Vertical probe device and supporter used in the same

Abstract

A vertical probe device (10) includes a lower die (30) having engaging holes (34) and needle holes (36), a positioning film (40) having limiting holes (42) and needle holes (44), probe needles (50) inserted through the needle holes, and supporters (60A to 60F, 70) having at least an upper stopping surface (622) and at least a lower stopping surface (662) for moveably limiting the positioning film therebetween. Each supporter has a head (62), a neck (64) passing through the limiting hole and having a length longer than the thickness of the positioning film, a body (66), and a tail (68) inserted into the engaging hole, which are connected in order, and at least one of the upper and lower stopping surfaces. The supporters can prevent the positioning film from being lifted and flipped over and enables the positioning film to move so that the probe needles are reliable.

Description

technical field [0001] The present invention relates to a probe card, in particular to a vertical probe device used in the probe card and a support column used in the vertical probe device. Background technique [0002] Please refer to the patent case of China Taiwan Patent No. I299085. The conventional vertical probe device includes a probe base composed of upper and lower guide plates or upper, middle and lower guide plates, and a positioning device between the upper and lower guide plates. sheet, and a plurality of probes, each probe has a head that passes through the upper guide plate and the positioning sheet, a tail that passes through the lower guide plate, and a curved body that is located in the accommodation space between the upper and lower guide plates The tail of each probe can move up and down when it touches the components to be tested with different heights to achieve the effect of fine-tuning the height of the needle tip. The positioning piece is used to pos...

AI Technical Summary

Problems solved by technology

However, the circuit board or space transformer connected to the top surface of the upper guide plate of the probe device may need to install electronic components. In this case, the top of the probe device needs to have a space for accommodating the electronic components, but electronic The component area often interferes with the block where the positioning piece is fixed on the lower guide plate. Therefore, the vertical probe device provided by the aforementioned patent is difficult to apply to the situation where the top needs to accommodate electronic components

[0006] In addition, please refer to the patent case of Taiwan, China, whose patent publication number is 201120452. This patent is to install a maintenance device in the probe device, so as to utilize the maintenance device to fix the positioning piece and avoid the positioning piece from being turned up. However, although the maintenance device It can achieve the function of fixing the positioning piece, but there are a little more components, so that the structure is a little complicated and the installation is more time-consuming

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