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Aging control of a system on chip

A system-on-chip and controller technology, applied to instruments, measuring devices, calculations, etc., can solve problems such as users cannot share credit

Inactive Publication Date: 2017-05-31
NAGRAVISION SA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

An e-wallet can be uniquely bound to a given chip embedded with a Unique Identifier (UID), making it impossible for users to share that credit

Method used

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  • Aging control of a system on chip
  • Aging control of a system on chip
  • Aging control of a system on chip

Examples

Experimental program
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Embodiment Construction

[0032] According to a preferred configuration, the aging controller is based on a ring oscillator RO circuit implemented in the system-on-chip SOC for measuring device aging. A ring oscillator RO circuit includes at least one inverting element or inverter and a delay element consisting of a buffer, a capacitor, or an even number of inverters. A well-known configuration consists of a chain of an even number of CMOS inverters connected in series, where the output of the last inverter is fed back as the input of the first inverter, thus forming a loop.

[0033] A true ring oscillator RO requires only electricity to run; above a certain threshold voltage, oscillation starts spontaneously. In order to increase the frequency of oscillation, two methods are generally used. First, the applied voltage can be increased; this increases both the frequency of oscillation and the current drawn. The maximum allowable voltage applied to the circuit limits the speed of a given oscillator. S...

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Abstract

A method to control aging of a system on chip comprising one or more devices including semiconductor circuit components and at least one aging controller monitoring electrical signals circulating inside the system on chip. The method comprises steps of stressing at least one device of the system on chip by varying hardware parameters related to its operating mode, comparing at least one parameter associated with an electrical signal produced by the at least one device with a reference parameter to determine a difference corresponding to an operating age value of the at least one device, if the operating age value equals or exceeds a threshold age value, determining a stress state value and modifying the operating mode of the at least one device according to the stress state value. A system on chip performing the method is also disclosed.

Description

technical field [0001] The present invention relates to security measures implemented in hardware of a system on chip built on an integrated circuit, eg for managing user rights for accessing multimedia content in a conditional access system. In particular, the aging or reliable operating lifetime time is controlled by hardware devices implemented in the system-on-chip. Background technique [0002] The reliability of the semiconductor components decreases during operational use. In fact, they are subject to variable operating constraints such as temperature and voltage. These constraints lead to aging effects that are proportional to the accumulated stress due to temperature and voltage during operation and vary according to which parts of the system-on-chip are more or less involved. [0003] One such aging effect is hot carrier injection (HCI) which occurs when charge carriers are trapped within the gate oxide of a CMOS (complementary metal oxide semiconductor) transist...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/30G01R31/317
CPCG01R31/2856G01R31/3016G01R31/31725G06F21/577G06F21/602G06F2221/034
Inventor 克劳迪奥·法维马尔科·马凯蒂卡尔·奥森
Owner NAGRAVISION SA