The invention discloses a device for testing a phase change memory unit. The device comprises a signal generator, a measuring module, a conversion connection interface, a probe station, a controller, a unit array interface circuit and a digital oscilloscope, wherein a control signal is applied through the controller; an excitation signal is applied through the signal generator; and direct current I-V characteristics, pulse I-V characteristics, threshold voltage, threshold current, the minimum write pulse amplitude, the minimum write pulse width, the minimum erasing pulse amplitude, the minimum erasing pulse width, data retention time, erasing fatigue testing and other electrical characteristics of the phase change memory unit are tested by acquiring signals through the measuring module or the oscilloscope. By the device, the direct current I-V characteristics, the pulse I-V characteristics, the threshold voltage, the threshold current, amorphous resistance, crystalline resistance, the minimum write pulse amplitude, the minimum write pulse width, the minimum erasing pulse amplitude, the minimum erasing pulse width, the data retention time, the erasing fatigue testing and other electrical characteristics of the phase change memory unit can be accurately measured.