A probe reference compensation system and method

A benchmark compensation and probe technology, which is applied in the direction of measuring devices and instruments, can solve the problems of affecting the effect of product assembly, increasing costs, tilting, etc., and achieve the effects of saving processing costs, improving product quality, and saving probe time

Active Publication Date: 2019-03-12
浙江万物工场智能科技有限公司
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

However, since the 3D arc surface and the support surface of the jig are both arc surfaces, it is impossible to ensure that the 3D arc surface products are placed flat
Thereby increasing the working hours of the probe detection point and increasing the cost
Moreover, with the influence of material inclination, the actual processing plane of the product and the theoretical reference plane of the product will appear inclined, which will eventually affect the effect of product assembly

Method used

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  • A probe reference compensation system and method
  • A probe reference compensation system and method
  • A probe reference compensation system and method

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Embodiment Construction

[0017] In order to make the object, technical solution and advantages of the present invention clearer, various embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. However, those of ordinary skill in the art can understand that, in each implementation manner of the present invention, many technical details are provided for readers to better understand the present application. However, even without these technical details and various changes and modifications based on the following implementation modes, the technical solution claimed in this application can also be realized.

[0018] A first embodiment of the present invention relates to a probe reference compensation system. Such as figure 1 shown. This kind of probe reference compensation system includes a probe compensation device 1, a computing device and an axis machine 2. The probe compensation device 1 is connected to the computing device and the axis ma...

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Abstract

The present invention relates to the electronic device field, and discloses a probe reference compensation system and method. In the embodiment, the probe reference compensation system comprises a probe compensation device, a computing device and a shaft machine, the probe compensation device is connected with the computing device and the shaft machine, the computing device converts a 3D support curved surface into a virtual plane, the probe compensation device controls the shaft machine according to the angle of inclination of the virtual plane and the reference plane of a detected product to make the virtual plane parallel to the reference plane, wherein the four detection point positions in the same plane of the detected product form the reference plane of the detected product. According to the embodiment of the invention, the probe reference compensation system and method can effectively save the probe time, save the processing cost and improve the product quality.

Description

technical field [0001] The invention relates to the field of electronic devices, in particular to a probe reference compensation system and method. Background technique [0002] In the era of rapid development of science and technology, people's pursuit of quality of life is becoming more and more extreme. In terms of electronic products, in addition to the continuous pursuit of performance improvement, nowadays, product appearance and experience have gradually become the first choice for users to purchase. Among them, 3D arc surface products have become the mainstream of the market. [0003] At present, when processing products with large 3D arc surfaces on the market, the 3D arc surfaces are placed on the support surface of the jig. The 3D arc surface is used as a supporting surface. When processing the inner cavity, the probe is used to detect the processing part of the inner cavity for compensation to ensure the stability of the inner cavity size. However, since the 3...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B21/00
CPCG01B21/00
Inventor 刘超
Owner 浙江万物工场智能科技有限公司
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