

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Application Information

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IPC IPC(8): G01R35/02
Inventor 阮仲华
Owner SHENZHEN CITY SIGLENT TECH
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