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A multi-objective high-speed debug circuit

A multi-target, circuit technology, applied in electrical digital data processing, instruments, etc., can solve the problems of less printed information, slow speed, and inability to meet the needs of high-performance SoC chips.

Active Publication Date: 2019-03-12
FUZHOU ROCKCHIP SEMICON
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In the traditional design, because the overall chip is relatively simple and debugging only needs to set breakpoints and print debug pointer information, but as the design of the chip becomes more complex, the performance and running speed are getting higher and higher, the traditional debug design method It can no longer meet the needs of high-performance soc chips, the speed is too slow, and the printed information is too little, so further improvement is needed

Method used

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  • A multi-objective high-speed debug circuit

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Embodiment Construction

[0024] Such as figure 1 As shown, the multi-target high-speed debug circuit of the present invention includes a multi-core CPU system 100, a plurality of time information units 101, a time information control unit 102, a plurality of debug information collection units 103, and a plurality of ATB protocol conversion units 104 , An ATB mixing unit 105, an interface control unit 106, a configuration bus 107, and a protocol analysis unit 108;

[0025] The multi-core CPU system 100 includes a plurality of CPUs and a cache circuit, and each CPU and the cache circuit are respectively connected to the time information unit 101 and the debug information collection unit 103;

[0026] The time information control unit 102 is respectively connected to a plurality of time information units 101, an ATB mixing unit 105 and an interface control unit 106;

[0027] The plurality of debug information collection units 103 are all correspondingly connected to an ATB protocol conversion unit 104, and the...

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Abstract

The invention provides a multi-target high-speed debug circuit which comprises a multi-core CPU system, a time information unit, a time information control unit, a debug information acquisition unit, an ATB protocol conversion unit, an ATB mixing unit, an interface control unit, a configuration bus and a protocol analysis unit.The time information unit carries time information for each CPU and each cache circuit of the multi-core CPU system, and debug information is derived to observable IO of a chip through the debug information acquisition unit, the ATB protocol conversion unit, the ATB protocol conversion unit, the ATB mixing unit and the interface control unit in sequence.The protocol analysis unit controls all the modules through the configuration bus.Information interaction output between the multi-core CPUs arranged in an interaction mode in the multi-core CPU system can be achieved; meanwhile, besides an instruction pointer, processed output and CPU states can be printed in real time, and the requirements for the current high-performance soc chips developing at a high speed can be completely met.

Description

Technical field [0001] The invention relates to a SOC chip, in particular to a high-speed debug circuit of the SOC chip. Background technique [0002] With the rapid development of SOC chip technology, CPUs are running faster and faster, and higher requirements are put forward for chip debugging. [0003] In traditional design, because the overall chip is relatively simple and debugging only needs to set breakpoints and print the debug pointer information, but as the design of the chip becomes more complex, the performance and operating speed are getting higher and higher, the traditional debug design method It has been unable to meet the needs of high-performance SOC chips, the speed is too slow, and the printed information is too little, so further improvements are needed. Summary of the invention [0004] The technical problem to be solved by the present invention is to provide a multi-target high-speed debug circuit, which can realize the interactive setting between multi-core ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F13/38
CPCG06F13/385G06F2213/3852
Inventor 廖裕民苏培源
Owner FUZHOU ROCKCHIP SEMICON
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