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A system and method for tracking and measuring point targets

A tracking measurement and point target technology, which is applied in the field of tracking and measurement of point targets, can solve the problems that the speed index and accuracy index cannot meet the actual measurement needs and poor applicability, and achieve the effect of good applicability and accurate tracking measurement.

Active Publication Date: 2019-09-27
BEIJING LUSTER LIGHTTECH
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  • Description
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AI Technical Summary

Problems solved by technology

[0006] The purpose of the embodiments of the present invention is to provide a system and method for tracking and measuring point targets, so as to solve the problems of the existing systems for tracking and measuring point targets. The tracking and measurement of the motion trajectory, the speed index and the accuracy index cannot meet the actual measurement needs, and the applicability is poor

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  • A system and method for tracking and measuring point targets
  • A system and method for tracking and measuring point targets
  • A system and method for tracking and measuring point targets

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Embodiment Construction

[0023] In order to enable those skilled in the art to better understand the technical solutions in the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described The embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0024] The invention provides a system and method for tracking and measuring a point target. The system is provided with two imaging units, and each imaging unit includes a cylindrical lens and a line array camera, which can project the point target in the observation field of view. The movement on the surface is decomposed into two sub...

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Abstract

The invention discloses a system and method for tracking and measuring a point target. The system comprises two image forming units and an image processing device, wherein each image forming unit comprises a cylindrical lens and a line-scan digital camera connected with the image processing device, a pixel arrangement direction of the line-scan digital camera is vertical to the mother axis of the cylindrical lens, the point target forms a light stripe after being imaged by virtue of the cylindrical lens, and the line-scan digital camera is used for photographing the light stripe; the mother axes of the two cylindrical lenses are located on the same plane and are vertical to each other, and image forming optical axes are parallel with each other and appoint to the point target; and the image processing device is used for detecting the pixel coordinate value and photographing time of a pixel of a corresponding light stripe photographed by each line-scan digital camera in a preset frequency and synthesizing a movement locus curve of the target point on an observation view field projection plane according to the pixel coordinate value and the photographing time. The system can be used for positioning, tracking and measuring the target point in a relatively high sampling frequency and a relatively high resolution and is relatively good in applicability.

Description

technical field [0001] The invention relates to the technical field of image processing, in particular to a system and method for tracking and measuring a point target. Background technique [0002] Point targets generally have the following characteristics: the image size is small, only contains one or a few pixels, and basically does not carry target shape and pattern information. Usually, when the imaging distance of the object is far away, or the actual imaging target is only the feature point on the object, the object can be treated as a point target. [0003] For a point target, it is generally impossible to obtain its shape, outline and surface texture. On the projection surface, whether the observation point target exists, the position of the point target relative to the observation platform, and the actual trajectory of the point target on the projection surface of the observation field, etc. Based on this, if you don’t pay attention to the outline and surface fea...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01C21/20G06T7/246
Inventor 杨艺金刚
Owner BEIJING LUSTER LIGHTTECH
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