AOI device database addition method and system thereof

A database and device technology, applied in the direction of optical testing flaws/defects, etc., to achieve the effect of broadening the selection range

Active Publication Date: 2017-08-22
GUANGZHOU SHIYUAN ELECTRONICS CO LTD +1
View PDF7 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Based on this, the purpose of the present invention is mainly to solve the problem that the existing AOI detection system only recognizes the device of a single

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • AOI device database addition method and system thereof
  • AOI device database addition method and system thereof
  • AOI device database addition method and system thereof

Examples

Experimental program
Comparison scheme
Effect test

Example Embodiment

[0042] In order to facilitate the understanding of the present invention, the present invention will be described more fully below with reference to the relevant drawings. The preferred embodiment of the invention is shown in the drawings. However, the present invention can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present invention more thorough and comprehensive.

[0043] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the technical field of the present invention. The terms used in the specification of the present invention herein are only for the purpose of describing specific embodiments, and are not intended to limit the present invention. The term "and / or" as used herein includes any and all combinations of one or more related listed items....

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to an AOI device database addition method and a system thereof. The method comprises the following steps: current image information of one device on a PCB is scanned and acquired; the current image information is respectively compared with at least a set of reference image information in a parameter database of a target device corresponding to the device so as to judge whether the information match each other; if the current image information doesn't match the reference image information in the parameter database and one replaceable parameter add command is received, the current image information of the device is added and stored in the parameter database. According to the invention, an attribute parameter of the detected device can be compared with a related attribute parameter of an original standard device and also can be compared with a related attribute parameter of a substituted device which still meets requirements, and it can be judged that the detected device meets requirements if the attribute parameter accords with any one of the related attribute parameters. Selection range of related device in the PCB card manufacturing process is widened.

Description

technical field [0001] The invention relates to the field of circuit board production, in particular to an AOI device detection method and system. Background technique [0002] AOI (Automatic Optic Inspection) is called automatic optical inspection. It is a device based on optical principles to detect common defects encountered in welding production. For example, it is often used to detect PCB boards to ensure product quality. [0003] AOI is a new type of testing technology that has only emerged in recent years, but it has developed rapidly. At present, many manufacturers have launched AOI testing equipment. When performing automatic detection, the machine automatically scans the PCB board card through the camera to collect images, and compares the tested solder joints with the qualified parameters in the database. After image processing, the defects on the PCB board card are checked out, and passed The display or automatic flag will display the corresponding defects for r...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01N21/88
CPCG01N21/88
Inventor 刘柏芳
Owner GUANGZHOU SHIYUAN ELECTRONICS CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap