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A kind of quality detection method of solar cell and detection device thereof

A technology for a solar cell and a quality inspection method, applied in the photovoltaic field, can solve the problems of inability to obtain depth direction information, high cost, etc., and achieve the effect of good detection effect, broad application prospect, and easy observation.

Active Publication Date: 2020-04-21
HEBEI UNIVERSITY +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] One of the purposes of the present invention is to provide a quality detection method for solar cells to solve the problems that existing detection methods are destructive to cells, costly, or cannot obtain depth direction information

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  • A kind of quality detection method of solar cell and detection device thereof
  • A kind of quality detection method of solar cell and detection device thereof
  • A kind of quality detection method of solar cell and detection device thereof

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Embodiment Construction

[0032] like figure 1 As shown, the structure of the detection device of the present invention includes an OCT measurement probe 103 , a computer 102 and an OCT integrated system 10 . Wherein, the OCT measuring probe 103 and the computer 102 are respectively connected with the OCT integrated system 101. The OCT measuring probe 103 includes a self-focusing scanning lens, and the OCT measuring probe 103 performs laser scanning on the solar cell sheet 104 through the self-focusing scanning lens. The backscattered light of the film is collected by the OCT integrated system 101 through the OCT measuring probe 103, and the OCT integrated system 101 converts the obtained interference light signal into an electrical signal and transmits it to the computer 102 for analysis and processing, and finally obtains the image data of the scanned object. figure 2 It is a three-dimensional image obtained by scanning the finished battery sheet 104 with a detection device. The central wavelength o...

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Abstract

The invention provides a quality detection method of a solar cell and a detection device of using the quality detection method. The method comprises the steps of scanning a to-be-detected cell by using the detection device to obtain an OCT three-dimensional image of the cell; and observing or treating the obtained OCT three-dimensional image to obtain the information such as the appearance characteristic of the cell, the defect position, the thickness, the size of a grid line electrode and the light trapping ability of the cell, thereby achieving non-contact and nondestructive online real-time detection of the solar cell. The detection is more comprehensive; detection of multiple parameters can be achieved only through simple detection method and device, so that the detection cost is greatly reduced; meanwhile, the quality of semi-finished products at various stages of a production line can be detected and a reference index is provided for production of various technological processes.

Description

technical field [0001] The invention relates to the field of photovoltaics, in particular to a method for detecting the quality of solar cells and a detection device thereof. Background technique [0002] With the continuous reduction of fossil energy and the continuous aggravation of environmental degradation, the development of renewable energy represented by solar energy has received more and more attention. A solar cell is a device that converts solar energy into electrical energy based on the photovoltaic effect. It has the advantages of high reliability, long life, and no pollution. It can be used as a power source for artificial satellites, navigation lights, and transistor radios. Depending on the materials used, solar cells can be divided into silicon solar cells, compound solar cells, dye-sensitized cells, and organic thin-film cells. Among them, silicon solar cells are a fast-growing and more mature type of solar cells. Among the current industrialized solar cell...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/958H02S50/15
CPCG01N21/958H02S50/15Y02E10/50
Inventor 苏亚姚晓天刘会清
Owner HEBEI UNIVERSITY