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Method for evaluating NOR and NAND flash memory performance

A flash memory and performance technology, applied in the field of NOR and NAND flash memory performance evaluation, can solve the problem of poor comprehensive operation ability

Active Publication Date: 2017-05-17
NORTHWESTERN POLYTECHNICAL UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In order to overcome the deficiency of the poor comprehensive operation ability of the existing flash memory performance evaluation method, the present invention provides a kind of NOR and NAND flash memory performance evaluation method

Method used

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  • Method for evaluating NOR and NAND flash memory performance
  • Method for evaluating NOR and NAND flash memory performance
  • Method for evaluating NOR and NAND flash memory performance

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Embodiment Construction

[0031] The specific steps of NOR and NAND flash memory performance evaluation method of the present invention are as follows:

[0032] 1. Read and write speed U 1 test.

[0033] The read / write speed expression is shown in formula (1):

[0034] Speed=TotalSize / TotalTime (1)

[0035] The steps of reading and writing test method are as follows:

[0036] 1) Initialize the time variable and timer, and set the initial file size and block size.

[0037] 2) Create the corresponding file, and set the file write mode to non-cache mode.

[0038] 3) Record the time stamp, read and write the file with the set block size as the unit, and the read and write data size is the file size.

[0039] 4) Record the timestamp and delete the file.

[0040] 5) Increase the block size and cycle steps 2-5 until the block size reaches the set maximum value.

[0041] 6) Calculate the read and write speed of the flash memory according to the formula (1).

[0042] 2. Mounting time U 2 test.

[0043...

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Abstract

The invention discloses a method for evaluating NOR and NAND flash memory performance. The method is used for solving the technical problem of poor comprehensive operational capability of a present flash memory performance evaluation method. According to the technical scheme, the method comprises the following steps: firstly, testing a read-write speed U1 of the flash memory, and then testing the mounting time U2 of the flash memory, the average loss U3 of the flash memory, the memory consumption U4 of the flash memory, the hardware read / write speed U5 of the flash memory, the erasing speed U6 of the flash memory, the erasing energy consumption U7 of the flash memory, the hardware read / write energy consumption U8 of the flash memory and the file system energy consumption U9 of the flash memory in turn, and finally adopting a rank correlation analysis method for comprehensively evaluating the indexes from U1 to U9. The comprehensive evaluation for 9 indexes related to read-write, loading, erasing and energy consumption of the flash memory is adopted; the read-write speed, the file system operation capacity and the energy consumption related to the performance test for the flash memory are estimated; a corresponding index system is supplied for the three aspects of file system, hardware driving and energy consumption; and a rank correlation method is adopted for carrying out comprehensive evaluation and calculation, so that a test result can reflect the comprehensive capacity of the flash memory in the aspects of read-write, loading, erasing and energy consumption.

Description

technical field [0001] The invention relates to a flash memory performance evaluation method, in particular to a NOR and NAND flash memory performance evaluation method. Background technique [0002] The document "NOR-type FLASH memory test technology, electronics and packaging, March 2016, Vol16(3), p15-19" discloses the method of using the DSIO module of the J750EX system to dynamically generate test vectors for Flash testing. This method uses hardware circuit To test the hardware layer of the flash memory, first complete the setting of the flash memory system channel and pin according to the J750EX standard method, then write the test vector and set the data transfer trigger point to send data to the specific pin through the micro-control instruction, and finally pass the determination of the specific pin The data evaluates the flash memory hardware situation. This method is a test for the hardware layer of Flash, and cannot fully evaluate the performance of Flash memory...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/56
CPCG11C29/56G11C29/56016
Inventor 朱怡安李联任佩琪徐帅罗殊彦
Owner NORTHWESTERN POLYTECHNICAL UNIV
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