SMD automatic testing machine

An automatic testing machine and testing mechanism technology, applied in measuring devices, instruments, material analysis by optical means, etc., can solve the problems of high labor cost, low production efficiency, error-prone, etc., and achieve a high degree of automation, simple structure, less error-prone effect

Active Publication Date: 2016-10-12
MIANYANG HIGHLY TECH JINGWEIDA SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In the production process of testing and packaging of electronic products, due to the use of separate testing and packaging equipment, labor corresponding to the two sets of equipment is req

Method used

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  • SMD automatic testing machine
  • SMD automatic testing machine
  • SMD automatic testing machine

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Embodiment Construction

[0030] refer to figure 1 , figure 2 , a kind of SMD automatic testing machine of the present invention, comprises body 1, is provided with detection mechanism assembly 3 on the body 1 and is arranged on the feeding mechanism assembly 2 of the feeding end of detection mechanism assembly 3, is arranged on detection mechanism assembly The receiving mechanism assembly 4 of the discharge end of 3.

[0031] refer to Figure 6 , Figure 7 , the detection mechanism assembly 3 includes a detection channel 34 of L-shaped structure, the detection channel 34 includes an X-axis section 341 and a Y-axis section 342 that are connected to each other and are vertical, and the described blanking mechanism assembly 2 includes a blanking channel 21. The feeding channel 21 is perpendicular to the detection channel 34 of the X-axis section 341 and communicated with it. The end of the detection channel 34 of the X-axis section 341 is provided with a device for pushing the material 5 in the X-axi...

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Abstract

The invention discloses an SMD automatic testing machine. A detection mechanism assembly comprises a detection material channel with an L-shaped structure, the detection material channel comprises an X-axis segment and a Y-axis segment which communicate with each other, a blanking mechanism assembly comprises a banking material channel, the banking material channel is vertical to the detection material channel of the X-axis segment and is arranged in a communicating mode, the end portion of the detection material channel of the X-axis segment is provided with an X-axis material transfer mechanism used for pushing a material in the X-axis segment to the Y-axis segment, the two sides of the detection material channel of the Y-axis segment are each provided with a detection assembly capable of detecting the material disposed in the detection material channel of the Y-axis segment, the end portion of a feeding end of the detection material channel of the Y-axis segment is provided with a Y-axis material transfer mechanism used for pushing the material in the Y-axis segment to a detection position, and the end portion of a discharging end of the detection material channel of the Y-axis segment is connected with a material receiving mechanism assembly. The SMD automatic testing machine has the advantages of simple structure, high test efficiency and low error rate.

Description

technical field [0001] The invention belongs to the technical field of surface mount device testing and packaging, and relates to an SMD automatic testing machine, in particular to a surface mount device with a rectangular chip structure, such as a network filter and a network transformer. Background technique [0002] SMD (abbreviation for Surface Mounted Devices), that is, surface mount devices, mainly includes rectangular chip materials, cylindrical chip materials, composite chip materials, and special-shaped chip materials. For rectangular chip surface mount devices, it is necessary to inspect various specification parameters of the finished product after the production is completed, such as pin width, flatness, appearance characters, etc. The inspection is generally completed by manual or semi-automatic equipment. After passing the test, the product is packaged by packaging equipment such as a packaging machine, that is, the entire production of electronic products is c...

Claims

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Application Information

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IPC IPC(8): G01B11/04G01B11/30G01N21/84
CPCG01B11/046G01B11/30G01N21/84
Inventor 王强余代春张坤峰豆宏春曹洪波高香
Owner MIANYANG HIGHLY TECH JINGWEIDA SCI
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