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A detection method of pixel performance

A detection method and technology of pixel performance, applied in image communication, television, electrical components, etc., can solve problems such as difficult CIS pixel performance, and achieve the effect of improving detection efficiency

Active Publication Date: 2018-05-29
SHANGHAI INTEGRATED CIRCUIT RES & DEV CENT +1
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0007] However, due to the large number of parameters and strong specialization, it is usually difficult to distinguish the performance of CIS pixels by parameters
Moreover, there is rarely an indicator that can unify all kinds of parameters

Method used

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Embodiment Construction

[0024] In order to make the content of the present invention clearer and easier to understand, the content of the present invention will be further described below in conjunction with the accompanying drawings. Of course, the present invention is not limited to this specific embodiment, and general replacements known to those skilled in the art are also covered within the protection scope of the present invention.

[0025] The following is attached Figure 1-3 The present invention will be described in further detail with specific examples. It should be noted that the drawings are all in a very simplified form, using imprecise scales, and are only used to facilitate and clearly achieve the purpose of assisting in describing the present embodiment.

[0026] see figure 1 , the detection method of the pixel performance of the present embodiment comprises:

[0027] Step 01: Obtain the parameters of pixels at different process stages; the parameters include: sensitivity, dark cu...

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Abstract

The invention provides a detecting method of pixel performance. The detecting method comprises steps of respectively obtaining parameters of pixels at different technical stages, wherein the parameter includes sensitivity, dark current, quantum efficiency, signal to noise ratio, dynamic scale and pixel dimension; calculating one comprehensive performance index according to parameter, wherein the comprehensive performance index is in direct proportion to quantum efficiency, light sensitivity, dynamic scale and signal to noise ratio, and in inverse ratio to the dark current and the pixel dimension; according to the comprehensive performance index, judge the pixel performance. Through arranging the comprehensive performance index, every important parameter of the pixel is uniformly reflected to the comprehensive performance index; the pixel quality and the pixel resolution rate can be monitored through one comprehensive performance index, thus the detecting efficiency is improved.

Description

technical field [0001] The invention relates to the technical field of image sensors, in particular to a method for detecting pixel performance. Background technique [0002] Image sensor chips are the "eyes" for electronic devices to obtain information, and have become an indispensable standard configuration for electronic terminal products. According to the "CMOS Image Sensor Industry Status" report of a market research company, the operating income of the CMOS image sensor (CIS) market will grow to 16 billion US dollars in 2020, with a compound annual growth rate of more than 11%. And even high-profile products in the field of integrated circuits. With the development of CMOS image sensor technology, the CIS market will be further applied and continue to grow in the fields of consumer electronics, wearable devices, surveillance security, artificial intelligence and other fields in the future. [0003] There are many types of CMOS image sensors, from the pixel resolution...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04N17/00
CPCH04N17/002
Inventor 李琛任铮温建新顾学强范春晖
Owner SHANGHAI INTEGRATED CIRCUIT RES & DEV CENT
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