Wheat growth period characteristic parameter evaluation method based on R language

A technology of characteristic parameters and growth period, which is applied in the field of agricultural information, can solve the problems of large uncertainty of simulation results, increase of user uncertainty, difficulty in directly obtaining parameter values, etc., to ensure accuracy, accurate and efficient parameter debugging results , The effect of improving the efficiency of sampling

Active Publication Date: 2017-08-11
NANJING AGRICULTURAL UNIVERSITY
View PDF2 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The parameters are closely related to the crop model, and the parameter values ​​in the model are generally difficult to obtain directly, and due to the different methods of obtaining the parameter values ​​and the different input data, there is a large uncertainty in the simulation results, which increases the user's decision-making ...

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Wheat growth period characteristic parameter evaluation method based on R language
  • Wheat growth period characteristic parameter evaluation method based on R language
  • Wheat growth period characteristic parameter evaluation method based on R language

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0039] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary only for explaining the present invention and should not be construed as limiting the present invention.

[0040] Utilize the method for estimating characteristic parameters of wheat growth period based on R language of the present invention to effectively estimate the growth period data of the winter wheat variety Jingdong No. 8 planted 63 times at 12 sites in 1980-2010, and combine figure 1 The process is described in detail, such as figure 1 Specifically, the following steps are shown:

[0041] Step 1: Collect 63 groups of wheat growth simulation models WheatGrow (such as figure 2 Shown) required growth period data and meteorological data, i...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a wheat growth period characteristic parameter evaluation method based on R language. The wheat growth period characteristic parameter evaluation method based on R language is characterized in that recompiling a wheat growth analogy model by means of R language; setting a parameter initial value through Latin hypercube, and obtaining prior probability distribution of wheat variety characteristic parameters through operation; according to the initial value and prior probability distribution, selecting the candidate parameters; calculating the probability density function of the growth period, and determining whether or not to receive the new parameter; and then finally obtaining posterior probability density distribution of each characteristic parameter of varieties. The wheat growth period characteristic parameter evaluation method based on R language utilizes the non-linear least square method to improve the sampling efficiency to avoid the parameter falling into local optimum; based on the Bayesian theory framework, prior distribution of parameters are effectively considered; the error correlation problem between stations can be solved through conversion of the original data, so that the parameter debugging result can be accurate and efficient; and the wheat growth period characteristic parameter evaluation method based on R language has general applicability in characteristic parameter evaluation of the same wheat variety.

Description

technical field [0001] The invention belongs to the field of agricultural information technology, in particular to a method for estimating characteristic parameters of wheat growth period based on R language. Background technique [0002] Global climate change has been an indisputable fact since the Industrial Revolution. Climate change on a global scale not only affects the environment on which humans depend, but also poses severe challenges to agricultural production. With the continuous deepening of the research on global climate change, the research on the impact of climate change on crop growth and yield formation has also begun to receive extensive attention. Under the scenario of future climate change, timely and accurate prediction of crop growth is of great significance for guiding and regulating agricultural production, improving management level, and formulating appropriate grain production policies. [0003] The crop production system is affected by factors suc...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G06Q10/04G06Q50/02
CPCG06Q10/04G06Q50/02
Inventor 刘蕾蕾朱艳汤亮刘兵曹卫星李军
Owner NANJING AGRICULTURAL UNIVERSITY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products