Test clamp suitable for high-temperature lasting creep deformation of plate-like test sample
A technology for plate-shaped specimens and creep tests, which is applied to measuring devices, instruments, scientific instruments, etc., can solve the problems of test result influence, reduce data reliability, increase test failure, etc., so as to reduce the probability of test failure and improve test performance. Flexibility, avoiding the effect of data inaccuracy
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment
[0032]In the example, the thickness of the sample is 1.5mm, and the block assembly of the corresponding specification is selected to carry out the test. Before the test, the clamping of the plate sample and the pad assembly is completed on the operating platform. When clamping the sample, the nuts do not need to be tightened too tightly, as long as the components 3-1, 3-3 and the clamping end 3-2 of the sample are in good contact. Then, place the pad assembly and the plate-shaped sample as a whole into the arc-shaped groove at the bottom of the inner cavity of the fixture to complete the connection between the fixture and the plate-shaped sample.
[0033] For materials with limited size, the size of the clamping end of the plate-shaped sample can be appropriately reduced. If necessary, the clamping end of the plate-shaped sample can not be processed with round holes, which will not affect the clamping of the sample and the durable creep test.
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com