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Testing system

A test system, Android system technology, applied in the field of electronics, can solve the problems of low equipment testing efficiency, a lot of labor, labor costs and time costs

Inactive Publication Date: 2016-01-27
WUHAN INSTITUTE OF TECHNOLOGY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The above-mentioned testing method needs to invest a lot of time for manual participation in the test, and the labor cost and time cost are relatively high, and some tests need to be carried out in the factory mode on the device side, or the production software on the Android device side needs to be debugged and user versioned. switching, making the testing efficiency of equipment on the production line lower

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Embodiment Construction

[0024] In order to enable those skilled in the technical field to which the application belongs to understand the application more clearly, the technical solutions of the application will be described in detail below through specific embodiments in conjunction with the accompanying drawings.

[0025] In the embodiment of the present invention, a test system is described, which is used for testing devices installed with an Android system.

[0026] Specifically, see Figure 1-Figure 2 , the test system includes a computer terminal and a device terminal, and the computer terminal is connected to the device terminal through the USB.

[0027] On the computer side include:

[0028] The test command storage control module 1 is used to extract the N test commands on the computer side and convert them into corresponding N execution commands, and send the N execution commands to the device side through the USB connection. Wherein, N is a positive integer. Specifically, the main purpo...

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Abstract

The invention discloses a testing system, and the system is used for testing equipment provided with an Android system. A computer end comprises a testing command storage control module which is used for extracting N testing commands of the computer end, converting the testing commands into corresponding N execution commands, and transmitting the N execution commands to an equipment end through a USB, wherein N is a positive integer; and a testing result report generation module which is used for analyzing and generating a testing result report after the execution of the N execution commands. The equipment end comprises a system debugging module which is used for obtaining the N execution commands transmitted by the computer end, carrying out the call of an echo display command to display the N execution commands, and then outputting the N execution commands to a first program module; the first program module is used for obtaining the N execution commands from the system debugging module, then connecting a network port of the equipment end, and transmitting the N execution commands; and a testing service module which is used for executing the N execution commands, and carrying out the corresponding testing of the equipment provided with the Android system.

Description

technical field [0001] The present application relates to the field of electronic technology, in particular to a testing system. Background technique [0002] For devices with Android system installed, whether it is a mobile phone or a tablet computer, the manufacturer needs to do some basic functional tests in the factory before the device leaves the factory, such as camera photography, microphone playback, Bluetooth search devices, etc., to ensure The basic functional integrity of the device. [0003] In the traditional solution, functional testing is mainly performed on the device side through manual participation. For example, a CIT (Customer Interface Test, user interface test) test module on the Android device side is generally developed as an Android application module for testing the device. It is realized by using the application development interface of the platform or the technology of invoking local methods through the Java language, so as to obtain the status ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04M1/24H04L12/26
Inventor 廖永富冉全
Owner WUHAN INSTITUTE OF TECHNOLOGY