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Self-testing in a processor core

A processor core, self-test technology, applied in the field of data processing

Active Publication Date: 2017-12-08
ARM LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In fact, in some security-critical implementations, greater than 99% fault classification capability may be required

Method used

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  • Self-testing in a processor core
  • Self-testing in a processor core
  • Self-testing in a processor core

Examples

Experimental program
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Embodiment Construction

[0017] At least some embodiments provide an apparatus, comprising: a processor core circuit configured to perform a data processing operation by executing a data processing instruction; a self-test control circuit configured to cause the processor core circuit to temporarily stop executing the data processing instruction a state switch to a second state in which a sequence of self-test instructions is executed, and then returns to the first state in which data processing instructions are executed without restarting the processor core circuitry; and self-test support circuitry, wherein the processor core circuitry responds to A sequence of self-test instructions to export at least one self-test data item to the self-test control circuit via the self-test support circuit.

[0018] This technique provides a self-test method that combines both software and hardware aspects. A self-test controller (hardware monitor) is provided outside the processor core to manage the self-test. T...

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PUM

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Abstract

The invention relates to self-testing in a processor core. An apparatus and a method for processor core self-testing are disclosed. The apparatus comprises processor core circuitry to perform data processing operations by executing data processing instructions. Separate self-test control circuitry causes the processor core circuitry to temporarily switch from a first state of executing the data processing instructions to a second state of executing a self-test sequence of instructions, before returning to the first state of executing the data processing instructions without a reboot of the processor core circuitry being required. There is also self-test support circuitry, wherein the processor core circuitry is responsive to the self-test sequence of instructions to cause an export of at least one self-test data item via the self-test support circuitry to the self-test control circuitry.

Description

technical field [0001] The present disclosure relates to the field of data processing. More specifically, it relates to self-testing in processor cores to identify faults. Background technique [0002] A processor core may be provided with the ability to identify faults in the processor core that develop over time. One method of self-testing is to provide two processor cores operating in lockstep so that differences in the output of one core can be identified by reference to the output of the other. Another approach is software-based, which may be superior to the dual-core lockstep approach due to its reduced area and power savings. However, the extent and complexity of contemporary processor cores can mean that such software itself can be large and complex. In addition, there is often a balance between frequently executing self-testing software to quickly identify faults in the core and accepting the larger disruptions caused by executing such self-testing software. Not...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
CPCG06F11/2236G06F11/2273G06F11/27G06F11/2242G06F11/22G06F11/2284G06F11/0784G06F11/0721G06F11/0775G06F11/0766G06F11/24G06F11/273
Inventor 巴拉吉·韦尼考塞尔·雅各布·乔哈尔马尔科·博尼诺
Owner ARM LTD