Micro-component transfer device, transfer method, manufacturing method, device, and electronic device
A transfer device and transfer method technology, applied in semiconductor/solid-state device manufacturing, measuring devices, electrical components, etc.
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[0086] figure 1 A cross-sectional side view of a transfer device according to a first preferred embodiment of the present invention is shown. The transfer device 1100 includes: a base substrate 1110 , an array of pick-up heads 1120 , a testing circuit and a CMOS integrated circuit 1140 . Specifically, the base substrate 1110 is used to provide a supporting function, and may be formed of various materials, such as silicon, ceramics, and polymers. The pick-up heads 1120 are arranged in an array on the first surface 1110A of the base substrate 1110, with a size ranging from 1 μm to 100 μm, for example, 50 μm to 20 μm, and a pitch of (1 μm to 100 μm)×(1 μm to 100 μm), for example 10μm x 10μm or 50μm x 100μm pitch. The array of pick-up heads 1120 is disposed on the first surface 1110A of the base substrate 1100 for picking up micro-components by various adsorption forces (such as electrostatic force, vacuum pressure, van der Waals force, magnetic force, etc.) to achieve the funct...
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