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A color ring resistor appearance defect and resistance integrated detection method

An appearance defect and integrated detection technology, which is applied in the direction of measuring resistance/reactance/impedance, optical testing flaws/defects, measuring devices, etc., can solve the problems of complex depth of field control, high cost, and high requirements for post-image processing, etc., to improve efficiency , Reduce detection cost, simple and practical structure

Active Publication Date: 2018-06-12
BEIJING INSTITUTE OF TECHNOLOGYGY
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Problems solved by technology

Method 2 requires multiple CCD cameras, which is costly and complicated to control the depth of field, and requires higher post-processing image processing. It is also not suitable for image acquisition of cylinders with small diameters such as metal film resistors.

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  • A color ring resistor appearance defect and resistance integrated detection method
  • A color ring resistor appearance defect and resistance integrated detection method
  • A color ring resistor appearance defect and resistance integrated detection method

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Embodiment Construction

[0038] The present invention will be described in detail below with reference to the accompanying drawings and examples.

[0039] Such as Figure 4 As shown, the present invention provides an integrated detection method for appearance defects and resistance value of color ring resistors; here, an RJ25 type metal film fixed resistor is taken as an example to illustrate the method for integrated detection of appearance defects and resistance value of color ring resistors. Such as Figure 5 As shown, the RJ25 metal film fixed resistor is mainly composed of axial leads at both ends and a rod body in the middle section. The outer circumference of the rod body is coated with a color ring mark. The method of the invention can not only measure the resistance value of the RJ25 type metal film resistor through the axial lead wire, but also can detect the appearance defect of the RJ25 type metal film resistor through the color ring mark.

[0040] Step 1. The color ring resistance enter...

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Abstract

The present invention discloses a color ring resistor appearance defect and resistance value integration detection method, which comprises that: 1, a color ring resistor enters a conveying mechanism through a feeding mechanism, and a rolling pressing mechanism rolls the axial lead wires on both ends of the color ring resistor to achieve the coaxial state with the color ring resistor rod body during moving; 2, when the color ring resistor reaches a rotation mechanism, the clamping device of the rotation mechanism clamps the axial lead wires, then the rotation mechanism rotates at a uniform speed, the resistance value of the color ring resistor is measured while the clamping, the sensor of a camera is triggered, and the measured resistance value is transmitted to a computer; 3, the camera acquires images when the color ring resistor rotates at the uniform speed; 4, the acquired images are transmitted into the computer so as to be subjected to image processing, and the appearance defect type is identified by using an appearance defect identifying algorithm; and 5, the comprehensive detection result of the appearance defect type and the resistance value is transmitted to a rejection mechanism, and the rejection mechanism performs the appropriate command so as to achieve the color ring resistor appearance defect and resistance value integration detection. According to the present invention, the resistance value measurement and the appearance defect detection are integrated so as to improve the color ring resistor detection efficiency.

Description

technical field [0001] The invention relates to the technical field of color ring resistance detection, in particular to an integrated detection method for appearance defects and resistance value of color ring resistance. Background technique [0002] During the painting process of color ring resistors, due to the concentration of the paint, the painting process, and the baking temperature, it may cause defects in the color ring on the surface of the resistor, such as broken rings, missing rings, and rings. The defect of the color ring on the surface of the resistor will affect the accurate identification of the resistance value during the assembly and quality inspection process, thereby affecting the replacement of parts and the performance of the product. The detection of resistance value is a necessary link in the detection of resistance products, and the resistance value of resistance is required to be controlled within the range of resistance value accuracy. For high-p...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/88G01R27/02
Inventor 胡耀光柯家伟闻敬谦毛林威邵光远
Owner BEIJING INSTITUTE OF TECHNOLOGYGY