Buck-Boost circuit fault feature extraction method under variable conditions

A circuit fault and feature extraction technology, applied in the direction of analog circuit testing, electronic circuit testing, etc., can solve problems that are difficult to apply to fault diagnosis and prediction

Active Publication Date: 2016-04-06
ANHUI UNIV OF SCI & TECH
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

At present, the fault feature extraction method of Buck-Boost circuit is easily affected by external working conditions such as input voltage and load, and the extracted fault feature parameters are difficult to apply to fault diagnosis and prediction under variable working conditions

Method used

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  • Buck-Boost circuit fault feature extraction method under variable conditions
  • Buck-Boost circuit fault feature extraction method under variable conditions
  • Buck-Boost circuit fault feature extraction method under variable conditions

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Embodiment Construction

[0034]The invention provides a Buck-Boost circuit fault feature extraction method under variable working conditions. The method is not affected by external working conditions and can accurately extract the Buck-Boost circuit fault feature.

[0035] In order to achieve the above object, the specific embodiments of the present invention are as follows:

[0036] (1) First obtain the two frequency domain characteristics of the Buck-Boost circuit, the specific steps are:

[0037] Construct the output-to-input transfer function G of the Buck-Boost circuit based on the unified circuit model of the ideal switching converter in continuous conduction (CCM) mode vg (s) and the output-to-control transfer function G vd (s), namely:

[0038] G v g ( s ) = v ^ ( s ...

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Abstract

The invention discloses a Buck-Boost circuit fault feature extraction method under variable conditions, comprising: first, obtaining two frequency domain characteristics of a Buck-Boost circuit; and secondly, obtaining a circuit state monitoring signal, utilizing discrete dyadic wavelet transform to obtain circuit frequency domain response amplitude frequency characteristics, and based on obtained amplitude frequency characteristics, utilizing a cat-swarm algorithm to identify parameters of each component, and using circuit component parameter values as fault characteristic parameters. The method does not relate to external parameters, thereby realizing Buck-Boost circuit fault feature extraction under variable conditions.

Description

technical field [0001] The invention relates to the technical field of fault feature extraction of power electronic circuits, in particular to a Buck-Boost circuit fault feature extraction method under variable working conditions. Background technique [0002] In the 21st century, driven by the general trend of energy conservation and environmental protection, in the fields of new energy power generation, large-scale energy storage devices, and electric vehicles, people's requirements for the voltage level and power level of power electronic devices continue to increase. Among them, Buck-Boost Circuits are receiving more and more attention, and the research on fault feature extraction of Buck-Boost circuits has great significance and application prospects. At present, the fault feature extraction method of Buck-Boost circuit is easily affected by external working conditions such as input voltage and load, and the extracted fault feature parameters are difficult to apply to f...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/316
CPCG01R31/316
Inventor 李振璧王康姜媛媛
Owner ANHUI UNIV OF SCI & TECH
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