A color ring resistor appearance defect and resistance integrated detection method
An appearance defect and integrated detection technology, which is applied in the direction of measuring resistance/reactance/impedance, optical testing flaws/defects, measuring devices, etc., can solve the problems of complex depth of field control, high cost, and high requirements for post-image processing, etc., to improve efficiency , Reduce detection cost, simple and practical structure
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[0038] The present invention will be described in detail below with reference to the accompanying drawings and examples.
[0039] Such as Figure 4 As shown, the present invention provides an integrated detection method for appearance defects and resistance value of color ring resistors; here, an RJ25 type metal film fixed resistor is taken as an example to illustrate the method for integrated detection of appearance defects and resistance value of color ring resistors. Such as Figure 5 As shown, the RJ25 metal film fixed resistor is mainly composed of axial leads at both ends and a rod body in the middle section. The outer circumference of the rod body is coated with a color ring mark. The method of the invention can not only measure the resistance value of the RJ25 type metal film resistor through the axial lead wire, but also can detect the appearance defect of the RJ25 type metal film resistor through the color ring mark.
[0040] Step 1. The color ring resistance enter...
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