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Calibration device and method for microwave analysis or measuring instruments

A technology for calibrating devices and measuring instruments, used in the calibration of instruments, measuring devices, instrument parts, etc.

Active Publication Date: 2020-10-20
GAPWAVES
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0013] Another object of the present invention is to provide a calibration device that allows calibration against a large number of waveguide calibration standards in a quick and easy manner

Method used

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  • Calibration device and method for microwave analysis or measuring instruments
  • Calibration device and method for microwave analysis or measuring instruments
  • Calibration device and method for microwave analysis or measuring instruments

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Embodiment Construction

[0034] figure 1 A first embodiment of a calibration device 100 according to the invention is shown. Calibration apparatus 100 is positioned between two ports of the VNA (labeled VNA ports 1 and 2 in the figure) during calibration, and is thereafter replaced by a circuit or a device under test (DUT) during actual measurements. Thus, the number of times each of these VNA ports must be connected and disconnected during calibration is reduced from three or four times per port to one per port. This saves calibration time and makes calibration more accurate.

[0035] The calibration device 100 comprises a plate element 10 comprising or having mounted therein a plurality of waveguide calibration standards. Its figure 1 The surfaces on both sides of the plate 10 can be regarded as rectangular waveguide openings 111, 11 2 , 11 3 , 11 4 , 11 5 . Here the plate element 10 comprises a collimating waveguide structure 111, 11 arranged along the longitudinal extension of the plate el...

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Abstract

An apparatus for calibration of an electronic instrument, such as a vector network analyzer, includes a number of calibrator connector elements for connection to the instrument, and a plate element including a plurality of calibration waveguide structures. The plate element has conductive surfaces, and the calibrator connector elements and conductive surfaces include periodic structures disposed with respect to each other such that gaps are formed between them. An interface enables interconnection of a waveguide of a calibrator connector element, a waveguide of the instrument, and a calibration waveguide structure. The apparatus includes a driving unit and controller for moving the plate element and / or the calibrator connector element to connect the calibrator connector element to different calibration waveguide structures.

Description

technical field [0001] The invention relates to a calibration device for tools or instruments used for analyzing or measuring microwave circuits or equipment. Especially when rectangular waveguide technology is used, microwave devices here also mean devices with frequencies up to or above THz frequencies. [0002] The invention also relates to a device for connecting an analysis or measurement instrument, such as a vector network analyzer, to a waveguide calibration standard or a device under test. [0003] The invention also relates to a method for calibrating such a tool or instrument, such as a vector network analyzer (VNA) or a transmission line. Background technique [0004] Vector network analyzers, abbreviated as VNAs, are widely used to analyze a wide variety of different kinds of microwave circuits and devices, from filters, amplifiers, etc. to much more complex multifunctional systems. Such instruments are capable of evaluating the characteristics of the circuit ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R35/00G01D18/00G12B13/00H01P3/00
CPCG01R35/005G01R31/2822G01R27/28
Inventor V.瓦斯勒夫P-S.基尔达S.拉希米内贾德
Owner GAPWAVES
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