Unlock instant, AI-driven research and patent intelligence for your innovation.

A high-precision external micrometer calibration device

A micrometer, high-precision technology, applied in micrometer and other directions, can solve the problems of difficult to find the parallelism of the measuring surface, poor reliability of inspection results, etc., to achieve the effect of accurate measurement data and reduce errors

Active Publication Date: 2018-08-31
ANHUI PUYUAN SEPARATION MACHINERY MFG CO LTD
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The existing calibration methods are manual calibration, it is difficult to find the parallelism of the measurement surface by manual inspection, and the reliability of the inspection results is poor

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A high-precision external micrometer calibration device
  • A high-precision external micrometer calibration device
  • A high-precision external micrometer calibration device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0024] Below, the technical solution of the present invention will be described in detail through specific examples.

[0025] Such as Figure 1-3 as shown, figure 1 It is a structural schematic diagram of a high-precision external micrometer calibration device proposed by the present invention; figure 2 It is a schematic structural diagram of the first lifting bracket in a high-precision external micrometer calibration device proposed by the present invention; image 3 It is a structural schematic diagram of the second lifting bracket in a high-precision external micrometer calibration device proposed by the present invention.

[0026] refer to Figure 1-3 , a high-precision external micrometer calibration device proposed by the embodiment of the present invention, including: a detection platform 1, a first lifting bracket 2, a second lifting bracket 3, a standard gauge block 4, an upper bus bar calibration mechanism, and a side bus bar Calibration bodies, where:

[0027...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a high-precision outer diameter micrometer calibration device, which includes: a detection platform, a first lifting bracket, a second lifting bracket, a standard gauge block, an upper busbar calibration mechanism and a side busbar calibration mechanism, wherein: the detection platform It is used to support the frame of the micrometer in the test. The first lifting bracket and the second lifting bracket are used to lift and lift the measuring anvil and the micrometer screw in the micrometer respectively; for standard gauge blocks As a calibration reference, the upper busbar calibration mechanism is used to check the parallelism of the micrometer anvil and micrometer screw to ensure that the two are in the same horizontal plane; the side busbar calibration mechanism is used to check the calibration standard gauge block. Make sure that the standard gauge block is in the same vertical plane as the anvil and micrometer screw. The invention can quickly find the parallelism of the measuring surface through the mutual cooperation of the upper busbar calibration mechanism and the side busbar calibration mechanism, and the measurement data is accurate and reliable.

Description

technical field [0001] The invention relates to the technical field of external micrometer calibration equipment, in particular to a high-precision external micrometer calibration device. Background technique [0002] OUTSIDE MICROMETER (OUTSIDE MICROMETER) is often referred to as micrometer for short. It is mainly composed of a fixed ruler frame, an anvil, a micrometer screw, a fixed sleeve, a micrometer cylinder, a force measuring device, and a locking device. It is more precise than a vernier caliper. length measurement. To ensure the accuracy of the measurement results of the outer micrometer in the future, it needs to be checked regularly. The existing calibration methods are manual calibration, it is difficult to find the parallelism of the measurement surface by manual inspection, and the reliability of the inspection results is poor. Contents of the invention [0003] Based on the technical problems existing in the above-mentioned background technology, the prese...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01B3/18
CPCG01B3/18
Inventor 罗潇王世亮张琼
Owner ANHUI PUYUAN SEPARATION MACHINERY MFG CO LTD