Method for detecting material uniformity of spherical lens
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
- Publication Date
- 2016-05-11
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Abstract
Description
technical field
[0001] The invention belongs to the technical field of optical interference measurement and relates to a method for detecting uniformity of optical spherical lens materials. Background technique
[0002] High-precision optical imaging lenses are usually composed of multiple optical lenses. In order to achieve ideal imaging quality, the transmitted wavefront of the optical lens is required to reach the diffraction limit, and the material uniformity of the optical glass is one of the main sources of the transmission wavefront error of the optical lens. . In addition, when using the zero position compensation mirror method to detect the aspheric mirror surface shape, in order to obtain high-precision aspheric surface shape detection results, it is necessary to correct various error sources of the zero position compensation mirror. The influence of spherical wavefronts. In the above application fields, the uniformity detection technology of optical glass materi...