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Lamp flicker test method and system

A test system and test method technology, applied in the direction of lamp test, measurement device, measurement of electrical variables, etc., can solve the problems of slow response and high cost, and achieve the effects of simple structure, fast detection speed and low test cost

Active Publication Date: 2019-08-20
GOERTEK INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The above test methods, whether using professional testing equipment such as illuminance meters or testing through photosensitive chips, all have the disadvantages of slow response or high cost.

Method used

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  • Lamp flicker test method and system
  • Lamp flicker test method and system
  • Lamp flicker test method and system

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Embodiment Construction

[0025] Various exemplary embodiments of the present invention will now be described in detail with reference to the accompanying drawings. It should be noted that the relative arrangements of components and steps, numerical expressions and numerical values ​​set forth in these embodiments do not limit the scope of the present invention unless specifically stated otherwise.

[0026] The following description of at least one exemplary embodiment is merely illustrative in nature and in no way taken as limiting the invention, its application or uses.

[0027] Techniques, methods and devices known to those of ordinary skill in the relevant art may not be discussed in detail, but where appropriate, such techniques, methods and devices should be considered part of the description.

[0028] In all examples shown and discussed herein, any specific values ​​should be construed as exemplary only, and not as limitations. Therefore, other instances of the exemplary embodiment may have dif...

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Abstract

The invention discloses a lamp scintillation testing method and system. The lamp scintillation testing system includes a dark room, a testing device in the dark room, voltmeters and a terminal, wherein the test circuit is arranged in the testing device, and includes a power supply, a fixed value resistor and a photoresistor; the fixed value resistor and the photoresistor are connected in series; two ends of the fixed value resistor are connected with the voltmeters; the voltmeter is connected with the terminal; and the terminal is used for determining whether the lamp to be tested in the dark room scintillates according to the obtained voltage value measured by the voltmeters. The lamp scintillation testing system has the advantages of being high in detection speed, being simple in structure and being low in testing cost.

Description

technical field [0001] The present invention relates to the technical field of LED lamp testing, and more specifically, to a method and system for testing lamp flicker. Background technique [0002] In the prior art, in the test method of multi-color conversion and flickering LED lights, it is necessary to test not only the brightness value of the LED lights, but also the color coordinates or RGB parameters. Test whether the LED light is flickering by changing the brightness value over time, and test whether the LED light can change colors by color coordinates or RGB parameters. The above test methods, whether using professional testing equipment such as illuminance meters or testing through photosensitive chips, all have the disadvantages of slow response or high cost. Contents of the invention [0003] An object of the present invention is to provide a new technical solution of a lamp flicker testing method and system. [0004] According to the first aspect of the pres...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/44G01R19/165
Inventor 赵国派
Owner GOERTEK INC