Mapping method for SCL model and CIM model
A mapping method and model technology, applied in the direction of comprehensive factory control, instrumentation, comprehensive factory control, etc., can solve the problem of incomplete conversion between SCL model and CIM model, and achieve the effect of avoiding unclear information.
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[0045] The method of the present invention will be described in detail below in conjunction with specific examples.
[0046] The invention discloses a method for realizing the lossless mapping between the 61850Ed2.0 SCL model and the 61970 CIM model based on the extended 61970 CIM model in the technical field of power system automation. Model mapping, conductive equipment model mapping, general equipment model mapping, topological relationship mapping, intelligent electronic equipment mapping, primary and secondary equipment association establishment, intelligent electronic equipment logical node mapping, intelligent electronic equipment measurement mapping. The invention aims at the problem that the conversion between the SCL model and the CIM model is incomplete due to the mapping difference between the existing SCL model and the CIM model, and formulates a mapping method by analyzing the structure, composition and content of the SCL and CIM models. For the difference betwee...
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