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Imaging device and time-of-flight imaging method

A time-of-flight and imaging device technology that is applied to measuring devices, image communications, instruments, etc., and can solve problems such as increasing costs

Active Publication Date: 2019-06-14
INFINEON TECH AG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This may result in high or increased costs, for example

Method used

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  • Imaging device and time-of-flight imaging method
  • Imaging device and time-of-flight imaging method
  • Imaging device and time-of-flight imaging method

Examples

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Embodiment Construction

[0013] Various example embodiments will now be described more fully with reference to the accompanying drawings, in which some example embodiments are illustrated. In the drawings, the thickness of lines, the thickness of layers and / or regions may be exaggerated for clarity.

[0014] Therefore, while the example embodiments are capable of various modifications and alternative forms, embodiments thereof are shown in the drawings by way of example and will be described herein in detail. It should be understood, however, that there is no intent to limit example embodiments to the particular forms disclosed, but on the contrary, example embodiments are to cover all modifications, equivalents, and alternatives falling within the scope of the disclosure. . Like numbers refer to the same or similar elements throughout the description of the figures.

[0015] It will be understood that when an element is referred to as being "connected" or "coupled" to another element, it can be dir...

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Abstract

An imaging device and a time-of-flight imaging method are provided. The imaging device includes image sensor circuitry including time-of-flight sensor pixels. The imaging device further includes a first light emitter having a first spatial offset relative to the time-of-flight sensor pixels. The imaging device further includes a second light emitter having a second spatial offset relative to the time-of-flight sensor pixels. The imaging device further includes image processing circuitry configured to generate an image of the region of the object based on the first sensor pixel image data and the second sensor pixel image data generated by the time-of-flight sensor pixels. The first sensor pixel image data is based on received light emitted by the first light emitter and reflected at the area of ​​the object, and wherein the second sensor pixel image data is based on received light emitted by the second light emitter and reflected at the area of ​​the object.

Description

technical field [0001] Embodiments relate to generating three-dimensional images, and in particular, to imaging devices and time-of-flight imaging methods. Background technique [0002] Time-of-flight (TOF) systems are based on the principle of three-dimensional (3D) image sensors. For example, pixels may be more complex than those of a two-dimensional (2D) imager. For example, pixels can be larger. For example, high-resolution imagers may require large chip areas, large optics, and bulky cameras. For example, this may result in high or increased costs. Exemplary known time-of-flight systems are shown in DE 10 2012 205 448 A1, DE 40 11 041 A1, DE 10 2006 044 794 A1 or DE 10 2013 002 683 A1. Contents of the invention [0003] Some embodiments relate to imaging devices. The imaging device includes image sensor circuitry including time-of-flight sensor pixels. The imaging device further includes a first light emitter having a first spatial offset relative to the time-of...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04N5/335H04N5/232G01S7/4863G01S7/4865G01S17/894
CPCG01S17/08G01S7/4815G01S7/4863G01S7/4865G01S7/499G01S17/894H04N13/254
Inventor M·戴拉彻M·弗拉斯彻M·马克J·普莱恩萨克
Owner INFINEON TECH AG
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