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Automatic testing method and device

A technology for automated testing and optimization algorithms, applied in the computer field, can solve problems such as low test efficiency

Inactive Publication Date: 2018-01-05
ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] Due to the need for manual test adjustments, the test efficiency of the existing implementation is low

Method used

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  • Automatic testing method and device

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Embodiment Construction

[0080] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work belong to the protection of the present invention. scope.

[0081] Such as figure 1 As shown, the embodiment of the present invention provides an automated testing method, which may include the following steps:

[0082] Step 101: Use an optimization algorithm to determine the best fitting parameters of the variation law model of the existing data.

[0083] Step 102: Transfer the current best fitting parameters...

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Abstract

The invention provides an automatic testing method and device. The method comprises the steps of determining optimal fitting parameters of a change rule model of existing data using an optimization algorithm, passing current optimal fitting parameters to the change rule model, and obtaining test results by using a current variation pattern model; when the test results are not located within a corresponding preset threshold range, adjusting the optimal fitting parameters according to the test results, passing the adjusted optimal fitting parameters to the change rule model again, and executingsubsequent processes; repeating in this way until the obtained test results satisfy the requirements. The testing method can automatically solve for the best fitting parameters through iterations to facilitate testing, manual execution is not needed, and the automatic testing method can improve the testing efficiency.

Description

technical field [0001] The invention relates to the field of computer technology, in particular to an automatic testing method and device. Background technique [0002] With the diversification and complexity of test requirements, software-defined instrument systems have become the most important development trend and mainstream technology in the test and measurement industry. Machine learning (Machine Learning, ML) is a multi-field interdisciplinary subject, which is used to study how computers simulate or implement human learning behaviors to acquire new knowledge or skills, reorganize existing knowledge structures, and continuously improve themselves. performance. [0003] At present, manual testing can be used, such as manually adjusting test parameters according to empirical rules, and calling back local parameters according to test results, and then testing and observing the callback effect. [0004] Since manual test adjustment is required, the test efficiency of th...

Claims

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Application Information

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IPC IPC(8): G06F11/36
Inventor 罗嗣恒
Owner ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
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