Secondary power ripple measuring apparatus
A secondary power supply and measurement device technology, which is applied in the field of secondary power supply ripple measurement devices, can solve the problems of low measurement accuracy, achieve the effects of simplifying the test process, avoiding interference from human factors, and accurately measuring
Inactive Publication Date: 2017-12-01
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology
[0004] In order to solve the problem of low measurement accuracy existing in the existing secondary power supply ripple measurement, the present invention provides a secondary power supply ripple measurement device
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[0028] The present invention will be described in further detail below in conjunction with the accompanying drawings.
[0029] Such as figure 1 As shown, a secondary power supply ripple measurement device of the present invention includes: a small circuit board 1, a load interface 2, a shielding layer 3, a secondary power supply measurement interface 4, an impedance matching adjustment network 5, a cable 6, and a connector 8 , Oscilloscope 9.
[0030] The load interface 2 , the shielding layer 3 , the secondary power supply measurement interface 4 , and the impedance matching adjustment network 5 are all integrated on the small circuit board 1 . The measured secondary power supply 7 is connected to the secondary power supply ripple measurement device of the present invention through the secondary power supply measurement interface 4 . The load interface 2 is connected to the secondary power supply measurement interface 4 . The load 10 is connected to the secondary power sup...
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The invention discloses a secondary power ripple measuring apparatus, relates to the power testing field, and addresses low measuring accuracy in secondary power ripple measuring. According to the invention, the apparatus herein includes a secondary power measuring interface which is connected to a to-be-measured power supply; a load interface which is connected to a load; an impedance matching adjusting network which is connected to the secondary power measuring interface and is intended for filtering noise wave in a ripple; a connector which is connected to the impedance matching adjusting network through a cable and is intended for removing the noise wave in the ripple; am oscilloscope which is connected to the connector through a cable and is intended for displaying the ripple; and a shielding layer which wraps around the cable and is connected to a secondary power loop wire, wherein the load interface, the shielding layer, the secondary power measuring interface and the impedance matching adjusting network are all integrated on a small-sized circuit board. According to the invention, the apparatus herein increases the accuracy and convenience in measuring the ripple, avoids man-made interference, and simplifies the testing process.
Description
technical field [0001] The invention relates to the technical field of power supply testing, in particular to a secondary power supply ripple measurement device. Background technique [0002] Ripple measurement is a very important parameter in the quality inspection of secondary power supply. At the same time, it is also a difficult point in the measurement of secondary power supply, which has high requirements for measuring instruments and measurement methods. Since the DC stabilized power supply is generally formed by the AC power supply through rectification, filtering, voltage stabilization and other links, it is inevitable that there will be some AC components in the DC voltage, and this AC component superimposed on the DC voltage is called It is ripple. [0003] At present, the ripple measurement methods for the secondary power supply mainly include the measurement method and the coaxial line ripple measurement method, and the measuring instrument mainly uses an oscil...
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IPC IPC(8): G01R31/42
CPCG01R31/42
Inventor 王小朋张达
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI