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Defect detecting system and method

A defect detection, moving direction technology, applied in optical testing flaws/defects, measuring devices, material analysis by optical means, etc., can solve problems such as reducing display quality

Active Publication Date: 2017-06-27
SUMIKA TECH
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

However, in the production process of optical components, it is easy to produce defects due to various factors, thereby reducing the display quality

Method used

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  • Defect detecting system and method

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Embodiment Construction

[0038] Traditional defect inspection systems use the principle of light penetration to detect foreign object defects. Since foreign matter defects on optical components block light, dark spots are detected in captured transmitted light images, making them suitable for detection of foreign matter defects. However, such a defect detection system is not easy to detect unevenness defects, that is, defects caused by local variations in the thickness of the optical element.

[0039] The invention relates to a defect detection system and method. Please refer to figure 1 , which shows a defect detection system 100 according to an embodiment of the present invention. The defect detection system 100 can be used to detect the optical film 10 being transferred. The optical film 10 is conveyed along a moving direction D1 via the rollers 11 on the production line. The defect detection system 100 can identify defects in real time and eliminate defects early part. In one embodiment, the p...

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Abstract

A defect detection system for detecting an optical film to be transferred includes a light source, an image capturing device, and a slit plate. The light source is arranged on one side of the optical film, and the image capturing device is arranged on the other side of the optical film. The slit plate has a slit which is arranged between the light source and the optical film so that incident light passes through the slit. Wherein, the image capturing device is offset from the extension line of the light source and the slit.

Description

technical field [0001] The present invention relates to an optical inspection system and method, and in particular to a defect inspection system and method of an optical thin film. Background technique [0002] With the advancement of technology, the requirements for various optical components used in liquid crystal display devices are also high. However, in the production process of optical elements, it is easy to produce defects due to various factors, thereby reducing the display quality. Therefore, a defective detection system should be configured in the production system of optical components to eliminate defective optical components as early as possible. Contents of the invention [0003] The present invention relates to a defect detection system and method. The image capture device is offset from the extended connection line between the light source and the slit. When the light irradiates the concave-convex defect on the optical film, it will scatter, so the image ...

Claims

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Application Information

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IPC IPC(8): G01N21/95
CPCG01N21/95G01N2021/9511
Inventor 林宽宏吴柏徵
Owner SUMIKA TECH