A method and device for detecting defective non-contact card chips
A non-contact card, poor technology, used in measuring devices, measuring electricity, measuring electrical variables, etc., can solve the problems of time-consuming, low efficiency, waste of manpower and material resources, etc.
Active Publication Date: 2018-08-31
GOLDPAC GRP LTD
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Problems solved by technology
[0002] In order to ensure the normal contactless function of IC cards, card manufacturers need to allocate a large number of personnel and time to the inspection of the contactless function. The non-contact test takes about 5-6 man-hours. According to the estimate of a small and medium-sized card issuance center issuing 10 million cards per year, the electrical test process alone takes more than 5,000 man-hours
This method is very inefficient and wastes too much manpower and material resources. This problem needs to be solved urgently
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[0026] The application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain related inventions, rather than to limit the invention. It should also be noted that, for the convenience of description, only the parts related to the related invention are shown in the drawings.
[0027] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present application will be described in detail below with reference to the accompanying drawings and embodiments.
[0028] Such as figure 1 As shown, a device 10 for detecting defective non-contact card chips includes: a card reader 101 for receiving a high-frequency signal fed back by a non-contact card;
[0029] Delay relay controller 102, connected with the card reader, is used to rec...
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The embodiment of the invention provides a method and apparatus for detecting the defectivenesss of non-contact card chips. The apparatus includes a card swiping device used for receiving high-frequency signals fed back by non-contact cards, a time-delay relay controller which is connected with the card swiping device and is used for receiving the high-frequency signals and transferring the high-frequency signals to a card manufacture equipment controller after a period of time delay, and a card manufacture equipment controller which is used for judging the reception of high-frequency signals, and controlling card manufacture equipment to stop working if not receiving the high-frequency signals. The embodiment of the invention also provides a method for detecting the defectivenesss of the non-contact card chips. With the method and apparatus for detecting the defectivenesss of the non-contact card chips of the invention adopted, detection efficiency of defective cards can be improved.
Description
technical field [0001] The present application relates to a consumer card production equipment, in particular to a device for detecting defective non-contact card chips. Background technique [0002] In order to ensure the normal contactless function of IC cards, card manufacturers need to allocate a large number of personnel and time to the inspection of the contactless function. The contactless testing takes about 5-6 man-hours. According to the estimate of a small and medium-sized card issuing center that issues 10 million cards per year, the electrical testing process alone takes more than 5,000 man-hours. This method is very inefficient and wastes too much manpower and material resources. This problem needs to be solved urgently. Contents of the invention [0003] In view of this, an embodiment of the present invention provides a device for detecting defective chips of a contactless card, which can effectively improve the detection efficiency of defective cards. [...
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IPC IPC(8): G01R31/00
Inventor 胡安辉周斌张琛航龚家杰
Owner GOLDPAC GRP LTD