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Unpacking method of mems inertial device in chip stacked plastic package

An inertial device and plastic packaging technology, applied in the inertial field, can solve the problems that accelerometer MEMS and gyroscope MEMS cannot be observed, MEMS inertial device packaging is complicated, and unsealing is difficult

Active Publication Date: 2020-01-31
CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the chemical etching solution cannot corrode silicon, so the capped silicon wafer cannot be directly etched away, and the accelerometer MEMS and gyroscope MEMS in the cavity formed by the capped silicon wafer cannot be exposed, so they cannot be observed and analyzed
For the ASIC chip placed under the capped silicon wafer, after the external plastic packaging material of the MEMS inertial device is removed by the chemical etching method of plastic packaged integrated circuits, what is obtained is the back of the capped silicon wafer, and it cannot be observed. Accelerometer MEMS and gyroscope MEMS in the formed cavity
[0005] In order to solve the problem of complex packaging and difficult unsealing of MEMS inertial devices packaged in chip-on-chip plastic packages, a MEMS inertial device unsealing technology for this type of packaging structure characteristics is needed to make up for the shortcomings of traditional unsealing technology. The internal purpose of this type of packaging device Provide technical support

Method used

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  • Unpacking method of mems inertial device in chip stacked plastic package
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  • Unpacking method of mems inertial device in chip stacked plastic package

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Embodiment Construction

[0030] In order to facilitate understanding of the present invention, the present invention will be described more fully hereinafter with reference to the related drawings. Preferred embodiments of the invention are shown in the accompanying drawings. However, the present invention may be embodied in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided so that a thorough and complete understanding of the present disclosure is provided.

[0031] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terms used herein in the description of the present invention are for the purpose of describing specific embodiments only, and are not intended to limit the present invention. As used herein, the term "and / or" includes any and all combinations of one or more of the associated listed it...

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Abstract

The invention discloses a decapsulation method for a chip laminated plastic capsulated MEMS (micro electro mechanical system) inertial device to expose an accelerometer MEMS, a gyroscope MEMS and an ASIC (application specific integrated circuit) chip in the device. The decapsulation method includes: acquiring the preliminary internal structure information of the device, acquiring a cavity position and detailed distribution information of the chip, and according to the detailed distribution information, conducting chemical corrosion treatment and inspection analysis respectively on the laminated structure MEMS inertial device with the ASIC chip located at an upper layer and the accelerometer MEMS and gyroscope MEMS located at a lower layer and the laminated structure MEMS inertial device with the ASIC chip located at the lower layer and the accelerometer MEMS and gyroscope MEMS located at an upper layer. The method provided by the invention can expose the accelerometer MEMS, the gyroscope MEMS, the common ASIC chip and the like respectively, also can ensure an intact structure of the device in a capsulation cavity, and meets the internal visual inspection demands of the chip laminated plastic capsulated MEMS inertial device.

Description

technical field [0001] The invention relates to the field of inertial technology, in particular to a method for unsealing a MEMS inertial device packaged in a chip-laminated plastic package. Background technique [0002] Inertial technology is the core technology of navigation and positioning, guidance control, aiming and image stabilization, and attitude measurement. The technical status of inertial gyroscopes and accelerometers is the basis for representing inertial technology. Among them, the gyroscope is used to measure the angular velocity of the moving body, and the accelerometer is used to measure the acceleration of the moving body. MEMS (Micro Electro Mechanical System, Micro Electro Mechanical System) inertial devices refer to micro-machined gyroscopes and micro-accelerometers whose sensitive structures are processed by micro-machining means. MEMS inertial devices are widely used due to their small size, light weight, low power consumption, mass production, low co...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): B81C1/00
CPCB81C1/00333
Inventor 林晓玲何春华梁朝辉
Owner CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST