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Formation method of semiconductor structure

A semiconductor and isolation structure technology, applied in the field of semiconductor structure formation, can solve the problems of poor stability and reliability, poor performance of flash memory, etc., and achieve the effect of good shape

Active Publication Date: 2019-01-22
SEMICON MFG INT (SHANGHAI) CORP
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] However, even if a self-aligned electrical contact process is used to make the conductive structure on the surface of the source region or the drain region, the formed flash memory still has poor performance, poor stability and reliability

Method used

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  • Formation method of semiconductor structure

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Embodiment Construction

[0033] As mentioned in the background art, even if the conductive structure on the surface of the source region or the drain region is fabricated by a self-aligned electrical contact process, the formed flash memory still has poor performance, poor stability and reliability.

[0034] Figure 1 to Figure 5 It is a schematic cross-sectional structure diagram of a forming process of a memory according to an embodiment of the present invention.

[0035] Please refer to figure 1 and figure 2 , figure 2 yes figure 1 A schematic diagram of a top view structure, a substrate 100 is provided, and the substrate 100 has several active regions, an isolation structure 101 is provided between adjacent active regions, and a gate structure 102 is provided on the substrate surface of part of the active regions. On both sides of the gate structure 102, there are respectively exposed source region trenches and drain region trenches on the surface of the substrate 100 in the active region and...

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Abstract

The invention provides a formation method of a semiconductor structure. The method includes the following steps that: a substrate is provided, a plurality of active regions are arranged in the substrate, and isolation structures are arranged between adjacent active regions, the substrate surfaces of a part of the active regions are provided with gate structures, two sides of each gate structure are respectively provided with a source region and a drain region; a first dielectric layer is formed on the surfaces of the active regions, the isolation structures and the gate structures; the first dielectric layer on the isolation structures is removed, initial through holes are formed in the first dielectric layer; a protective layer is formed on the surfaces of the side walls of the initial through holes; after the first dielectric layer at the bottoms of the initial through holes is removed, first through holes are formed in the first dielectric layer; a second dielectric layer is formed in the first through holes; after the first dielectric layer is removed, a second through hole and a source line trench are formed at two sides of each gate structure respectively; and drain conductive structures are formed in the second through holes, and source line conductive structures are formed in the source line trenches. The semiconductor structure formed by adopting the method has a beautiful appearance and stable performance.

Description

technical field [0001] The invention relates to the technical field of semiconductor manufacturing, in particular to a method for forming a semiconductor structure. Background technique [0002] In the current semiconductor industry, integrated circuit products can be mainly divided into three types: analog circuits, digital circuits and digital / analog hybrid circuits, among which storage devices are an important type of digital circuits. In recent years, among storage devices, flash memory (flash memory) has developed particularly rapidly. The main feature of flash memory is that it can keep stored information for a long time without power on, so it is widely used in various memories that urgently need to store data that will not disappear due to power interruption, and that require repeated reading and writing of data. Moreover, flash memory has the advantages of high integration, fast access speed, easy erasing and rewriting, etc., so it has been widely used in many fiel...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L27/11521H01L27/11531H01L21/768H01L21/28
Inventor 何其暘
Owner SEMICON MFG INT (SHANGHAI) CORP
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