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A Method for Determining the Isolation Degree of a V-Type Linear Impedance Stabilized Network

A technology for stabilizing network and linear impedance, which is applied in the direction of measuring resistance/reactance/impedance, instruments, measuring devices, etc. It can solve the problems that the characteristic impedance varies greatly with frequency and affects the accuracy of test results, etc., so as to simplify the test steps, improve efficiency, The effect of improving the accuracy of the test

Active Publication Date: 2019-05-17
BEIHANG UNIV
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  • Description
  • Claims
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AI Technical Summary

Problems solved by technology

[0006] When the LISN specified in the existing standard is working, the characteristic impedance changes greatly with the frequency, which affects the accuracy of the test results

Method used

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  • A Method for Determining the Isolation Degree of a V-Type Linear Impedance Stabilized Network
  • A Method for Determining the Isolation Degree of a V-Type Linear Impedance Stabilized Network
  • A Method for Determining the Isolation Degree of a V-Type Linear Impedance Stabilized Network

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Embodiment Construction

[0031] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0032] The invention provides a method for determining the isolation degree of a V-type linear impedance stable network, calculate and analyze the isolation degree of a V-type linear impedance stable network according to the present invention, and verify the correctness and reliability of the analysis method through experiments, such as Figure 5 As shown, it specifically includes the following steps:

[0033] Step 1: Analyze the circuit principle of the V-type LISN according to its functions and indicators;

[0034] According to the regulations of the International Radio Regulatory Commission on LISN circuits for electromagnetic compatibility tests, LISN circuits are divided into V-type and Δ-type structures. Firstly, analyze the principle of the V-type LISN circuit according to its signal isolation function realized in the experiment. The specific...

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Abstract

The invention discloses a V-type line impedance stabilization network isolation determination method, and belongs to the technical field of electromagnetic compatibility conduction emission test. According to the method, isolation of a V-type line impedance stabilization network can be analyzed through calculation. As for the LISN of which the component parameters are known, whether the isolation performance of the LISN meets the working requirements can be predicted and judged by the method. The method has a reference function for measurement and verification of the isolation index of the V-type line impedance stabilization network and has directive significance for design and development and production of the novel LISN of which the performance further meets the requirements.

Description

technical field [0001] The invention relates to a method for determining the isolation degree of a V-shaped linear impedance stable network, which can calculate and analyze the isolation degree of the V-shaped linear impedance stable network, and belongs to the technical field of electromagnetic compatibility conduction emission testing. Background technique [0002] In the electromagnetic compatibility conduction emission test, due to the different types of connections of the tested product, the power supply impedance at different positions varies greatly, resulting in drastic changes in the load terminal impedance of the tested product, which directly affects the test results of the tested product’s power line conducted emission . In order to make the conducted emission test results of power lines measured in different sites comparable, a linear impedance stabilization network (hereinafter referred to as LISN, Line Impedancestabilization network) is introduced in the elect...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R27/28G01R35/02
CPCG01R27/28G01R35/02
Inventor 苏东林吕冬翔戴飞陈尧
Owner BEIHANG UNIV
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