Unlock instant, AI-driven research and patent intelligence for your innovation.

Storage device and method for defect scanning of the storage device

A storage device and defect technology, applied in information storage, read-only memory, static memory, etc., can solve the problems of increased time and time in the manufacturing process, and achieve the effect of shortening the inspection process

Active Publication Date: 2019-06-07
KK TOSHIBA
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] As storage capacity increases, so does the time required for defect scanning, and overall manufacturing process time increases

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Storage device and method for defect scanning of the storage device
  • Storage device and method for defect scanning of the storage device
  • Storage device and method for defect scanning of the storage device

Examples

Experimental program
Comparison scheme
Effect test

no. 1 example

[0020] figure 1 is a block diagram of the hard disk drive according to the first embodiment. The hard disk drive includes a magnetic disk 11, a spindle motor (SPM) 13, an actuator 14, a driver IC 15, a magnetic head IC 16, a main controller 20, and the like. The main controller 20 is connected to a host device (not shown, hereinafter simply referred to as a host).

[0021] The magnetic disk 11 is a magnetic recording medium that includes a writing surface for magnetically recording data. The magnetic disk 11 is rotated at high speed by a spindle motor 13 . The spindle motor 13 is driven by current (or voltage) supplied from the driver IC 15 .

[0022] The writing side of the magnetic disk 11 includes, for example, a plurality of concentric tracks. Optionally, the disk may comprise a spiral track. The magnetic disk 11 also includes a plurality of servo areas 11B extending in the radial direction and discretely arranged at regular intervals in the circumferential direction....

no. 2 example

[0054] will refer to Figure 5A , Figure 5B , Figure 5C and Figure 5D Defect scanning according to the second embodiment is described. The entire configuration of the hard drive is figure 1 The one shown is the same according to the first embodiment. As shown in Figure 2, in the first embodiment, the area where defect scanning was performed before delivery is the physical address from 0 to PBA scan1 Is a continuous area, user data area and physical address from 0 to PBA scan1 corresponding to the region. In contrast, in the second embodiment, two areas are scanned for defects before delivery. Such as Figure 5A shown, at the time of delivery there are physical addresses from 0 to PBA scan1 The first defect scan completes the area and physical address from the PBA scan-end1 to PBA max The second defect scan completes the area. In other words, at the time of delivery the entire area of ​​the storage medium including the physical address from the PBA scan1 to PBA ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A defect scan method is carried out to detect a defective portion in a storage medium of a storage device, the storage medium including multiple storage regions including a first storage region and a second storage region. The defect scan method includes scanning a part of the storage regions of the storage medium to detect a defective portion therein, before the storage device is connected to a host, a scanned storage region including the first storage region and a non-scanned storage region including the second storage region, mapping logical addresses to physical addresses of a non-defective portion of the first storage region, scanning the second storage region to detect a defective portion therein, after the storage device is connected to the host, and mapping logical addresses to physical addresses of a non-defective portion of the second storage region.

Description

[0001] Cross References to Related Applications [0002] This application is based on and claims priority to US Provisional Patent Application No. 62 / 235,734, filed October 1, 2015, the entire contents of which are hereby incorporated by reference. technical field [0003] Embodiments described herein relate generally to memory devices and methods for defect scanning of the memory devices. Background technique [0004] Defect scanning is typically performed on storage devices such as hard drives. Defect scanning is an operation of writing data into a storage medium such as a magnetic disk, testing whether the data can be normally read, and detecting defective sectors in which data cannot be normally read due to defects such as scratches on the medium. The physical address of the defective sector is registered in the defect list, and the defective sector is set as unusable. In order to set a defective sector as unusable, so-called skip processing may be performed when logic...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G11B20/18G11B19/04
CPCG11B20/1889G11B20/1816G11C16/10G11C16/26G11C29/38
Inventor 川井康正
Owner KK TOSHIBA