Pin-type backlight test fixture
A technology for testing fixtures and backlights, which is applied in the direction of measuring electricity, measuring devices, and measuring electrical variables. It can solve problems such as low efficiency, inconvenient testing, and product shaking, and achieve the effect of convenient operation.
Pending Publication Date: 2017-01-04
HUANGSHAN AKENT SEMICON TECH
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Problems solved by technology
[0003] The purpose of the present invention is to provide a PIN pin-type backlight test fixture to solve the problem that during the existing PIN pin-type backlight test process, the product is prone to shake and cause the product to shine, which affects the electrical performance and service life of the product, or the test is not convenient enough , the problem of low efficiency
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[0015] Examples such as Figure 1 to Figure 3 A PIN pin-type backlight test fixture shown in the figure includes a bottom plate 1, and a set of positioning through holes 3 matching the pins of the backlight source 2 to be tested are arranged on the bottom plate 1, and the device in the positioning through hole 3 has a detachable A pin fixture 5 with conductive properties, the pin fixture 5 is a casing structure that is compatible with the positioning through hole 3, and the inner cavity of the casing structure is compatible with the 2 pins of the backlight source to be tested; the inner wall of the casing structure There are several gaps 6, and the gap 6 is provided with a conductive clamping structure 7 that can move radially along the casing structure. The diameter of the bottom of the clamping structure 7 is larger than the diameter of the mouth of the gap 6; the outer wall of the clamping structure 7 It is always in contact with the notch 6; the outer wall of the casing st...
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The invention discloses a pin-type backlight test fixture. The pin-type backlight test fixture comprises a bottom plate; a group of positioning through holes is formed in the bottom plate; pin clamps are arranged in the positioning through holes; each pin clamp is of a sleeve structure; a plurality of notches are formed in the inner wall of the sleeve structure of each pin clamp; clamping structures are arranged in the notches; the diameter of the bottoms of the clamping structures is larger than the diameter of the openings of the notches; the outer wall of each clamping structure is constantly connected with the corresponding notch; the outer wall of each sleeve structure is provided with screws; the screw rod parts of the screws pass through the outer wall of the corresponding sleeve structure and extend into the notches; the screw rods of the screws are sleeved with return pressure springs; the two ends of each return pressure spring respectively abut against the inner wall of the corresponding sleeve and the inner wall of the corresponding clamping structure; and the bottom of the bottom plate is provided with test wires connected with the sleeve structures. With the pin-type backlight test fixture of the invention adopted, the problem of influences on the electrical performance and service life of a product, or incontinence in testing and low efficiency which are caused by the flash of the product which is further caused by a condition that the product tends to swing in an existing pin-type backlight test process can be solved.
Description
technical field [0001] The invention relates to a PIN pin-type backlight source test fixture. Background technique [0002] In the existing production process, the test racks of PCB and pins use the push head to push the probe to connect the power to light up the backlight or manually clamp to realize the electrical performance test of the backlight pins. The shaking of the production line when testing the electrical properties of the product will cause the product to shine. Directly affect the electrical problems and service life of the product and some quality problems, and the efficiency is low. Contents of the invention [0003] The purpose of the present invention is to provide a PIN pin-type backlight test fixture to solve the problem that during the existing PIN pin-type backlight test process, the product is prone to shake and cause the product to shine, which affects the electrical performance and service life of the product, or the test is not convenient enough ...
Claims
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IPC IPC(8): G01R31/00G01R1/04
CPCG01R1/0408G01R31/00
Inventor 肖华军戴奋雄李平波
Owner HUANGSHAN AKENT SEMICON TECH