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A tool microscope, a versatile technology, used in measuring devices, instruments, optical devices, etc., can solve the problems of low measurement accuracy, high operator requirements, and complicated operations, and achieve high detection accuracy, simple operation, and simple operation. Effect
Inactive Publication Date: 2016-10-12
ZHEJIANG JIEZHONG SCI & TECH CO LTD
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[0003] Due to the increasingly high precision requirements for various precision products in the contemporary era, the measurement accuracy of the existing universal tool microscopes is not high, which does not meet the precision requirements of precision products; moreover, the existing universal tool microscopes still have complex operations, High requirements for operators, not suitable for general staff to operate technical problems
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[0016] Next, the present invention will be described in further detail in conjunction with the accompanying drawings.
[0017] The present invention discloses a universal tool microscope, comprising a base platform 1, the base platform 1 is provided with an X-axis area 2, a Y-axis area 3 and an observation area 4; The two ends of the axis slide rail 22 and the X-axis slide rail 22 are respectively equipped with two pairs of thimble fixing mechanisms 5, and the X-axis slide rail 22 is also movably installed with a working platform mechanism 6. Between the mechanisms 5, two pairs of thimble fixing mechanisms 5 are used to tighten the working platform mechanism 6;
[0018] The Y-axis area 3 is provided with a Y-axis adjustment mechanism 7, and the Y-axis adjustment mechanism 7 is used to adjust the displacement of the working platform mechanism 6 in the Y-axis direction;
[0019] The observation area 4 is provided with an observation mirror mechanism 8 , and the observation mirr...
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Abstract
The invention belongs to the field of high-precision detection instrument equipment, and specifically relates to a universal tool microscope. The universal tool microscope comprises a base platform, and the base platform is provided with an X-axis zone, a Y-axis zone and an observation zone; the X-axis zone comprises an X-axis slide rail, the two ends of the X-axis slide rail are mutually movably provided with two center fixation mechanisms in an opposite mode, the X-axis slide rail is also movably provided with a workbench mechanism, the workbench mechanism is disposed between the two center fixation mechanisms, and the two center fixation mechanisms are used for abutting tight the workbench mechanism; the Y-axis zone is provided with a Y-axis adjustment mechanism, and the Y-axis adjustment mechanism is used for adjusting displacement of the workbench platform in a Y-axis direction; and the observation zone is provided with an observation mirror mechanism, and an observation mirror of the observation mirror mechanism and the workbench mechanism are in opposite arrangement. The universal tool microscope has the following advantages: the detection precision is high, the operation is simple, general personnel can also simply operate the universal tool microscope, and the like.
Description
technical field [0001] The invention belongs to the field of high-precision detection equipment, and in particular relates to a universal tool microscope. Background technique [0002] The universal tool microscope can accurately measure the dimensions, angles, shapes and positions of various workpieces, as well as various parameters of threaded parts. Applicable to machine manufacturing, precision engineering, mold manufacturing, instrumentation manufacturing, military industry, aerospace and automobile manufacturing, electronics industry, plastics and rubber industries for measuring rooms, checkpoints, colleges and universities, research institutes, Quality inspection and control of mechanical parts, measuring tools, knives, fixtures, molds, electronic components, circuit boards, stamping plates, plastic and rubber products. [0003] Due to the increasingly high precision requirements for various precision products in the contemporary era, the measurement accuracy of the ...
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Application Information
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