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A method for measuring distance between centers of rotation

A technology of the center of gyration and measurement method, applied in the field of measurement, can solve the problems of harsh experimental environment, non-constant, measurement error, etc., and achieve the effect of improving the scope of use, reducing the use conditions, and simple measurement structure

Active Publication Date: 2018-03-09
BEIJING INSTITUTE OF TECHNOLOGYGY
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Problems solved by technology

However, during the testing process, the rotary center of the rotary table is an abstract spatial point, and the selection and calculation of the point are very difficult.
At present, interference fringe method and semiconductor method are mostly used for measurement. Chinese patents disclose "equipment for interferometric distance measurement" (notification number: CN 103512505 A) and "distance measurement device" (notification number: CN 201844805 U) Two schemes, however, the use of the interference method is extremely demanding on the experimental environment, and the uncertainty of "bright and dark" fringe counts is prone to appear in the fringe recording, while the pure device test needs to rely on the special characteristics of some special materials, and the material In the process of repeated use, its characteristic values ​​are often not constant, which brings large errors and inconvenience to the measurement

Method used

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  • A method for measuring distance between centers of rotation
  • A method for measuring distance between centers of rotation
  • A method for measuring distance between centers of rotation

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Embodiment Construction

[0023] One, the embodiment of device of the present invention:

[0024] like figure 1 , 6 Shown, a kind of center of revolution measuring device, it comprises guide rail 2, the displacement stage 3 that is arranged on guide rail 2, is provided with the rotary table 1 of laser 4, target plane 6 and the camera 5 that is arranged on target plane 6; The guide rail 2 is arranged in parallel directly above the target plane 6 , and the rotary table 1 is arranged on the displacement platform 3 . The displacement table 3 is arranged on the guide rail 2 through a screw nut pair, the axis of the rotary table 1 is perpendicular to the axis of the guide rail 2 in the same horizontal plane, and the model of the camera 5 is a CCD / CMOS board-level camera. 3. The center of the laser 4 coincides with the rotation center of the rotary table 1. The present invention also includes a laser displacement sensor 9 which is arranged on the displacement platform 3 .

[0025] like figure 1 As shown,...

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Abstract

The invention relates to a measuring device and a method thereof, in particular to a measuring device for a center of rotation and a distance measuring method thereof. The camera on the target plane; the guide rails are arranged in parallel directly above the target plane, and the rotary table is set on the displacement platform. The present invention can effectively control the measurement uncertainty at Very small range (about 10 μm); the present invention adopts off-line measurement, and the motion accuracy of each moving part can be compensated by an algorithm, which expands its applicable use and has guiding significance for measurements with similar needs.

Description

technical field [0001] The invention relates to a measuring method, in particular to a measuring method for the distance between centers of rotation. Background technique [0002] The distance from the center of rotation of the rotary table to a certain plane is an important physical quantity in the mechanical field. However, during the testing process, the rotary center of the rotary table is an abstract spatial point, and the selection and calculation of the point are very difficult. At present, interference fringe method and semiconductor method are mostly used for measurement. Chinese patents disclose "equipment for interferometric distance measurement" (notification number: CN 103512505 A) and "distance measurement device" (notification number: CN 201844805 U) Two schemes, however, the use of the interference method is extremely demanding on the experimental environment, and the uncertainty of "bright and dark" fringe counts is prone to appear in the fringe recording, ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/14
Inventor 肖木峥王超汪喜成张之敬金鑫
Owner BEIJING INSTITUTE OF TECHNOLOGYGY