A device and method for measuring LED junction temperature based on changes in spectral distribution
A technology of spectral distribution and centroid wavelength, applied to measuring devices, thermometers with physical/chemical changes, thermometers, etc., can solve the problems of large thermal effect gap, limited precision, uneven process level, etc., to achieve small junction temperature error, Easy to measure, easy to implement
Active Publication Date: 2018-09-14
CHANGZHOU INST OF TECH
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Problems solved by technology
The disadvantage of this method is that its pulse heating effect uses the average value, not the value of the actual LED
There are many LED manufacturers, and the process level is uneven. The actual thermal effect is far from the average value, so the accuracy is limited.
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[0035] The present invention will be described in detail below with reference to the accompanying drawings and specific embodiments.
[0036] like figure 1 As shown, a device for measuring and calculating LED junction temperature according to changes in spectral distribution includes a DC power supply 1, a thermostat 2, an integrating sphere 3 and a spectrum analyzer 5. The thermostat 2 is provided with an LED base 4, and the An integrating sphere 3 is provided on the LED base 4, and a spectrum analyzer 5 and a computer 6 are arranged outside the integrating sphere 3. The signal transmission end of the spectrum analyzer 5 is connected to the computer 6, and the probe of the spectrum analyzer 5 is transparent. Through the integrating sphere 3 to reach the inner wall, the DC power supply 1 is connected to the LED light source 7, the integrating sphere 3 is provided with a hole, the LED light source 7 passes through the hole on the integrating sphere 3 and reaches the integrating...
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The invention discloses a device and method for calculated the LED junction temperature according to change of spectral distribution. The device comprises a DC power supply, a thermostat, an integrating sphere and a spectrum analyzer, the thermostat is provided with an LED pedestal, the LED pedestal is provided with the integrating sphere, the spectrum analyzer and a computer are arranged outside the integrating sphere, the signal transmission end of the spectrum analyzer is connected with the computer, a probe of the spectrum analyzer reaches the inner wall of the integrating sphere, a DC power supply is connected with an LED light source, the integrating sphere is provided with a hole, the LED light source reaches the inside of the integrating sphere via the hole in the integrating sphere, the DC power supply is also connected with the computer, and the LED light source is placed on the LED pedestal. The method comprises the steps of measuring a vector of a junction temperature scale, measuring a reference curve and measuring the junction temperature to be measured. According to the device and method, only the routine spectrum analyzer and power supply are needed, the method and device are easy to realize, the centroid wavelength, half-height and full-width are easy to measure accurately, the repeatability is high, and thus, an error of the junction temperature is low.
Description
technical field [0001] The invention relates to an LED photoelectric detection device and a method thereof, in particular to a device and a method for measuring the LED junction temperature according to the change of the spectral distribution. Background technique [0002] The characteristics of light, electricity, color and life of LED (Light Emitting Diode) are closely related to the junction temperature. High junction temperature will make the performance of LED deteriorate or even fail. Maintaining a suitable junction temperature is beneficial to the optimization of LED performance. Therefore, how to measure the LED junction temperature quickly, scientifically and conveniently has become a breakthrough of the problem. [0003] The reported LED junction temperature measurement methods include forward voltage method (EIA / JEDEC standard JESD51-1, Chinese standard 200910198965.5, Chinese patent 200920212653.0, 200910198965.5), thermal resistance method (standard SJ / T11394-2...
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IPC IPC(8): G01K11/00
CPCG01K11/00
Inventor 饶丰郭杰徐安成朱锡芳周祥才
Owner CHANGZHOU INST OF TECH