Patents
Literature
Patsnap Eureka AI that helps you search prior art, draft patents, and assess FTO risks, powered by patent and scientific literature data.

158 results about "Light Testing" patented technology

A test light is simpler and less costly than a measuring instrument such as a multimeter, and often suffices for checking for the presence of voltage on a conductor. Properly designed test lights include features to protect the user from accidental electric shock.

Backlight module preparation method and device

The invention discloses a backlight module preparation method and device. The backlight module preparation method comprises the steps that LED test light bars are arranged according to the model size of a display module; adjusting a driving electrical parameter of the LED test light bar to enable the display of the whole machine to reach a target color point value, and obtaining a first electrical parameter; working current data of a single LED lamp bead is calculated according to the first electrical parameter, and luminous flux and color coordinates of various LED lamp beads are obtained; constructing a colorimetric mixing formula and calculating a white light color point theoretical value of the backlight module; and according to the theoretical value of the white light color point, in combination with the pre-selected wavelength of the blue light chip, the fluorescent powder and the glue type, obtaining the proportion of the fluorescent powder, and preparing the backlight module according to the proportion of the fluorescent powder. The whole machine is tested in advance, and the target color point value of the white light LED device is calculated according to the test data, so that the preparation accuracy of the white light LED device is improved, repeated test verification is avoided, the development period of a liquid crystal display is shortened, and the development cost is effectively reduced.
Owner:GAOZHOU GUOXING OPTOELECTRONICS TECHNOLOGY CO LTD

Coherence tomography wavefront measuring device and method based on optical fiber interconnection and point diffraction

The invention belongs to the field of optical measurement and detection, and particularly relates to a coherence tomography wavefront measurement device and method based on optical fiber interconnection and point diffraction, the measurement device separates a fundamental mode and a high-order mode of test light through a few-mode optical fiber, the fundamental mode generates a reference spherical wave through point diffraction to serve as reference light, and the high-order mode serves as the test light; after the test light and the reference light are subjected to optical fiber coupling interference, an interference pattern is obtained by a detector, and wavefront error measurement and optimization are realized through wavefront calculation and correction. The method has high precision and high stability, and can realize rapid closed-loop feedback correction.
Owner:CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI

Semiconductor structure doping concentration distribution measurement system

The application relates to the technical field of optical measurement, and discloses a semiconductor structure doping concentration distribution measuring system, which comprises an excitation module for generating excitation light; a light splitting module located on the light path of the excitation light and used for splitting the excitation light into first power light and second power light, wherein the first power light is used for irradiating a sample to be measured; a measuring module located on the light path of the second power light and used for measuring the power of the second power light; and a collecting module used for collecting the spectrum signal of test light generated by the sample to be measured under the excitation of the first power light. The embodiment of the application can realize non-contact and nondestructive measurement of the doping concentration distribution of a semiconductor structure.
Owner:SANY SILICON ENERGY (ZHUZHOU) CO LTD

A testing device and method for correcting precision of an active optical correction system of a telescope

A kind of telescope active optical correction system correction accuracy testing device, including laser interferometer, multidimensional adjusting table, wave aberration measurement component and plane mirror, laser interferometer is placed in the outside of optical telescope for emitting test light to the inside of optical telescope, to detect the wave aberration data of multiple fields of view;Multidimensional adjusting table is used to adjust the position, angle of optical element in optical telescope, to simulate the situation that telescope imaging quality drops;Wave aberration measurement component is set at the image plane of telescope for measuring the wave aberration after optical telescope imaging quality drops, and plane mirror is used to reflect test light.The present application relates to a kind of telescope active optical correction system correction accuracy testing method, the displacement amount and rotation angle of optical element when comparing when simulating image quality drop and when correcting judge the correction accuracy of active optical correction system, compare wave aberration before simulating image quality drop and after correction, judge whether the image quality after correction reaches the image quality before simulating image quality drop.
Owner:WUXI UNIV

Airborne communication link fault positioning method and system based on embedded OFDR

The invention relates to an avionics system optical fiber communication link health management technology, and provides an airborne communication link fault positioning method and system based on an embedded OFDR, and the method comprises the steps: integrating an embedded OFDR function unit in an airborne network switching module, outputting frequency linear scanning continuous wave test light, and dividing the test light into detection light and reference light; the detection light is sequentially injected into each to-be-detected optical fiber link through the switch exchange matrix, and returned backward Rayleigh scattering light is received and interferes with the reference light to generate a beat frequency signal; a Rayleigh scattering distance map is obtained through analog-to-digital conversion and fast Fourier transform and is compared with a pre-stored health reference map in a differential mode, an abnormal event is recognized, and the position of a fault point is accurately positioned. According to the method, on-line monitoring with sub-millimeter resolution and no blind area can be achieved under the conditions of low power and no communication interruption, multi-link automatic polling, fault link switching and maintenance information reporting are supported, and the requirements for high reliability and BIT autonomous diagnosis of an airborne system are met.
Owner:XIAN AVIATION COMPUTING TECH RES INST OF AVIATION IND CORP OF CHINA

A photoelectric transducer sensitivity adjustment device and method

A photoelectric converter sensitivity adjusting device and method, comprising a light source module, a shielding cage, an optical fiber bundle, an optical power meter, a power supply, a photoelectric converter and a voltmeter, the light source module is used to generate test light, one end of the shielding cage is provided with a small hole for receiving the test light, the other end is provided with an optical fiber bundle connector connected with the optical fiber bundle, the test light entering the shielding cage from the small hole enters one end of the optical fiber bundle from the optical fiber bundle connector, the optical power meter is used to test the optical power emitted from the other end of the optical fiber bundle, the photoelectric converter has an optical fiber bundle connector and an output signal line, the optical fiber bundle connector is used to be detachably connected to the other end of the optical fiber bundle, and the voltmeter tests the output voltage of the photoelectric converter; the photoelectric converter is provided with a sensitivity adjusting resistor, and the output voltage can be changed under the same light intensity excitation. The device can shield the interference of environmental light in ordinary experimental environment, accurately adjust the sensitivity of the photoelectric converter, and has the advantages of low cost, high detection efficiency and convenient operation.
Owner:TSINGHUA SHENZHEN INTERNATIONAL GRADUATE SCHOOL

Device for testing light transmittance of high-light-transmittance acrylic plate

The utility model discloses a high light transmittance acrylic plate light transmittance testing device, relates to the light transmittance testing technical field, and comprises a work bench, four corners of the lower end of the work bench are fixedly connected with support columns, two sides of the upper end of the work bench are respectively provided with two first telescoping grooves and two second telescoping grooves, and the two first telescoping grooves and the two second telescoping grooves are connected with the support columns. A telescopic mechanism connected with the two first telescopic grooves is arranged at the lower end of the workbench, a moving plate is arranged above the two second telescopic grooves in a sliding mode, a sliding groove is formed in one side of the upper end of the workbench, and a driving mechanism for driving the moving plate to move is arranged in the sliding groove; the upper end and the lower end of the workbench are fixedly connected with a receiving device and a transmitting device respectively. According to the utility model, the automatic ejection of the acrylic plate after testing is realized, the operation process is simplified, an automatic solution for smoothly and accurately moving a sample among different positions is also provided, and the testing efficiency and accuracy are obviously improved.
Owner:JUMEI ACRYLIC MFG CO LTD

A high-resolution speckle wavelength measurement device and method

The application belongs to the technical field of wavelength measurement, and is especially a high-resolution speckle wavelength measurement device and method. The device comprises a shell, a first optical fiber incident port and a second optical fiber incident port are arranged on the outer wall of the shell, an optical switch, a light splitting coupler, a calibration light source and a test light path are arranged in the shell, and the test light path is composed of a multimode optical fiber, an optical fiber mode enhancement device and a surface array detector. The application enhances the coupling and phase delay between different modes by applying mechanical disturbance to the scattering medium, increases the number of excited modes, and solves the problems that the resolution of the speckle wavelength meter is limited by the light path length of the transmission medium and the insufficient information density of the speckle per unit area. The method can improve the wavelength resolution, and effectively improve the sampling speed of the speckle wavelength meter by reducing the size of the photosensitive camera target surface.
Owner:JILIN UNIVERSITY

A key parameter testing system for a fiber type single photon avalanche diode and a method of using the same

This application provides a key parameter testing system and method for fiber-optic single-photon avalanche diodes (SPADs). The system uses a testing module to drive multiple SPADs under test, generates laser trigger signals based on parameter testing requests, and acquires pulse parameters for each SPAD under test under different testing modes with and without light source illumination. A laser generation module generates an initial pulse signal based on the laser trigger signal; a laser adjustment and transmission module adjusts the light attenuation value of the initial pulse laser and separates it into multiple test light sources with equal laser power; a control module monitors the laser power of the laser generation module and configures the laser adjustment parameters of the laser adjustment and transmission module; and the system determines the key parameters of each SPAD under test based on the pulse parameters. The system provided in this application can quickly detect the key parameters of multiple SPADs while ensuring detection accuracy, and the parameter testing process is simple and intuitive.
Owner:THE 44TH INST OF CHINA ELECTRONICS TECH GROUP CORP

A femtosecond laser-based fiber grating automatic processing and sorting system and method

The application belongs to the technical field of optical fiber preparation automation, and specifically discloses a femtosecond laser-based optical fiber grating automatic processing and sorting system and method. The system comprises a sorting unit, a processing unit and a detection unit. The sorting unit comprises a feeder for automatically feeding optical fibers during processing, a winding machine connected with the feeder through an optical fiber and used for packaging and winding the finished optical fibers, and an industrial robot used for sorting the packaged finished optical fibers. The processing unit is arranged between the feeder and the winding machine and is used for processing optical fiber gratings. The detection unit comprises a test light source, an optical circulator, an optical spectrum analyzer and a loss module. The optical circulator is connected with the test light source, the optical spectrum analyzer and the optical fiber on the feeder. The loss module is arranged between the processing unit and the winding machine and blocks the propagation of test laser emitted by the test light source in the optical fiber through a bent optical fiber. The control unit is in communication connection with the processing unit, the sorting unit and the detection unit and is used for realizing optical fiber grating automatic processing and sorting.
Owner:SHANGHAI JINLEI OPTOELECTRONICS TECHNOLOGY CO LTD

Fourier infrared spectrometer device

The embodiment of the utility model provides a Fourier infrared spectrometer device, and relates to the technical field of instrument engineering, and the Fourier infrared spectrometer device comprises a rotating assembly which comprises a rotating disc and a baffle plate, the baffle plate is installed on the rotating disc, the rotating axis of the rotating disc coincides with the rotating axis of the baffle plate, the baffle plate is provided with a through hole, and the through hole is communicated with the rotating disc; the through hole is located in the rotating axis of the rotating disc. The fixing structure is used for fixing a workpiece on the baffle plate; the light generator is arranged on one side of the baffle; and the light receiver is arranged on the other side of the baffle plate, and the light receiver is used for receiving the light rays emitted by the light generator. In the embodiment of the invention, the incident light test of different angles can be carried out on the workpiece so as to obtain the imaging effect of the incident light of different angles.
Owner:ANHUI JINGWEI TECHNOLOGY CO LTD

Responsivity testing device and method of photoelectric detector and wafer

The invention provides a photoelectric detector responsivity testing device, a photoelectric detector responsivity testing method and a wafer. The responsivity of a to-be-tested photoelectric detector can be accurately and rapidly tested with low testing cost. In the responsivity testing device, a first reference photoelectric detector and a to-be-tested photoelectric detector are respectively connected to different output ends of a 1 * N optical splitter, and a light current testing module respectively tests light currents of the first reference photoelectric detector and the to-be-tested photoelectric detector and outputs the light currents to a responsivity calculation module. The responsivity calculation module calculates the responsivity of the to-be-detected photoelectric detector based on the reference responsivity of the first reference photoelectric detector, the corresponding light splitting proportions of different output ends of the 1 * N light splitter, and the ratio of the photocurrent of the to-be-detected photoelectric detector to the photocurrent of the first reference photoelectric detector.
Owner:张江国家实验室 +1

Device and method for inspecting laser welding protective glass

An optical inspection device designed for testing an optical component such as a protective glass, an optical transmission system of a welding laser beam having a laser wavelength, comprising:a light source designed to emit a test light,receiving means designed to receive at least a portion of the test light and to quantify at least one quantity of the received light,means for holding the optical component designed to position the optical component between the light source and the receiving means, characterized in that:the portion of the test light received by the receiving means has a wavelength at ±20% of the laser wavelength.
Owner:AUTOLIV DEV AB

Dual optical path spectrometer and color measurement device and calibration method

The application discloses a double-optical-path spectrometer, a color measurement device and a calibration method, and relates to the field of color measurement devices. The color measurement device obtains reflected light of a measured sample and reflected light of a test light source, and inputs the reflected light into a first incident slit and a second incident slit of a spectrometer through a Y-shaped light path unit; the reflected light is incident on a grating through a lens; diffracted light spots returned by the grating are incident on a photosensitive surface of a sensor on the side of the incident slit through the lens; the photosensitive surface is provided with an aperture stop with a dislocation opening; and the photosensitive surface at each dislocation opening only receives light signals of one light path, so that the short-term repeatability of spectrophotometry is improved. When wavelength calibration is performed, light signals of a calibration light source are obtained through the Y-shaped light path unit; pixel position information of the collected light signals is obtained according to a sensor of the spectrometer; a fourth-order polynomial is used to fit wavelength data and the pixel position information; the correspondence between the pixels and the wavelengths is adjusted; and the wavelengths are calibrated, so that the short-term repeatability of spectrophotometry is improved.
Owner:CAIPU TECHNOLOGY (ZHEJIANG) CO LTD

Optical transmission line test equipment and test method

An object of the present invention is to provide an optical transmission line test apparatus and a test method capable of measuring a cumulative crosstalk of an optical transmission line in which a plurality of uncoupled multi-core fibers are connected in series from one end side with an OTDR.An optical transmission line test apparatus 301 according to the present invention measures a cumulative crosstalk of an optical transmission line 50 in which a plurality of uncoupled multi-core fibers 50-i are connected in series. The optical transmission line test apparatus 301 includes a test light input unit 10 that inputs optical pulses to each of cores of the uncoupled multi-core fiber 50-1 at one end 50a of the optical transmission line 50; a reception unit 20 that receives backscattered light for each of the cores output from one end 50a; and a calculation unit 30 that acquires a loss distribution occurring in each of the cores from the backscattered light, and calculates the cumulative crosstalk from a connection loss at a connection point zj of the uncoupled multi-core fiber obtained from the loss distribution and a known inter-core mode coupling of each of the uncoupled multi-core fibers 50-i.
Owner:NT T INC

Optical property evaluation device and method

PCT designated stageWO2026140177A1Optical propertyEngineering
An optical property evaluation device 20 according to the present disclosure comprises: a test light generation unit 30 that generates test light; an input / output unit 40 that inputs the test light from one end of an optical fiber 10 under test in any polarization state, and acquires and outputs, from the one end, backscattered light from each point of the optical fiber 10 under test; a backscattered light complex electric field amplitude acquisition unit 50 that acquires, for each point of the optical fiber 10 under test, a complex electric field amplitude of the backscattered light output from the input / output unit 40; and an arithmetic processing unit 60 that converts the complex electric field amplitude into a matrix for each point of the optical fiber 10 under test, and evaluates polarization dependent loss using a singular value of the matrix.
Owner:NT T INC

Methods, systems, apparatuses, devices, and media of testing solar cells

The application discloses a solar cell testing method, system, device, equipment and medium. The solar cell includes a sub-cell, and the testing method includes: applying bias light corresponding to a characteristic absorption light wavelength of the sub-cell to the solar cell to obtain first photovoltaic characteristic data of the sub-cell under the bias light; applying specified test light and bias light corresponding to the characteristic absorption light wavelength of the sub-cell to the solar cell to obtain a target short-circuit current density of the sub-cell; and obtaining second photovoltaic characteristic data of the sub-cell under the specified test light based on the first photovoltaic characteristic data and the target short-circuit current density. Thus, the testing accuracy of the solar cell is improved.
Owner:CONTEMPORARY AMPEREX TECHNOLOGY CO LTD

Optical fiber testing device and optical fiber testing method

The purpose of the present invention is to provide an optical fiber testing device and a method therefor that enable stable measurement of crosstalk in an MCF and an MMF without being affected by noise. An optical fiber testing device according to the present invention measures crosstalk of a space-division multiplexed optical fiber 50, and comprises: a light transmission unit 10 that causes modulated test light to enter one path of the space-division multiplexed optical fiber 50 from one end of the space-division multiplexed optical fiber 50; a light receiver 22 that receives transmitted light output from each path at the other end of the space-division multiplexed optical fiber 50 and outputs the transmitted light as a light reception signal; a signal processing unit 24 that demodulates each light reception signal and detects the light intensity of the respective transmitted light; and a calculation unit 30 that calculates crosstalk from the light intensity of the transmitted light.
Owner:NT T INC

Photonic plate with test device

The invention relates to a photonic plate (PP) comprising at least one motif (MOT), a motif comprising at least one so-called functional photonic chip (PPf) and a test device (DT), the test device (DT) comprising: a first test assembly (E1t) comprising: a first coupler by the test slice (EDC1t), called the first test coupler, a first test light / waveguide coupling device (DC1t), a second coupler by the test slice (EDC2t), called the second test coupler, a second test light / waveguide coupling device (DC2t), the first and second test couplers being arranged symmetrically with respect to a point O, a so-called reference assembly (Er) comprising a reference waveguide (WGr) and a first (DC1r) and a second (DC2r) reference light / waveguide coupling device,The first (DC1t) and second (DC2t) test light / guide coupling devices and the first (DC1r) and second (DC2r) reference light / guide coupling devices are all identical. Figure 4,
Owner:COMMISSARIAT A LENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES

An LED aging test device

This invention discloses an LED aging test device, relating to the field of lighting testing technology. It includes a cabinet with an electrical compartment and a loading compartment spaced horizontally inside. A loading assembly, located at the center of the loading compartment, comprises two identical discs arranged symmetrically vertically. Circumferential grooves are formed on the sides of the discs. Anti-slip rings are fixedly connected to the groove walls on the sides closest to each other, while multiple arc-shaped substrates are fixedly connected to the groove walls on the sides furthest from each other. A set of springs is fixedly connected to the side of each arc-shaped substrate facing the anti-slip rings, and a conductive arc sheet is fixedly connected to the end of each set of springs facing the anti-slip rings. The loading assembly achieves a one-step effect of immediate fixation and power-on of LED pins upon insertion, reducing cumbersome steps and improving the efficiency of clamping and testing.
Owner:CHANGCHUN UNIV OF SCI & TECH +1

Light receiving and transmitting integrated device and method for inhibiting overlarge blind area at front end

The invention relates to the technical field of OTDR (Optical Time Domain Reflectometer), in particular to an optical transceiving integrated device and method for inhibiting an overlarge front-end blind area, and the device comprises a laser which is used for generating test light; the polarization controller is used for adjusting the test light into linearly polarized light only containing an S component; the slide is arranged on the emergent light path of the polarization controller, and the included angle between the normal and the incidence direction of the adjusted test light is a Brewster angle; the detection end of the device is arranged in the direction of a reflection light path of the adjusted test light by the slide and is used for placing an optical fiber to be tested, so that the device emits the test light reflected by the slide to the optical fiber to be tested; enabling the device to receive backward Rayleigh scattering light returned by the optical fiber to be detected; and the avalanche photodiode is arranged on a transmission light path of the slide to the backward Rayleigh scattering light and is used for receiving the backward Rayleigh scattering light penetrating through the slide. Therefore, the advantages of preventing APD supersaturation during short-distance testing and improving the signal-to-noise ratio during long-distance testing are achieved at the same time.
Owner:GUILIN UNIV

Back contact solar cell IV testing device

The utility model discloses a back contact solar cell IV test device, which comprises a transmission mechanism, a liftable test platform, an IV test light source and a back contact solar cell, the liftable test platform is driven by a first lifting mechanism arranged below the liftable test platform, a negative pressure chamber is arranged in the liftable test platform, and the IV test light source is arranged in the negative pressure chamber. A test probe device is mounted in the liftable test platform and comprises a probe, a test frame and a second lifting mechanism, the probe is fixed on the test frame and extends out of the surface of the liftable test platform, and the surface of the liftable test platform is provided with a rubber sealing ring and an air suction hole. The rubber sealing ring is embedded in the table top of the liftable test platform and surrounds all the probes and the air suction holes, and the liftable test platform is further provided with a battery piece limiting device. The device is stable in testing, high in accuracy and suitable for large-scale assembly line type production, the production cost is greatly reduced, and the production efficiency is improved.
Owner:GOLD STONE (FUJIAN) ENERGY CO LTD

Method for visually controlling optical power density and safety on retina

The invention provides a method for visually controlling optical power density and safety on a retina, and the method comprises the steps: irradiating reference light on a simulated eye, and collecting optical reference data of a cornea region of the simulated eye and a retina region of the simulated eye, the reference light being red sunlight; irradiating light to be measured on a simulated eye, and collecting optical test data of a cornea area and a retina area of the simulated eye; determining an associated data set of the retina area of the simulated eye under different diopters based on an insert optometry; and adjusting the emergent equipment according to the type of the emergent equipment of the to-be-detected light, the optical reference data, the optical test data and the associated data set. According to the invention, the problem that a method for measuring and controlling the optical power density and the light spot size of the retina in the RLRL red light therapy technology is lacked in the prior art is solved.
Owner:NANCHANG UNIV +1

A FA fiber array detection fixture

The utility model relates to the field of FA fiber array detection discloses a kind of FA fiber array detection fixture, including jig base, the top of jig base is equipped with lifting mouth, the top of jig base is equipped with clamping mechanism, the top of jig base is placed with FA fiber array main body, the clamping mechanism is used to clamp FA fiber array main body.The utility model has the following advantages and effects: vacuum adsorption and mechanical clamping can be carried out simultaneously on FA fiber array, vacuum adsorption fixes FA through uniform negative pressure, avoids the stress deformation of rigid clamping, protects brittle matrix and optical fiber, buffer contact is carried out to FA fiber array by rubber clamping block, its displacement is limited, positioning accuracy and damage prevention are considered, and by disc spring and rubber spring, external vibration can be effectively absorbed, the relative displacement of optical fiber end face and test light path caused by vibration is avoided, micron-level alignment stability is ensured, and detection data fluctuation is reduced.
Owner:HUBEI NUOTONG ANNAN TECHNOLOGY CO LTD

Interference optical path for acquiring multiple information by single exposure and application thereof

PendingCN122429933ABeam splitterPrism
The application belongs to the technical field of optical precision measurement, automation control and artificial intelligence, and particularly relates to an interference optical path for obtaining multiple information in single exposure and application thereof, the interference optical path comprising: rotating a polarization direction of a light source through a half-wave plate to obtain first linearly polarized light; the first linearly polarized light is evenly divided into reference light and test light by a common beam splitter; the reference light passes through a quarter-wave plate back and forth to obtain second linearly polarized light orthogonal to the first linearly polarized light; the test light is decomposed into third linearly polarized light and fourth linearly polarized light by a Wollaston prism; the third linearly polarized light and the fourth linearly polarized light irradiate on a measured object, pass through the Wollaston prism again after reflection, and are combined with the second linearly polarized light at the common beam splitter; the combined light beam is received by a polarization resolution camera and records interference signals.The application can realize absolute phase reconstruction in single exposure, and is suitable for measuring refractive index distribution of dynamic or environment-sensitive samples.
Owner:CHONGQING UNIV OF POSTS & TELECOMM

An apparatus and method for material infrared refractive index measurement

The application discloses a device and method for measuring infrared refractive index of materials, which comprises an infrared light source assembly, a collimating mirror, a first filter group, a converging lens, a displacement platform and a photoacoustic power assembly arranged in sequence along the horizontal axis direction; the displacement platform carries the material to be measured and can move in the preset range of the focal point of the converging lens along the horizontal axis direction; the infrared light beam is emitted by the infrared light source assembly, the parallel light of a specific spectral band after the collimating mirror and the first filter group is incident to the converging lens, the focused light beam passes through the material to be measured moving in the preset range to form a test light beam, the test light beam enters the photoacoustic power assembly, the photoacoustic power assembly detects and analyzes the change of the light power caused by the movement of the material to be measured, and the infrared refractive index of the material to be measured is given. The application has simple light path, high measurement precision, wide measurement band and strong application in the measurement of the refractive index change of materials.
Owner:STATE GRID JIANGSU ELECTRIC POWER CO LTD +1

LED light decay compensation method based on pulse driving and intelligent range hood

The invention relates to an LED lamp light decay compensation method based on pulse driving and an intelligent range hood. The method comprises the following steps: acquiring a pulse detection signal output by a photoelectric detection module under test light of an LED lamp; the test light is generated by controlling the LED lamp through a pulse driving signal; calculating a response delay index based on the pulse detection signal and the pulse driving signal; and compensating the original driving current of the LED lamp based on the response delay index to obtain a new driving current, thereby solving the problem of poor reliability of LED attenuation compensation, and using the time response characteristic of the signal as the basis for judging the LED attenuation state, not only realizing adaptive compensation, but also improving the accuracy and reliability of LED light attenuation compensation.
Owner:NINGBO FOTILE KITCHEN WARE CO LTD

Optical chip, optical transmitter, optical receiver, and test system

To provide an optical chip or the like for improving test accuracy by highly accurately measuring reflected return light to test light in an optical circuit.SOLUTION: The optical chip is an optical chip having an optical circuit disposed on a substrate. The optical chip includes a first waveguide, a second waveguide different from the first waveguide, a first edge coupler that optically connects the optical circuit and the first waveguide, and a second edge coupler that optically connects the optical circuit and the second waveguide. The waveguide length of the second waveguide is substantially equal to the waveguide length of the first waveguide.SELECTED DRAWING: Figure 1
Owner:FURUKAWA FITEL OPTICAL COMPONENTS CO LTD

ALIGNMENT DEVICE AND METHOD FOR ALIGNING AN OPTOELECTRONIC SENSOR AND OPTOELECTRONIC SENSOR

The invention relates to an alignment device for aligning an optoelectronic sensor, comprising at least one transmitting channel for emitting a test light beam and at least one receiving channel for receiving a test light beam emitted by an associated transmitting channel. The at least one transmitting channel includes a light source for generating the test light beam. The at least one receiving channel includes a light receiver and a receiving optics arrangement for focusing the received test light beam onto the light receiver. In at least one receiving channel, a receiving filter is provided upstream of the light receiver, which has a transmission profile with a transmission gradient and is arranged such that the received test light beam passes through different sub-regions of the receiving filter depending on its angle of incidence into the receiving channel.The invention further relates to a corresponding alignment device with a transmitting filter, a method for aligning an optoelectronic sensor and an optoelectronic sensor with an alignment device according to the invention.
Owner:SICK AG

An optical module testing apparatus

ActiveCN224555619UComputer hardwareOptical test
The utility model discloses a kind of optical module test equipment, it is related to optical communication technical field.Optical module test equipment in:first electric test interface is electrically connected with signal transceiver chip;Control chip is electrically connected with optical test device and optical test interface by light testing device;Control chip and signal transceiver chip are electrically connected;Control chip sends first test control signal to signal transceiver chip, and sends second test control signal to optical test device;Optical test device will be converted into second optical signal by first optical signal received through optical test interface, and second optical signal is sent to second to-be-tested optical module by optical test interface;Signal transceiver chip sends test electric signal to first to-be-tested optical module group by first electric test interface;And target electric signal sent by second to-be-tested optical module group is received by first electric test interface.The optical module test equipment provided by the utility model occupies smaller space and area, and failure is easy to troubleshoot, and cost is lower.
Owner:SHANGHAI BOPU SEMICON TECH CO LTD