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An optical parameter measuring device and its measuring method

A measuring device and technology for optical parameters, applied in the field of optical parameter measuring devices, can solve problems such as low measurement speed, and achieve the effect of improving brightness measurement speed and eliminating the adjustment process of integration time.

Active Publication Date: 2020-06-30
BOE TECH GRP CO LTD +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] In view of this, an embodiment of the present invention provides an optical parameter measurement device and its measurement method to solve the problem of low measurement speed in existing measurement methods

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  • An optical parameter measuring device and its measuring method
  • An optical parameter measuring device and its measuring method
  • An optical parameter measuring device and its measuring method

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Embodiment Construction

[0044] The specific implementation of the optical parameter measurement device and the measurement method thereof provided by the embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

[0045] The shapes and sizes of the components in the drawings do not reflect the real scale of the optical parameter measuring device, but are only intended to schematically illustrate the contents of the present invention.

[0046] An optical parameter measurement device provided by an embodiment of the present invention, such as figure 1 As shown, it includes: a light splitting component 100, a first photodetector 200, a second photodetector 300, a transimpedance amplifier circuit 400, an integrating circuit 500 and a control unit 600; wherein,

[0047] A light splitting component 100, configured to at least divide the display light of the display panel A to be tested into a first test light a1 and a second test light a2;

[0048]...

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Abstract

The invention discloses an optical parameter measuring device and a measuring method thereof. Firstly, a light splitting component is used to divide the display light of a display panel to be tested into at least two test light beams, and a transimpedance amplifying circuit corresponding to a first photodetector is used to pair a The test light beam is used to measure the voltage value, and then the integration time is determined by the control unit according to the multiple voltage values ​​output by the transimpedance amplifier circuit and the relationship model between the preset voltage and the integration time, and then the integration time corresponding to the second photodetector is used to determine the integration time. The circuit uses the determined integration time to directly and accurately measure another beam of test light, and finally the control unit determines the display brightness of the display panel to be tested according to the voltage value output by the integration circuit within the integration time. Since the light intensity of the test light can be obtained in real time by using the transimpedance amplification circuit to calculate the required integration time, the long time-consuming adjustment process of the integration time can be saved, so as to improve the measurement speed of the display panel to be tested.

Description

technical field [0001] The invention relates to the technical field of optical device measurement, in particular to an optical parameter measurement device and a measurement method thereof. Background technique [0002] At present, the purpose of measuring light intensity can be achieved by using a photodetector to perform integral measurement of the target light source, but if the light intensity of the target light source changes within a certain range, for example, when measuring optical parameters such as brightness of the display panel to be tested, it is necessary A micro-controller unit (MCU, Micro-controller Unit) is used to adjust the integration time according to the integration result. [0003] Specifically, in the brightness measurement scheme of the display screen, the most common method is to use silicon photocells to integrate the photocurrent, and adjust the integration time according to the intensity of the photocurrent, usually after sampling multiple times...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/02
CPCG01J2001/4247G01J1/1626G01J1/46G01J1/0228G01J1/0414G01J2001/446G01J1/0425G01J1/44G01J1/0477G01J2001/4413
Inventor 刘莹莹武震廖永俊李星马慧君
Owner BOE TECH GRP CO LTD