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Control system for a microscope and method for controlling a microscope

A technology for control systems and microscopes, applied in general control systems, control/regulation systems, microscopes, etc., to solve problems such as inability to perform capture, measurement, and evaluation tasks, and achieve easy-to-operate results

Active Publication Date: 2021-08-06
CARL ZEISS MICROSCOPY GMBH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Thus, a user who performs relatively simple tasks of capturing, measuring and evaluating can be overwhelmed by the possibilities offered and thus by the complexity of the microscope, with the result that the user cannot carry out the capturing, measuring and assessment tasks

Method used

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  • Control system for a microscope and method for controlling a microscope
  • Control system for a microscope and method for controlling a microscope
  • Control system for a microscope and method for controlling a microscope

Examples

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Embodiment Construction

[0028] exist figure 1 In the illustrated embodiment, a control system 1 according to the invention (or a control device 1 according to the invention) and a microscope 2 to be controlled are shown together.

[0029] The microscope 2 includes a sample stage 3 carrying a sample 4 , an imaging lens system 5 , a moving unit 6 and a digital capture unit 7 . During operation of the microscope 2 , a magnified image (eg of a portion) of the sample 4 is generated by the imaging lens system 5 , which is captured by the digital capture unit 7 . The digital capture unit 7 may have a sensor, such as a CCD sensor or a CMOS sensor, in order to be able to capture digital images. The moving unit 6 is designed such that it can change the distance between the imaging lens system 5 and the sample stage 3 in the z direction, and thus change the distance between the imaging lens system 5 and the sample 4 in the z direction, and / or change the distance in the direction perpendicular to The position ...

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Abstract

The invention relates to a control system (1) for a microscope (2) and a method for controlling the microscope. The microscope has a sample stage (3) carrying an object (4), an imaging lens system (5) imaging the object carried by the sample stage and a digital capture unit (7) capturing the imaged object, wherein the control system is designed such that Provide a first mode of operation and a second mode of operation, in the first mode of operation, a user with a first user authority can edit and define at least one work sequence (Z1, Z2, Z3) for capturing objects and evaluating the captured objects; In the second operation mode, a user with the second user authority can select and execute one of the defined work sequences (Z1-Z3), and wherein the control system enables the user with the second user authority to execute the selected work sequence, It is possible to change the selected work sequence and / or to change parameters affecting the selected work sequence only within a predefined framework, but other changes are blocked.

Description

technical field [0001] The invention relates to a control system for a microscope and a method for controlling a microscope. Background technique [0002] The continuous improvement of microscopes means that, depending on the chosen design, microscopes are very complex measuring devices offering multiple possibilities for capture, measurement and evaluation. Thus, a user who performs relatively simple tasks of capturing, measuring and evaluating can be overwhelmed by the possibilities offered and thus by the complexity of the microscope, with the result that the user cannot carry out the capturing, measuring and evaluation tasks. Furthermore, complex capture, measurement and evaluation tasks can be available and still have simple operability. Contents of the invention [0003] It is therefore an object of the present invention to provide a control system for microscopes which enables simple operability even in the case of very complex microscopes. Furthermore, a corresp...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G05B13/02G02B21/32
CPCG02B21/32G05B13/0205G02B21/0016G02B21/365Y02P90/02
Inventor 克里斯托夫·克鲁格弗里德里希·威廉·维里克罗杰·兰多尔特马丁·库特格沃尔夫冈·贝尔林
Owner CARL ZEISS MICROSCOPY GMBH