Detection method and detection system for film thickness abnormality

A detection method and detection system technology, which is applied to the authenticity inspection of banknotes, instruments, handling coins or valuable banknotes, etc., can solve problems such as abnormality and inability to accurately determine the thickness, and achieve the effect of accurate detection

Active Publication Date: 2019-06-04
WEIHAI HUALING OPTO ELECTRONICS CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The main purpose of this application is to provide a detection method and detection system for abnormal film thickness, so as to solve the problem that the abnormal film thickness judgment method in the prior art cannot accurately judge the abnormal thickness parallel to the direction of the detection point row

Method used

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  • Detection method and detection system for film thickness abnormality
  • Detection method and detection system for film thickness abnormality
  • Detection method and detection system for film thickness abnormality

Examples

Experimental program
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Effect test

Embodiment 1

[0051] use Image 6 The detection system detects the thickness of the film. The detection unit is a thickness sensor composed of a row of thickness chips to detect the thickness of the object and output the corresponding voltage value. The calculation unit is a DSP processor and the storage unit is a DRAM memory. The thickness sensor has five detection electrodes, which scan three rows of banknotes, that is, the detection points of three rows and five columns on the banknote ( figure 2 Two rows of detection points 100) are shown for detection, and detection voltages of three rows and five columns are obtained. Use analog-to-digital conversion unit to convert these detection voltages into digital signals P Y , Using the formula P Y -P (Y+1) Calculate the difference between the digital signals corresponding to the two adjacent detection points in each row. For example, the first row of digital signals is P in turn 1 , P 2 , P 3 , P 4 , P 5 , Make the difference of the correspondin...

Embodiment 2

[0055] The thickness of the film is detected by the same detection system as in Embodiment 1. It is also assumed that the thickness sensor has five detection electrodes in total and scans three rows. The digital signals of the detection points in the first row are sequentially P 11 , P 12 , P 13 , P 14 , P 15 ; The digital signal corresponding to the detection point in the second row is P 21 , P 22 , P 23 , P 24 , P 25 ; The digital signal corresponding to the detection point in the third row is P 31 , P 32 , P 33 , P 34 , P 35 ,among them figure 2 , image 3 , Figure 4 Two rows of detection points 100 are shown in.

[0056] Using formula P XZ -P (X+1)(Z+1) Calculate the difference between the digital signals corresponding to the two detection points in two adjacent rows and two adjacent columns, and the calculated result of the difference between the first row and the second row is P 11 -P 22 , P 12 -P 23 , P 13 -P 24 , P 14 -P 25 ; The difference between the second row and the...

Embodiment 3

[0059] The difference from embodiment 2 is that the formula P X(Z+1) -P (X+1)Z Calculate the difference of the digital signals corresponding to the two detection points in two adjacent rows and adjacent columns, and the calculated result of the difference between the first row and the second row is P 12 -P 21 , P 13 -P 22 , P 14 -P 23 , P 15 -P 24 ; The difference between the second row and the third row is P 22 -P 31 , P 23 -P 32 , P 24 -P 33 , P 25 -P 34 , figure 2 , image 3 or Figure 5 Two rows of detection points 100 are shown.

[0060] Comparing the above-mentioned difference result with the standard value, it is found that some of the difference result is larger than the standard value, and the shape of the foreign body can be judged as figure 2 , image 3 or Figure 5 .

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Abstract

The invention provides a detection method and system for film thickness abnormity. The detection method comprises the steps that S1) detection voltages of M rows and N columns of detection points of a film are obtained, or M rows and N columns digital signals corresponding to the detection voltages of M rows and N columns of detection points of the film are obtained, N is greater than or equivalent to 1, and M is greater than or equivalent to 2; S2) difference between the detection voltages or digital signals corresponding to at least two detection points in at least one row is obtained, and / or difference between the detection voltages or digital signals corresponding to at least two detection points in different rows and different columns is obtained, and at least one difference value is obtained; and S3) the absolute value of each difference value is compared with a standard value, and when the absolute value of at least one difference value is greater than the standard value, the film thickness has abnormity. The method can be used to detect thickness abnormity in a direction parallel with the column direction of the detection points as well as abnormity in other directions.

Description

Technical field [0001] This application relates to the field of film thickness detection, and in particular to a detection method and detection system for abnormal film thickness. Background technique [0002] In the field of banknote counterfeiting, banknote counters, banknote detectors, and sorting machines can identify the authenticity of banknotes through a variety of methods. When foreign objects are attached to banknotes, the thickness of the film banknotes will change. [0003] In the prior art, the detection process of film thickness abnormality is mainly: using detection electrodes to detect the voltage signals of multiple rows and multiple columns of detection points on the film, and convert the detected voltage signals into digital signals; The data in the same column is subtracted to obtain multiple sets of differences; finally, according to the difference, it is judged whether the thickness of the film is abnormal, and then whether there is foreign matter on the surfac...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G07D7/164
CPCG07D7/164
Inventor 戚务昌林永辉韩晓伟
Owner WEIHAI HUALING OPTO ELECTRONICS CO LTD
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