Spectral microscopy device

A technique of microscopy and spectroscopy, applied in microscopes, measuring devices, Raman/scattering spectroscopy, etc.

Inactive Publication Date: 2016-01-13
CANON KK
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0017] Therefore, when observation is performed while moving the observation area, such as when a desired observation area is fou...

Method used

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Examples

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no. 1 example

[0034] refer to figure 1 , as a first embodiment, an exemplary structure of a spectroscopic microscope apparatus to which the present invention is applied is described.

[0035] Such as figure 1 As shown, the spectral microscope apparatus according to the embodiment includes a spectral detection unit 1 , a movement controller (movement unit) 2 , a control PC 6 , an output display 7 , and an observation region specifying mechanism 8 . The spectrum detection unit 1 includes a light source 3 , a microscope section 4 and a signal detector 5 .

[0036] The light source 3 is a laser light source or other light sources. For example, among these light sources, a light source configured to be able to change or select a wavelength (a light source capable of controlling an output wavelength) is included.

[0037] The type of light source is not limited, so that the light source can be selected from light sources having wavelengths ranging from the millimeter wave region to the X-ray r...

no. 2 example

[0076] refer to Figure 4A with Figure 4B , as a second embodiment, an exemplary structure of an excitation Raman spectroscopy microscope device to which the present invention is applied is described. Figure 4A is a schematic diagram of the function according to the second embodiment of the present invention. Figure 4B is a schematic diagram showing the microscope part in more detail.

[0077] The spectroscopic microscope device according to the present invention can be formed not only as the excitation Raman spectroscopic microscope device described above, but also as a coherent anti-Stokes Raman scattering spectroscopic microscope device easily, if the optical filter becomes an optical filter words. Furthermore, spectroscopic microscopy devices according to the present invention can be formed into various other types of microscopy devices, such as multiphoton absorption spectroscopic microscopy devices and sum frequency generation spectroscopic microscopy devices, if a...

no. 3 example

[0100] As a third embodiment, an exemplary structure using multivariate analysis for spectral analysis is described.

[0101] For example, multivariate analysis such as principal component analysis, independent component analysis, multiple regression analysis, or discriminant analysis can be performed to analyze spectral data including multidimensional components obtained in Examples.

[0102] If multivariate analysis is performed, it is possible to separate and extract signal sources even for complex multispectral originating from multiple sources.

[0103] Principal component analysis is a technique used to obtain new classification metrics from multivariate data. Independent component analysis is a technique for recovering independent signal sources using only the observed signals by allowing signal-independent transformations. Multiple regression analysis is a technique for obtaining the relationship between spectral components and signal sources and determining the signa...

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Abstract

A spectral microscopy device includes a spectral detecting unit including a light source that is capable of controlling an output wavelength, a microscope section that is provided with an observation area that is illuminated with light output from the light source, and a signal detector that detects light from the observation area as spectral data; a moving unit configured to move the observation area; and a controller that performs a control operation to allow the spectral detecting unit and the moving unit to move in response to each other. The spectral microscopy device is controlled so that switching between different measurement conditions is performed at an observation area movement time in which the observation area is moved by the moving unit and measurement is performed and at an observation area movement stoppage time in which the observation area is fixed and measurement is performed.

Description

technical field [0001] The present invention relates to a spectral microscope device for measuring spectral images of measurement objects. Background technique [0002] In recent years, spectroscopic microscopes utilizing nonlinear optical phenomena have been developed, and are expected to be used as units configured to observe the distribution of substances in living bodies. These microscopes exploit various nonlinear optical phenomena such as sum frequency generation and multiphoton absorption. [0003] Nonlinear Raman spectroscopic microscopy to obtain information about molecular vibrations is being developed. [0004] In nonlinear Raman scattering, the phenomenon that specific scattering occurs at the focal point is utilized when laser beams having two wavelengths are focused and the difference between the frequencies of the laser beams matches the frequency of molecular vibrations of a sample. [0005] These microscopes are scanning optical microscopes that focus very...

Claims

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Application Information

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IPC IPC(8): G01N21/27G01N21/65
CPCG01N21/65G01N21/3151G01N2021/653G01J3/06G01J3/4412G02B21/002
Inventor 教学正文
Owner CANON KK
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