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Jet injector inlet for a differential mobility spectrometer

A differential migration and entrance technology, which is applied in the direction of instruments, scientific instruments, chemical instruments and methods, and can solve problems such as ion loss

Active Publication Date: 2016-08-31
DH TECH DEVMENT PTE
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0010] It has been found that ion losses mainly occur during the introduction of ions into the DMS analysis gap

Method used

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  • Jet injector inlet for a differential mobility spectrometer
  • Jet injector inlet for a differential mobility spectrometer
  • Jet injector inlet for a differential mobility spectrometer

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Embodiment Construction

[0056] FIG. 1 depicts the configuration of a typical DMS device 10 . The housing 11 surrounds two parallel electrodes 12, into which an asymmetrical and compensating voltage can be applied. The space between the two electrodes defines an analysis gap having a volume. Housing 11 has an inlet 13 into which ions and gases can flow and an outlet 14 . The area between the inlet and outlet defines a path 15 through which ions flow. Ions 16 entering the housing 11 are passed between two parallel electrodes 12, where the ions 16 are subjected to an asymmetric and compensating field that can separate ions with different ion mobility properties.

[0057] It will be appreciated that the electrodes 12 are connected to a suitable power source and controller which allows the generation of RF and DC fields through the electrodes 12 . Although the same identifiers are used herein to describe electrodes 12, it is to be understood that the electrodes may be configured such that separate RF a...

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Abstract

A method and apparatus for performing differential mobility spectrometer (DMS) which includes decreasing the amount of time that ions spend inside fringing fields generated by the DMS. The apparatus includes an entrance electrode plate sealingly engaged to the entrance of the DMS, and is electrically separated from the parallel plate electrodes of the DMS, the entrance electrode plate has an aperture for allowing the traversal of ions into the DMS; wherein the cross- sectional area of the aperture is less than the cross-sectional area of the ion path, the ion path being located between the two parallel plate electrodes of the DMS. The entrance electrode plate may also have a focusing potential applied to it for focusing of ions.

Description

[0001] Related applications [0002] This application claims priority to U.S. Provisional Application Serial No. 61 / 922,275, filed December 31, 2013, and U.S. Provisional Application Serial No. 61 / 935,741, filed February 4, 2014. Both applications The entire content of the case is hereby incorporated by reference herein. technical field [0003] The teachings herein relate to apparatus and methods for introducing ions into a differential mobility spectrometer. Background technique [0004] Analytical methods based on ion mobility separate and analyze ions under high pressure conditions (compared to mass spectrometers) based on differences in mobility coefficients in gases. Differential mobility spectrometers (DMS), such as conventional time-of-flight ion mobility spectrometers (IMS), separate and analyze ions based on their mobility properties, but provide orthogonal ion characterization. In IMS, ion separation occurs based on ion species cross-section, and in DMS, ion se...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B01D59/44
CPCG01N27/624H01J49/0031
Inventor 布拉德利·B·施耐德托马斯·R·柯维尔钦琼·那扎罗夫
Owner DH TECH DEVMENT PTE