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887 results about "Light Testing" patented technology

A test light is simpler and less costly than a measuring instrument such as a multimeter, and often suffices for checking for the presence of voltage on a conductor. Properly designed test lights include features to protect the user from accidental electric shock.

Method for measuring volumetric changes of object

Under a known pressure is externally applied to a reference member to which an optical fiber is fixed, test light is allowed to enter the optical fiber, and at least one of a reference Brillouin measurement for determining a reference Brillouin frequency shift amount based on the Brillouin scattering phenomenon, and a reference Rayleigh measurement for determining a reference Rayleigh frequency shift amount based on the Rayleigh scattering phenomenon is performed. A Brillouin measurement coefficient or a Rayleigh measurement coefficient is determined from these calculation results. An optical fiber is fixed to a sample member, the volumetric change of which is unknown, and the same sample Brillouin measurement or sample Rayleigh measurement is performed to determine the frequency shift amount. The volumetric change of the sample member is determined from the sample Brillouin or the sample Rayleigh frequency shift amount, and from the Brillouin or the Rayleigh measurement coefficient.
Owner:RES INST OF INNOVATIVE TECH FOR THE EARTH +1

Temporary hair removal method

A hand held device generates a predetermined number of pulses of light having a predetermined electromagnetic spectrum, a predetermined duration, a predetermined inter-pulse interval, and a predetermined total energy. The pulse sequence is delivered to a skin surface to temporarily remove hair. A period of time for reappearance of hair on the selected skin surface after the using of the device to remove hair from the selected skin surface is determined by counting the days to hair reappearance after a test light application. Subsequently, the device is used periodically to apply the pulses of light to the selected skin surface at intervals of shorter length than the determined period of hair regeneration, thereby temporarily maintaining the selected skin surface free of visible hair.
Owner:JAY HARVEY H

Light source estimating device, light source estimating method, and imaging device and image processing method

A light source estimation method of this invention estimates from the sensor response the color characteristics of an unknown light source of an image-pickup scene, in order to improve white balance adjustment and other aspects of the quality of color reproduction; a projection conversion portion 6 projects sensor response values 5 into an image distribution 9 in an evaluation space not dependent on the image-pickup light source 2 using parameters obtained by operations which can be calorimetrically approximated from spectral sensitivity characteristics of image-pickup unit 4, which are known, and from spectral characteristics of an assumed test light source 1; an evaluation portion 10 evaluates the correctness of a plurality of the test light sources 1 based on the distribution state of sample values of the projected scene; and accordingly, the correct image-pickup light source 2 is estimated.
Owner:SONY CORP

Method and apparatus for analyzing solutions

An apparatus and method of analyzing an aqueous solution, as may be implemented with a hand-held portable electronic device (10). A test pad (32) responsive in color to a characteristic of an aqueous solution is interrogated by the device by measuring, in a plurality of wavelength ranges, intensity values of a test light as reflected off of the test strip. The intensity values may be expressed as values relative to intensities reflected off of white and black calibration surfaces. A relationship among the intensity values for the various wavelength ranges is developed through an algorithm that provides a ratio value that is responsive to the characteristic of the aqueous solution and that is non-responsive to absolute intensity values of the reflected light. The test pad may be supported on an opaque and non-reflective substrate (28) that cooperates with an opaque edge portion (14E) of a test element placement member (14B) and associated side walls (14W) of the device to minimize the impingement of ambient light onto the test pad during interrogation.
Owner:HACH CO

Optical fiber line intelligent detection system and optical fiber line intelligent detection method for wavelength division multiplex (WDM) network

The invention discloses an optical fiber line intelligent detection system and an optical fiber line intelligent detection method for a wavelength division multiplex (WDM) network. The detection system comprises a plurality of stations and a control unit, wherein the stations are connected with the control unit by an optical fiber; each station comprises an optical amplification unit, an optical monitoring unit and an optical channel performance detecting unit, at least one station is provided with an optical time domain reflectometry (OTDR) unit, and the input / output port of the test light of the OTDR unit is respectively connected to an optical multiplexer and an optical demultiplexer of the input end and the output end of the station by an optical multiplexing switch; and the control unit receives the alarm or performance abnormity information of the units and transmits an optical fiber line scanning signal to a relevant OTDR unit scanning optical fiber link. After an optical fiber line generates failure, the control automatically starts the relevant OTDR unit to scan the corresponding line and automatically marks a failure point in a global information system (GIS) map, thereby realizing the rapid positioning of the failure and shortening the business interruption time.
Owner:FENGHUO COMM SCI & TECH CO LTD

Device and method for measuring synchronous phase shifting interference of Fizeau quasi-common optical path structure

The invention relates to a device and a method for measuring synchronous phase shifting interference of a Fizeau quasi-common optical path structure. The device comprises a laser, a half wave plate, a focusing lens, a spatial filter, a circularly polarized light beam splitter (an optically active crystal), a spectroscope, a collimating lens, a reference mirror, a pin-hole diaphragm, an imaging lens, a light splitting and phase shifting system, a computer control system and a CCD camera. According to the device and the method disclosed by the invention, a synchronous phase shifting technology is combined with a Fizeau interference method, so that technical difficulties of a conventional interferometer in poor stability and disability of realizing dynamic measurement are solved; the device and the method are characterized by utilizing an optical rotation effect of the crystal and adding the circularly polarized light beam splitter with a very small splitting angle in the Fizeau interfering structure, so as to realize orthogonally polarized separation of reference lights and test lights in a common optical path. The device and the method disclosed by the invention avoid utilization of a high-quality quarter wave plate in a synchronous phase-shifting interference system, and also greatly decrease a phase measurement error caused by a stress birefrigent effect which exists in an optical element of the system.
Owner:INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI

Pulse laser beam quality synchronous measuring system and synchronous control method thereof

The invention discloses a pulse laser beam quality synchronous measuring system which comprises a facula test light path and a clock synchronous control module. The facula test light path comprises a straight line guide rail, two beam splitters, a reflector, a focus lens, a laser attenuator and two CCDs. Incident laser is divided into two beams by the first beam splitter, one beam enters a quick response photoelectric detector, and time domain information of the beam is measured; the other beam enters the test light path. Appropriate attenuation is carried out on the incident laser by the attenuator, beam waist regeneration is achieved through the focus lens, and the light beam is divided by the other beam splitter into two beams perpendicular to each other and emits into the two CCDs for facula measurement. One of the CCDs measures the size of a facula at a fixed position, and the other CCD determines the position of a beam waist through movement of the guide rail and measures the size of the beam waist. By means of measurement of the three values, a gauss beam analysis formula after beam waist regeneration can be obtained. A beam quality parameter of the incident gauss beam is obtained through lens transformation.
Owner:HUBEI SANJIANG AEROSPACE HONGFENG CONTROL

Panel lighting test machine and detecting method thereof

ActiveCN101140726AShorten process changeover timeQuick and precise adjustmentStatic indicating devicesElectrical testingMedial sideEngineering
The invention discloses a testing machine for panel lighting and its method of detection, used for lighting testing and panel repairing, which comprises a base, a panel bearing base, a plurality of lighting testing units, a support stand and a laser repair unit. The panel bearing base, composed of a rectangular frame, a bearing board and a plurality of positioning units, is amounted on the base. The bearing board is equipped on the rectangular frame and the said positioning units are set separately on the sides of the bearing board. The lighting testing units is installed on the medial side of the rectangular frame, consisting of a slide rail, a plurality of probe sliders and a positioning unit for the probe sliders. The said probe sliders with a plurality of probes are separately equipped on the slide rail. The said positioning unit for the probe sliders is provided with a plurality of grooves, in which the probe sliders are amounted to limit the location of the said probe sliders. On the other hand, the said support frame fitted with the laser repair unit is equipped on the upside of the base.
Owner:AU OPTRONICS CORP

Method for automatically adjusting inclination between image photographing module group sensor and lens

The invention provides a method for automatically adjusting inclination between an image photographing module group sensor and a lens. The method comprises the following steps that test light is provided via a light source and a scalar board; a positioning platform drives the lens to move relative to the sensor according to a preset step; an image acquisition system acquires and transmits MTF data of test light of an image photographing module group; curve fitting is performed on the MTF data so that highest point distance difference of the MTF data of a designated area is obtained and thus degree of inclination between the image photographing module group sensor and the lens is calculated; and the image photographing module group is corrected via the positioning platform according to the degree of inclination. Curve fitting is performed on a high-step defocus curve to predict the calculation result of a low-step defocus curve so that efficiency of the whole test is enhanced. Besides, a six-degree-of-freedom parallel positioning platform can be used as the positioning platform so that the center of the positioning platform is ensured to be overlapped with the center of the sensor, and thus inclination between the sensor and the lens is ensured to be corrected accurately and timely.
Owner:NINGBO SUNNY OPOTECH CO LTD

Optically testing chiplets in display device

A method of making a display includes providing a display substrate having a plurality of control electrodes in a display area; locating a plurality of chiplets responsive to a controller to provide current to the control electrodes, each chiplet having a separate substrate, at least one pixel connection pad electrically connected to a control electrode, and one or more test light emitters formed in the chiplet responsive to the current provided on the control electrodes to emit light; controlling the chiplets to pass current through one or more of the test light emitters formed in the chiplet to emit light; detecting the light emitted by the test light emitters to determine faulty chiplets or chiplet interconnections; replacing or repairing the faulty chiplets or chiplet interconnections; and forming an organic light emitting diode over the substrate in the display area connected to the control electrodes.
Owner:GLOBAL OLED TECH

Apparatus for and method of measurement of aspheric surfaces using hologram and concave surface

An aspheric surface measuring apparatus includes an interferometer which generates incident light; a test piece having an aspheric surface from which the incident light is reflected as test light; a first optical element disposed on an optical path of the incident light, having at least one surface with a hologram for diffracting the incident light toward the test piece; and a second optical element disposed after the first optical element, which transmits the incident light toward the aspheric surface and has a concave surface to reduce an incident angle of the test light entering the hologram after having been reflected from the aspheric surface. Alternatively, a single optical element with a hologram and a concave surface can be used instead of the separate first and second optical elements. An extremely aspheric lens can be precisely measured using the apparatus.
Owner:SAMSUNG ELECTRONICS CO LTD

Apparatus for testing a light emitting device, and a method for testing light emitting devices

A text fixture (1) comprises apparatus (4) for verifying the color and brightness of light emitted from LEDs (5) of a printed circuit board (3). A base (6) of the fixture (1) supports the printed circuit board (3) during testing. A mounting panel (14) locates ends (15) of a plurality of optical fibers (10) adjacent the LEDs (5) on the printed circuit board (3), and ends (21) of ht optical fibers (10) are terminated in a terminating panel (20) adjacent an image sensing panel (11). The image sensing panel (11) comprises an array of individually addressable light and color sensitive pixels (25) onto which light from the optical fibers (10) is incident. An analysing circuit (12) scans the pixels (25) for determining the brightness values and the tristimulus values of the incident light, and a control circuit (9) compares the tristimulus values and brightness values with reference tristimulus and brightness values for verifying the color and brightness of the light emitted by the respective LEDs (5).
Owner:VIVEEN

Apparatus and method for testing optical transceivers

Systems, apparatus and methods for testing the optical quality of optical transceivers or ports. A port tester is provided that is used to quantitatively measure the optical quality of ports. A port is inserted in the port tester between a mirror assembly and a fiber assembly. A mirror included in the mirror assembly is positioned in or near a focal plane of the port lens. A test light signal is directed through the port from the optical fiber and is reflected back through the port by the mirror. The power of the reflected test signal is compared to a control signal and the comparison between these signals is indicative of the optical quality of the port. The fiber assembly is retractable such that a new port can be mounted in the port tester and tested.
Owner:II VI DELAWARE INC

Color digital camera white balance correction method based on color adaptation model

ActiveCN107197225ADetermining the white balance correction gain factorColor signal processing circuitsColor correctionColor adaptation
The invention discloses a color digital camera white balance correction method based on a color adaptation model. According to the method, a color correction matrix is calculated through adoption of a root-polynomial regression method, so device related response values RGB under a plurality of common light sources (hereinafter called the correction light sources) are converted into CIE1931 tristimulus values XYZ unrelated to devices under the same light source. RGB response values of an unknown light source (hereinafter called a test light source) in a practical scene are converted into an XYZ color space through utilization of a pre-calibrated color correction matrix, the corresponding colors of the RGB response values under a reference light source are calculated through utilization of a CAT02 color adaptation model, and the corresponding colors are the colors sensed by a visual system after an observer carries out color adaptation to the test light source.
Owner:ZHEJIANG UNIV

Method and system for positioning fault of optical fiber behind optical splitter in passive optical network (PON)

The invention discloses a method and a system for positioning a fault of an optical fiber behind an optical splitter in a passive optical network (PON). The method includes the following steps: when a downward branch optical path below a PON port breaks down, an optical time domain reflector (OTDR) is used for inputting downward test light to the PON port, the downward test light is combined with downward service light and then transmitted, and the OTDR is used for collecting the reflection curve of the downward test light and regarding the reflection curve as a test curve; the reflection curve of the downward branch optical path below the PON port when the downward branch optical path does not break down is regarded as a reference curve, and the test curve is compared with the reference curve so as to identify a reflection peak which exists in the reference curve but disappears at a corresponding position in the test curve and to determine a branch optical path, where an optical network user terminal corresponding to the reflection peak which disappears is located, as a fault light splitting branch below the PON port; whether a novel reflection peak exists in the test curve but does not exist at a corresponding position in the reference curve is identified; and if the novel reflection peak exists, the position of the novel reflection peak is determined as the position, where a broken fiber fault happens, in the fault light splitting branch. The method and the system can be used for quickly and accurately positioning the fault of the optical fiber behind the optical splitter in the PON.
Owner:CHINA TELECOM CORP LTD

Novel mobile phone camera module automatic test machine

The invention provides a novel mobile phone camera module automatic test machine which comprises a control panel, a test area and a work machine frame, wherein a work table top and a keyboard support are arranged in the middle of the work machine frame. The test area comprises a test position and a test light source located above the test position, the test position is arranged on the work table top, the test position comprises a reset switch, a starting switch, a display signal device, a test main board, a tank chain, a product fixing mechanism, an X-Y horizontal-movement sliding platform, a light barrier, a sliding rail, a sliding sleeve and a limiting sensor, the sliding sleeve can freely slide on the sliding rail front and back, the X-Y horizontal-movement sliding platform is fixed on the sliding sleeve, and the test main board is fixed on the X-Y horizontal-movement sliding platform. Automatic test of a mobile phone camera module, comprising MTF test, stain test, damaged point test, noisy point test, VCM curve test, color uniformity and luminance uniformity test, and the like is ahieved through the novel mobile phone camera module automatic test machine. The novel mobile phone camera module automatic test machine is high in test efficiency, and suitable for modules of different pixel levels.
Owner:NINGBO SUNNY OPOTECH CO LTD

Intrument for testing solid-state imaging device

A testing apparatus, by which an optical system to irradiate a test light to a solid-state imaging device is easily aligned with the solid-state imaging device and highly efficient tests can be conducted, is provided. It includes an optical module 35 for irradiating a light from a light source to a light receiving surface of the solid-state imaging device through a pin hole, a probe card 20 having contact probes for contacting pads of the solid-state imaging device, and a motor 30 and a holding arm 31 for moving the optical module 35 to a predetermined position corresponding to the solid-state imaging device to be tested through an opening 20h provided to the probe card 20 in a state where the contact probes 21 contact the pads of the solid-state imaging device to be tested.
Owner:INTER ACTION

In-situ detection method for stray light in step scan projection mask aligner

This invention relates to an in-situ test method for stray light in a step scan projection aligner, which limits a spot on an object face by accurately positioning four slit blades and images on a working platform by a projecting object lens. An energy sensor tests that the light intensity at the spot photo center is Lo and finishes testing to MXN spots then to open the slit, the light intensity of above mentioned point light intensity is measured to be l, the stray light coefficient is computed by formula (1, -10) / 10, if the stray light exceeds the required target of the exposure system, it analyses source of stray light. A special mask and two slit blades limit a spot imaged by projection object lens, an energy sensor tests light intensity distribution in the image spot to analyze if the stray light is from the illumination system or the project object lens.
Owner:SHANGHAI MICRO ELECTRONICS EQUIP (GRP) CO LTD

Vision Screener

An article and method for screening vision are described that does not require verbal input from a test person or the test person to maintain a fixed position during the screening. The article includes an image capture device, at least one test light, a processing unit that includes an interpretive program, and a display. The method comprises capturing an image of a person's eyes, verifying the image, studying the image, evaluating the image, and displaying the results. Conveniently, the article and method require no special training by an operator.
Owner:JOHNS DAVID

Electronic component automatic testing device

The embodiment of the invention provides an electronic component automatic testing method and device; the method is as follows: a to-be-tested electronic component is inserted onto a universal test socket array of an electronic switch tooling plate, precision position movement of an image acquisition module is driven by a mechanical arm movement platform, the image acquisition module is on the mechanical arm movement platform; when the image acquisition module reaches above a certain to-be-tested electronic component, a control circuit on the electronic switch tooling plate is started to work to control communication of the to-be-tested electronic component and the control circuit and an electrical performance measurement circuit on the electronic switch tooling plate by an electrical electronic switch matrix, and meanwhile the to-be-tested electronic component enters into the operation state; the image acquisition module photographs the to-be-tested electronic component in the position to acquire an appearance image of the to-be-tested electronic component and a light emitting image of a to-be-tested light emitting device, the acquired images are analyzed and processed by an image processing module in a main control module, a defect product is recognized; electrical performance of the to-be-tested electronic component in the position can be performed by the electrical performance measurement circuit, measured results are analyzed and processed by a measured result analysis module in the main control module, and the defect product is recognized.
Owner:WAYRISE INTELLIGENT TECH

Microlens array-based synchronized phase-shifting interference test method and test device

InactiveCN102507020ANo positional matching errorCost advantageOptical measurementsPhase shiftedPhase shifting algorithm
The invention provides a microlens array-based synchronized phase-shifting interference test method and test device, relating to the field of optical interferometry test. The method comprises the following steps of: firstly, obtaining a pair of reference light and test light from a Twyman type interference testing light path, wherein the polarization directions of the reference light and the testlight are orthogonal; secondly, using a microlens array for carrying out phase shift by using a wavefront splitting method, wherein optical interference signals are received by a detector; and finally, rearranging data obtained by the detector so obtain four phase-shifted interferograms, wherein the tested phases can be recovered by using a universal four-step phase-shifting algorithm. The relative spatial position relationship of the four phase-shifted interferograms obtained by the method provided by the invention is known and unique, position matching errors cannot be generated, and the cost is lower.
Owner:NANJING UNIV OF SCI & TECH

Spinal needle optical sensor

InactiveUS20090069673A1Easily and accurately guideReduce in quantitySurgical needlesCatheterSpinal needlesTest light
An apparatus is disclosed including: an optical coherence tomographic system; a spinal needle having a needle tip adapted to penetrate tissue; and an optical delivery system adapted to direct probe light from the optical coherence tomographic system onto tissue located in front of the needle tip, collect test light backscattered from the tissue, and transmit the test light to the optical coherence tomographic system. The optical coherence tomographic system is adapted to provide information indicative of one or more properties of the tissue based on the test light.
Owner:CHARLES STARK DRAPER LABORATORY

MEMS optical switch device

A MEMS optical switch device is disclosed that includes an optical system deflecting and outputting light signals; first and second test light generation parts generating and feeding first and second test lights to specific input and output ports, respectively, of the optical system; first and second divergence parts diverging the first and second test lights, respectively, from the optical system; first and second monitoring parts detecting the diverged first and second test lights, respectively; and an operational check part causing the first and second test lights to be incident on output and input deflection parts of the optical system by driving a specific input deflection part corresponding to the specific input port and a specific output deflection part corresponding to the specific output port, respectively, and performing an operational check on the output and input deflection parts from the light levels of the detected first and second test lights, respectively.
Owner:FUJITSU LTD

Maximum power tracking capture photovoltaic control method with self-adaptive search algorithm

InactiveCN101078942AFast track work in real timeTrack workPhotovoltaic energy generationAdaptive controlEngineeringSolar battery
The invention discloses a maximal power tracing and catching photovoltaic controlled method with self-adaptive searching algorithm, which comprises the following steps: setting initial step-length; monitoring the voltage and the current of the i time solar battery array; evaluating the i time power; getting voltage change quantity delta Ui and power change delta Pi of the i time and the i-1 time; judging whether the delta Ui is 0; backing to sample if delta Ui=0; evaluating slope delta Pi / delta Ui of P-V curve if delta Ui is not equal to 0; judging whether delta Pi / delta Ui absolute value is not less than the setting accuracy E; un-changing dutycycle of buck circuit switching tube if |delta Pi / delta Vi|=E. This invention does not need device to test light intensity and temperature, which can decrease the cost of solar electric power generation system.
Owner:SOUTH CHINA UNIV OF TECH

Integrated test system and integrated test method for fiber-optic network

InactiveCN105591693AAchieve synthesisRealize unified control and centralized monitoringElectromagnetic transmissionFiberCombined test
The invention provides an integrated test system for a fiber-optic network. The system comprises a light source generator used for being connected with a first end interface of a to-be-measured optical fiber and sending a test light source, wherein the wave length of the test light source is selectable; an optical power meter used for being connected with the second end interface of the to-be-measured optical fiber, receiving the test light source and conducting the test on the relative power / absolute power to obtain the test result on the optical power of the to-be-measured optical fiber, wherein the wave length of the test light source is 1310 nm or 1550 nm during the testing process of the optical power meter; a light loss computing device used for calculating the difference value of the optical power as the test result on the light loss of the to-be-measured optical fiber based on the test result of the optical power meter on the test light source; a test control device used for controlling the operation of the system and receiving all the above test results to form a test report; and a centralized control computer used for receiving the test report updated by the above test control device. Based on the above integrated test system and the above integrated test method, the integrated test can be realized. Meanwhile, the system and the method can be applied in different test scenarios to generate a unified rest report for remote transmission. In this way, the remote centralized monitoring is realized.
Owner:INNO INSTR (CHINA) INC

Growth silicon based thin film and PECVD equipment for high-efficiency silicon based thin-film solar cell

The invention relates to a PECVD device of solar energy batteries of grown silicon base films and highly effective silicon base films and comprises a deposited cavity body, a gas controlling system, an electro-control system and a vacuum unit; wherein, the deposited cavity body consists of a growing cavity body (1) arranged at the middle position of the deposited cavity body, and in and out plate chambers (2) arranged at two sides of the growing cavity body (1); the in and out plate chambers (2) which are provided with movable doors which can be opened and closed by hand are provided with a plurality of plates of automatic loading and unloading frames of sample plates; four groups of parallel plate capacitive electrodes used in deposition are positioned in the growing cavity body (1) and each group of parallel plate capacitive electrodes consists of two upper and lower electrode plates which are arranged symmetrically, and baffles are arranged vertically between each group of parallel plate capacitive electrodes; the vacuum unit consists of a mechanical pump (3), a condensation filter (4) and a waste air treatment device (5); a PLC controller of the electro-control system controls the growing process of silicon base films and the solar energy batteries of silicon base films; the heterogeneity of the silicon base film prepared by the invention is less than 3 percent (tested and calculated by adopting the method of infrared transmission spectrum) and the converting efficiency of the solar energy batteries of silicon base films is more than 9 percent (testing light source: AM1.5; 1000W / M<2>).
Owner:INST OF ELECTRICAL ENG CHINESE ACAD OF SCI
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