Macroscopic inspection system for glass substrate

A technology for macro inspection and glass substrates, applied in measuring devices, material analysis through optical means, instruments, etc., can solve the difficulties of finding glass substrates in more detail, observing glass substrates in multiple directions, and inspecting glass substrate defects and other issues, to achieve the effect of improving the yield rate, reducing production costs, and observing defects clearly

Pending Publication Date: 2017-05-17
JIANGSU HONGXIN YITAI INTELLIGENT EQUIP CO LTD
View PDF8 Cites 9 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] At present, with the development of technology and the demand of the market, the requirements for the pixel and aperture ratio of the glass substrate are getting higher and higher. Therefore, the wiring of the glass substrate is developing in the direction of miniaturization, and the direction of glass substrate array cells is developing, which makes it more difficult to inspect the defects of the glass substrate. Difficult, the current inspection machine lighting device on the market has a single angle, it is impossible to observe the glass substrate in multiple directions, and it is impossible to find out the defects of the glass substrate in a more detailed manner

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Macroscopic inspection system for glass substrate
  • Macroscopic inspection system for glass substrate
  • Macroscopic inspection system for glass substrate

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0033] The specific embodiments of the present disclosure will be described in detail below with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are only used to illustrate and explain the present disclosure, and are not used to limit the present disclosure.

[0034] Such as Figure 1 to Figure 4 As shown, the present disclosure provides a macroscopic inspection system for glass substrates, including a lighting device and a mounting frame for fixing the lighting device. On the one hand, the lighting device can be rotated on the mounting frame to change different illumination angles; On the one hand, it is also possible to realize the translation of the lighting device on the installation rack to adapt to the size of different glass substrates. The following two aspects will be further explained.

[0035] Such as figure 1 As shown, in order to realize the rotation of the illuminating device, in this embodiment, one sid...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a macroscopic inspection system for a glass substrate. The macroscopic inspection system comprises an illuminating device and a mounting rack for fixing the illuminating device, wherein one side of the illuminating device is connected to the mounting rack through a rotating shaft (6), and the other side of the illuminating device is connected to the mounting rack through a first driving mechanism; the first driving mechanism can drive the illuminating device to rotate around the rotating shaft (6). In this way, defects of the glass substrate at different angles can be observed under the condition that an operator performs observation without motion, the observation is clearer, defect forming reasons are calculated and analyzed conveniently, upstream process parameters are improved, the yield of the glass substrate is increased, and the production cost is reduced.

Description

Technical field [0001] The present disclosure relates to the inspection field of glass substrates, and in particular to a macro inspection system for glass substrates. Background technique [0002] At present, with the development of technology and market demand, the requirements for glass substrate pixels and aperture ratio are getting higher and higher. Therefore, the glass substrate wiring is developing in the direction of miniaturization, and the glass substrate array is cell-oriented, which leads to more defects in the inspection of glass substrates. Difficulty, the current inspection machine lighting device on the market has a single angle, cannot observe the glass substrate in multiple directions, and cannot find out the defects of the glass substrate in a more detailed manner. Summary of the invention [0003] The purpose of the present disclosure is to provide a glass substrate macro inspection system, which can inspect glass substrates from multiple angles. [0004] In or...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88G01N21/89
CPCG01N21/8803G01N21/8806G01N21/8901G01N21/8914G01N2021/8835G01N2021/8908
Inventor 邓永松李青丁力刘磊李兆廷蔡杰
Owner JIANGSU HONGXIN YITAI INTELLIGENT EQUIP CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap