Resistive sensor array readout circuit and its readout method, a sensing system

Abstract

The invention discloses a resistive sensor array reading circuit based on a two-wire system isopotential method, and belongs to the technical field of sensors. The reading circuit of the invention is targeted at an M*N two-dimensional resistive sensor array which uses common row lines and column lines, and comprises a current feedback operation amplifier, a column line driving operation amplifier, a row multipath selector, a column multipath selector, a test current setting resistor, a voltage reference source and two connecting lines respectively arranged for each row line and each column line of the resistive sensor array The invention also discloses a reading method for the reading circuit and a sensing system. Compared with reading circuits in the prior art, the reading circuit of the invention adopts key technology of the two-wire system isopotential method, so that measurement errors due to connection of cable lead wire resistors, cable joint contact resistors and multipath switch channel conduction resistors can be effectively eliminated, and the measurement precision of the resistive sensor array can be greatly raised.

Description

technical field [0001] The invention relates to the technical field of sensors, in particular to a resistive sensor array readout circuit. Background technique [0002] The array sensing device is to combine multiple sensing elements with the same performance according to the structure of a two-dimensional array. It can change or generate corresponding shapes and characteristics by detecting changes in parameters focused on the array. This feature is widely used in biosensing, temperature tactile and thermal imaging based on infrared sensors, etc. [0003] Resistive sensor arrays are widely used in infrared imaging simulation systems, force tactile sensing and temperature tactile sensing. Taking temperature touch as an example, since the temperature sensing device involves the transfer of heat and the perception of temperature, in order to obtain the thermal properties of the object, the device puts forward higher requirements for the temperature measurement accuracy and re...

AI Technical Summary

Problems solved by technology

Lead resistances with basically the same resistance and contact resistances with different resistances have a significant impact on the test accuracy of the resistive sensor array

As far as the shared row and column resistive sensor array based on the equipotential method is concerned, the lead resistance and contact resistance cause the potential difference between the drive terminal of the readout circuit and the drive terminal of the resistive sensor array module, and also cause the The potential difference between the sampling terminal of the resistive sensor array module, thus destroying the ideal isolation feedback condition of the readout circuit, and making the resistance measurement error of the unit under test larger

Therefore, basically the same lead resistance and different joint contact resistance have a significant impact on the test results of the shared row and column resistive sensor array based on the equipotential method. At the same time, the channel conduction resistance of the multi-way switch in the traditional method will affect the unit under test. How to eliminate the influence of these factors is a problem to be further studied

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