Power device loss test method
A technology of power devices and testing methods, which is applied in the direction of instruments, measuring devices, measuring electrical variables, etc., can solve the problems of test result error, unstable initial temperature change, and failure to consider the influence of ambient temperature, etc., and achieve short test time, The effect of avoiding the influence of the initial temperature instability
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[0034] In order to make the object, technical solution and advantages of the present invention more clear, the present invention will be further clearly and completely described below in conjunction with the accompanying drawings and embodiments.
[0035] figure 1It is a device structure diagram of an embodiment of the present invention. It can be seen from this figure that the test device involved in this test method includes a power device to be tested 1, a cubic metal block 2, a first temperature probe 3, a second temperature probe 4, and a heat insulating material 5 and a heat-conducting rubber pad 6; the heat-conducting rubber pad 6 is bonded on the upper end face of the cube metal block 2, and the five faces of the cube metal block 2 except the upper end face are wrapped with heat-insulating materials 5; The first temperature probe 3 is installed between the upper end surface of the cubic metal block 2 and the heat-conducting rubber pad 6, and the second temperature prob...
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