494 results about "Light Testing" patented technology

The invention discloses a light source color preference degree evaluation method and device, equipment and a storage medium, and relates to the technical field of light source quality testing. The method comprises the following steps: acquiring a color temperature parameter of a test light source and spectral power distribution in a preset wavelength range, acquiring an associated reference light source based on the color temperature parameter, and calculating reference spectral power distribution; a color quality index is then calculated based on the plurality of test color samples according to the color temperature parameter, the spectral power distribution, and the reference spectral power distribution. Calculating a color gamut space area formed by the test color sample under the test light source according to the spectral power distribution, calculating a color resolution index according to the color gamut space area, and finally calculating a color preference index of the test light source according to the color quality index and the color resolution index. Therefore, the color preference index is calculated according to the color temperature parameter and the reference light source, the calculation process is associated with visual feelings such as visual discrimination, and a basis is provided for accurate evaluation or comparison of the color development quality of different color temperature test light sources through quantitative calculation of the color preference.

An apparatus includes a first light source for illuminating a chart including an index surface on which an index is provided, an objective lens for guiding index light emitted from the chart to an optical system, a first element for receiving the index light reflected on an optical surface in the optical system, an interferometer configured to include a second light source and a second element, and acquire a wavefront of measurement light, the measurement light being test light reflected on the target surface, and a reduction unit for reducing an intensity of a signal of light reflected on an optical surface other than the target surface, of the test light reflected on the plurality of optical surfaces and received by the second element.

The invention discloses a multi-mode perovskite and laminated cell comprehensive test system and method. The system comprises a darkroom, a test platform, an LED light source module, a CCD camera, a laser, an adjustable constant current source, an electronic load and an upper computer. The darkroom is used for shielding external ambient light and providing a dark test environment; the test platform is installed in the darkroom, and a to-be-tested battery is placed on the test platform; the LED light source module is used for providing a test light source; the CCD camera is used for capturing an optical signal generated by the battery to be tested in the testing process; the laser is used for emitting a laser beam to excite the to-be-detected battery to generate a specific optical response; the adjustable constant current source and the electronic load module can be electrically connected with a to-be-tested battery on the test platform, the adjustable constant current source is used for supplying current to the to-be-tested battery, and the electronic load module is used for simulating different load conditions; and the upper computer is used for realizing intelligent control of the test process and processing and display of test data.

The embodiment of the utility model provides a test chip for testing the optical performance of a wafer-level optical waveguide and a packaging structure thereof, and the test chip comprises a light inlet end face which enables test light to enter the test chip in a coupling manner; the waveguide is used for transmitting the test light to the transmitting end grating; the transmitting end grating is used for coupling the test light rays into the receiving end grating of the wafer to be tested, coupling the test light rays into a waveguide pattern area to be tested of the wafer to be tested through the receiving end grating of the wafer to be tested and then conducting the test light rays to the transmitting end grating of the wafer to be tested; the light passing through the to-be-tested waveguide pattern area is coupled by the transmitting end grating of the to-be-tested wafer and is incident to the receiving end grating of the test chip; and the receiving end grating couples the received light into the waveguide of the test chip and then emits the light through the end face of the light outlet, and the emitted light is used for determining optical performance parameters. The utility model also provides a packaging structure for realizing the test function of the test chip. According to the scheme, the optical performance test of the wafer-level optical waveguide is realized.

The invention discloses an inclined wave surface sub-aperture stitching interference detection method based on a spatial light modulator, and relates to the field of optical detection. Light emitted by the laser is collimated and expanded and then enters the polarizing beam splitter; the reflected light is used as a reference light beam, and the transmitted light is used as a test light beam; a test light beam enters the spatial light modulator, is subjected to phase modulation by the spatial light modulator, passes through the lens and then forms standard spherical waves with different inclination angles, and zero detection is carried out on sub-apertures divided in different regions. The spatial light modulator is used as an ideal point source array generator to be matched with the imaging lens, so that required ideal inclined spherical waves can be generated according to different parameters of a measured piece, and compared with a traditional point source generator, the device has high universality. And for a large-aperture complex curved surface, sub-aperture splicing can be realized without moving an interference device, and errors caused by mechanical movement are reduced.

The invention provides an optical element laser thermal effect and light beam quality integrated measurement device and method, and the device combines key assemblies, such as a pump laser, a real-time power monitoring module, an energy transmission optical fiber, a multi-surface reflector, a beam splitter, a monochromatic optical filter, a CCD camera, an infrared thermal imager, a blackbody radiation calibration module, a Fizeau interferometer and the like. And the thermal effect of the transflective element can be measured at a specific angle. The device combines pump light and test light into one beam through the beam combiner and irradiates the surface of a sample at the same time, after transmission, the beam splitter divides the laser into two paths, one path is used for collecting far-field light spots to calculate the quality of the light beams, the other path forms an interference image to calculate thermal distortion, and meanwhile, the thermal infrared imager monitors the temperature of the sample. According to the invention, non-contact lossless integrated synchronous measurement is realized with high integration level and high flexibility, the device is suitable for temperature, thermal distortion and light beam quality measurement of an optical element under continuous or pulse laser, and thermal response characteristics of a sample are comprehensively and accurately evaluated.

The invention provides an indicator light testing method and system of storage equipment, is applied to an indicator light testing system of the storage equipment, and relates to the technical field of server storage equipment management. The method for testing the indicator light of the storage device comprises the steps of obtaining input parameter information in response to operation of a user; wherein the parameter information comprises a slot position and an indicating lamp state; generating an indicator light instruction based on the parameter information; sending the indicating lamp instruction to a storage device to enable the storage device to execute an indicating lamp test based on the indicating lamp instruction; the indicating lamp instruction is generated by acquiring the slot position and the indicating lamp state input by the user, and the indicating lamp action of the storage device is controlled based on the instruction to complete the indicating lamp test, so that the storage device can be accurately and conveniently positioned, the method is suitable for various different types of servers and storage devices, the operation and maintenance efficiency is improved, and the user experience is improved.

A head-mounted display system includes a left display assembly configured to provide left-side display light and left-side test light. A left waveguide incouples the left-side display light and outcouples the left-side display light for viewing. A left optical sensor is positioned to measure the left-side test light. A left inertial measurement unit (IMU) is configured to measure an orientation of the left display assembly. A right display assembly is configured to provide right-side display light and right-side test light. A right waveguide incouples the right-side display light and outcouples the right-side display light for viewing. A right optical sensor is positioned to measure the right-side test light. A right IMU is configured to measure an orientation of the right display assembly. A logic machine is configured to assess a stereo alignment for the left- and right-side display light.

According to the large-size wafer morphology measuring device provided by the invention, the parallel light beams emitted by the light source are split to form the reference light and the test light, the reference light enters the beam combiner after being reflected by the reference reflector, and the test light enters the beam combiner after being reflected by the surface of one side of the measured wafer; the beam combiner combines the incident reference light and test light and then converges the light to the detector to generate an interference fringe image, and the control unit controls the movement of the tested wafer and / or the reference reflector to change the optical path difference between the tested wafer and the reference reflector so as to determine the surface topography of the wafer. And the test yield and precision of the large warping sheet are improved.

The invention provides a system and a method for detecting geometric parameters of an optical fiber with a longitudinal periodic structure. The system comprises an optical fiber clamp used for fixing a test part of the optical fiber to be detected in optical fiber refractive index matching oil in a space image imaging device; the light source is used for emitting test light to the collecting lens through the optical fiber bundle, and the test light is focused into a focused light spot through the collecting lens and then is sequentially emitted to the space image imaging device and the detection device; the space image imaging device is used for moving along the axis direction of the to-be-tested optical fiber based on a preset moving speed after the test light passes through a test part in the optical fiber refractive index matching oil so as to form an optical imaging signal corresponding to the test part; and the detection device is used for acquiring geometric parameters of the periodic structure in the to-be-detected optical fiber according to the optical imaging signal. According to the invention, the detection device can accurately obtain the periodic structure geometric parameters of the to-be-detected optical fiber, and the detection precision and reliability are improved.

A method of predicting a lifespan of a display device includes preparing a test panel including a test light emitting element including a first and second test light emitting layers, measuring a luminance of the first and second color of the test panel to acquire first and second deterioration data of the first and second color, calculating a lifespan of a pixel based on the first and second deterioration data, and a first and second color component ratio of first emission light for a thickness of a wavelength conversion layer. The pixel includes a light emitting element emitting the first emission light and mixed light of the first and second color, and the wavelength conversion layer, and a light emitting layer of the light emitting element includes a first light emitting layer emitting light of the first color, and a second light emitting layer emitting light of the second color.

The invention discloses a comprehensive measurement system for a two-photon fluorescent material. The comprehensive measurement system comprises a laser, a tunable attenuator, a beam splitter, a reference light integrating sphere, a reference light spectrograph, a focus lens, a test light integrating sphere, a test light integrating sphere, a transmission light integrating sphere, a transmission light spectrograph, a stepping motor controller, a computer and the like. By means of the comprehensive measurement system, comprehensive measurement of multiple key performance parameters of the two-photon fluorescent material is achieved, the accuracy and reliability of measurement are improved, and powerful technical support is provided for research and application of the two-photon fluorescent material.

The invention discloses an integrated optical chip, a preparation method and an optical gyroscope, the integrated optical chip comprises a first device layer and a second device layer, the first device layer is provided with a phase modulator, the phase modulator comprises two fourth waveguides used for being connected with an interference ring, the second device layer is provided with a detection unit, and the detection unit comprises two fourth waveguides used for being connected with the interference ring. The detection unit comprises a first coupler and a detector, the first coupler comprises a first waveguide, a second waveguide and a third waveguide, the first waveguide is used for connecting a light source, the first waveguide is connected with the third waveguide, the second waveguide is connected with the third waveguide, and the third waveguide is connected with the phase modulator; the detector is connected with the second waveguide; wherein a light beam is transmitted to the phase modulator through the first waveguide and the third waveguide and is transmitted to the interference ring through the phase modulator, and a test light beam transmitted back by the interference ring is transmitted to the detector through the third waveguide and the second waveguide.

The embodiment of the specification provides a spectrum test lens clamp, comprising: a substrate on which a test lens is placed, the substrate being provided with a chute; the positioning part is used for positioning the test lens, the positioning part comprises a positioning block, and the positioning block can slide relative to the substrate; the clamping part is used for clamping and fixing the test lens, the clamping part comprises a fixing piece, an elastic piece and a clamping piece, the fixing piece is fixedly installed on the substrate, the first end of the elastic piece is connected with the fixing piece, the second end of the elastic piece is connected with the clamping piece, and the clamping piece slides in the sliding groove. The test lens is positioned through the positioning part, the lens is clamped and fixed through the clamping piece, the clamping and fixing effect on the test lens is guaranteed, and during testing, under the condition that it is guaranteed that the substrate is perpendicular to test light, only the test lens needs to be tightly attached to the substrate, and therefore the lens within a certain size range and with a certain thickness can be precisely measured.

According to the parallel detection method, the CIS test board card and the semiconductor test equipment provided by the invention, the probe station is controlled to move so as to connect the probe connector on the probe station with the pin of the chip to be tested, and the light source system is controlled to provide the test light source for the chip to be tested; controlling a switching circuit to switch a signal detected by the probe station to an image test system or a DC test system; acquiring detection information of the chip to be tested acquired by the image test system or the DC test system; and testing the to-be-tested chip based on the detection information, so that automatic testing can be realized, and the testing time can be saved.

The invention discloses a backlight module preparation method and device. The backlight module preparation method comprises the steps that LED test light bars are arranged according to the model size of a display module; adjusting a driving electrical parameter of the LED test light bar to enable the display of the whole machine to reach a target color point value, and obtaining a first electrical parameter; working current data of a single LED lamp bead is calculated according to the first electrical parameter, and luminous flux and color coordinates of various LED lamp beads are obtained; constructing a colorimetric mixing formula and calculating a white light color point theoretical value of the backlight module; and according to the theoretical value of the white light color point, in combination with the pre-selected wavelength of the blue light chip, the fluorescent powder and the glue type, obtaining the proportion of the fluorescent powder, and preparing the backlight module according to the proportion of the fluorescent powder. The whole machine is tested in advance, and the target color point value of the white light LED device is calculated according to the test data, so that the preparation accuracy of the white light LED device is improved, repeated test verification is avoided, the development period of a liquid crystal display is shortened, and the development cost is effectively reduced.

The invention discloses a compact high-precision pinhole phase shift point diffraction interference measurement device and method, and relates to the technical field of optical interference measurement, the compact high-precision pinhole phase shift point diffraction interference measurement device comprises a shell, the side wall of the shell is provided with a through hole, and the through hole is provided with a spherical lens; a diffracted light processing unit is obliquely mounted on the inner side wall of the upper end of the shell, a reflected light processing unit is obliquely mounted on the inner side wall of the lower end of the shell, and a unit to be tested is mounted outside the shell; the diffracted light processing unit emits to-be-tested light and reference light, the to-be-tested light irradiates a to-be-tested unit through the spherical lens, and the reference light and test light reflected by the to-be-tested unit irradiate the reflected light processing unit; and the diffracted light processing unit and the reflected light processing unit are electrically connected with the computer. According to the compact high-precision small hole phase shift point diffraction interference measuring device and method, high-precision absolute detection of the measured optical element is achieved, real-time visual monitoring can be achieved, and damage to human eyes during debugging is reduced.

The invention discloses a method for testing the light aging resistance of a color changing film, and relates to the technical field of color changing films. The method comprises the following steps: matching a plurality of performance influence factor tolerance spaces based on a key parameter set; performing test risk analysis on the plurality of performance influence factor tolerance intervals, and determining a plurality of test risk factors; calling a historical test data set of the target color change film, and determining a historical test database; on the basis of the historical test database, the application distortion probability of the performance influence factors is calculated in combination with the multiple test risk factors, and multiple application distortion probabilities are obtained; performing performance test scheme balanced identification on the plurality of performance influence factor tolerance spaces, and determining a target performance test scheme; and carrying out light aging resistance test on the target color changing film based on the target performance test scheme. The technical problem that in the prior art, the reliability of the light aging resistance test of the color changing film is poor is solved, and the technical effect of improving the reliability of the light aging resistance test of the color changing film is achieved by optimizing the performance test scheme.

The invention relates to the technical field of lens module detection, in particular to lens module EOL detection equipment and method, and the equipment comprises a four-station turntable mechanism which is provided with a plurality of bearing test seats for placing lens modules after code scanning; and a plurality of functional modules arranged around the four-station turntable mechanism, wherein the functional modules comprise a surface light test module for optical test, a white field detection assembly, a collimator test module and a black field test assembly. By integrating a multi-station automatic detection process, multiple performance detections such as electrical test, definition, color, signal-to-noise ratio, FOV angle of view, COD decentration, white balance, dark corner, stain and black field of the lens module can be synchronously completed, the coverage of detection items is comprehensive, and compared with traditional equipment only performing white field or black field detection, the full-automatic lens module detection equipment has the advantages that the full-automatic lens module detection equipment is simple in structure and convenient to operate.

An object of the present disclosure is to make it possible to isolate whether an abnormality has occurred in any one of sections of an optical fiber and a device.The present disclosure provides an optical power feeding system including: a light source that outputs power feeding light to an optical fiber; a plurality of optical nodes connected in series to the optical fiber; and an optical tester that transmits test light from the light source side of the optical fiber toward the plurality of optical nodes and detects reflected light of the test light, in which each optical node includes: a photoelectric conversion element that converts the power feeding light into electricity; a power storage unit that stores electric power converted by the photoelectric conversion element; an optical switch that switches an output destination of the power feeding light propagated through the optical fiber between the photoelectric conversion element included in the optical node and another optical node connected to the optical fiber; a control unit that switches connection of the optical switch in accordance with a control signal superimposed on the power feeding light; and a test light cut filter that reflects, toward the optical tester, the test light output from the optical switch to the photoelectric conversion element.

The application provides a test device comprising a test bench comprising a box body and a windshield, the windshield is installed on the box body to form a closed space, and the windshield is used for receiving test light; the head-up display device is arranged in the closed space; the constant temperature device is used for keeping the temperature in the closed space constant; the testing mechanism is electrically connected with the head-up display device to obtain temperature information of the head-up display device, through the setting mode, on one hand, sunlight backflow testing is conducted on the head-up display device before daily use of the head-up display device, so that it is ensured that the performance of the head-up display device in the aspect of sunlight backflow meets the use requirement; on the other hand, the head-up display device is tested in a closed and constant-temperature environment, so that errors of test results caused by different environment temperatures are avoided, and the accuracy of the test results is improved.

The invention provides a method and a device for testing optical fiber coupling efficiency in space optical communication, and belongs to the field of space optical communication. Comprising a light source generation module used for generating a test light beam; the turbulence simulation module is used for simulating the influence of external field turbulence on light beam transmission; the phase difference correction module is used for correcting a low-order phase difference caused by system installation and adjustment or platform vibration and the like and compensating other phase differences caused by phase differences of optical devices; the optical fiber coupling module is used for coupling the spatial light to an optical fiber and determining optical power; and the control module is used for controlling the turbulence simulation module and the phase difference correction module and determining the optical fiber coupling efficiency according to the optical power of the test light beam. By means of the device, a quantitative relation model between the single influence factor and the optical fiber coupling efficiency can be determined with high precision.

The invention relates to the field of optical axis parallelism measurement, and provides an optical axis parallelism measurement method, which comprises the following steps of: adjusting a collimator so that the center of a cross cursor of the collimator is aligned with the center of a cross cursor of a test card; a reflecting prism is placed on the mounting surface of the adjustable workbench, and the reflecting surface of the reflecting prism is perpendicular to the mounting surface; the adjustable workbench is adjusted, so that the reflecting prism reflects the test light path of the collimator back to the center of the test hole of the collimator, and the mounting surface is calibrated to a first state parallel to the reference line; taking away the reflecting prism from the mounting surface and replacing the reflecting prism with the optical device; the adjustable workbench is adjusted, so that the center of a cross cursor of the test card shot by the optical device coincides with the cross center of a monitoring display picture of the optical device, and the mounting surface is in a second state parallel to the optical axis of the optical device; the optical device is taken away from the mounting surface and replaced with the reflecting prism, and the deviation measured by the collimator is the optical axis parallelism of the optical device. The measurement is simple, rapid and accurate.

The present application discloses a panel dust and defect detection method, device, equipment and storage medium, which relates to the field of image recognition. The AOI machine is used to shoot the illumination image of the panel to be tested under the test light source and the light-free image of the panel to be tested under no light source, and all suspected defect points contained in the illumination image of the panel to be tested are identified; then the illumination sub-image to be tested and the light-free sub-image to be tested are cropped from the two illumination images, and threshold binarization processing is performed to extract the defect contour from the binarized image; the suspected dust points are screened according to the pixel area of ​​the defect contour in the light-free sub-image to be tested, and the defect contours corresponding to the suspected dust points in the two sub-images to be tested are similarly matched, and the dust points and the real defect points are determined according to the matching results. Through the image feature comparison and geometric morphology matching mechanism under multi-light source conditions, combined with the pixel area screening of the defect contour and the cross-light source similarity analysis, the false defects caused by environmental interference and the defects of the panel itself can be effectively distinguished.

The invention relates to a laser radar rotating mirror testing device and method, and the device employs a double-light-path design: a testing light source is subjected to beam splitting through a spectroscope, is reflected by a reflector I and a rotating mirror to form a testing light spot, is reflected by a reflector II to form a reference light spot, and is synchronously projected to a testing plate; a high-precision camera is used for capturing light spot displacement, a reference mark is combined to calibrate a coordinate system, and sub-milliradian level detection of rotating mirror angle drift is achieved. A sealed heat preservation cover is linked with temperature control equipment, so that the temperature control precision of + / -0.1 DEG C is realized; the integrated clamp synchronously fixes the rotating mirror and the reflecting mirror II to eliminate relative displacement errors of parts; the damping optical platform thoroughly isolates ground vibration; the same test light source reduces test errors. According to the testing method, a drift curve is automatically generated through temperature circulation (-40 DEG C to 85 DEG C), the angle drift amount is calculated according to a formula, a temperature compensation model is output, and rotating mirror temperature drift characteristic evaluation and compensation parameters are provided for the high-precision laser radar.

The embodiment of the invention provides a light reflection detection device and a light reflection detection method, which are applied to the technical field of optical communication. The device comprises a light reflectometer, a calibration piece and a signal processor. The calibration member has a preset reflection intensity or a preset Rayleigh scattering intensity. The output end of the light reflectometer is connected with the calibration piece and is used for being connected with the test optical fiber through the calibration piece. The light reflectometer is used for transmitting a test light signal based on the output end of the light reflectometer and receiving an echo light signal of the test light signal. And the signal processor is used for outputting signal insertion loss at different positions of the test optical fiber according to the echo optical signal. The light reflection detection device provided by the embodiment of the invention can realize the purpose of accurately detecting the insertion loss of the near end of the test optical fiber.

A non-dispersive near infrared light is used for detecting analyte gases in a testing zone. A sample obtained from the testing zone is irradiated with a reference light and with test lights. The test lights are emitted in sequence and modulated to be out of phase with the reference light. Frequencies of the test lights are in the absorption bands of particular analyte gases, with the reference light frequency being outside of the absorption bands. Analyte presence in the sample is identified by sensing changes in differences over time of test light and reference light intensity. Before irradiating the sample, the lights are optically conditioned by aligning them on the same path, and splitting the bandwidth of some lights for detecting analytes with overlapping absorption bands.

The invention provides an automatic light intensity adjusting and shielding system and method for vehicle lamp testing, and relates to the technical field of vehicle lamp testing. Comprising a light intensity sensing module, an intelligent control module and a light transmittance execution module, the light intensity sensing module is used for collecting the light intensity of the tested sample piece in real time; the intelligent control module is used for calculating a light intensity deviation value and a light intensity change rate based on the received light intensity; based on the deviation value of the light intensity and the change rate of the light intensity, calculating and generating a light transmittance correction amount through a fuzzy PID control algorithm; obtaining a PWM control signal based on the light transmittance correction through a preset PWM duty ratio and a light transmittance formula; the light transmittance execution module is used for analyzing the PWM control signal to generate an electric signal form suitable for controlling the dimming glass assembly; the light transmittance adjusting module is used for adjusting light transmittance based on the electric signals sent by the driving module. The brightness is automatically adjusted by adjusting and controlling the light transmission, so that the brightness of a vehicle lamp test environment is always kept at a safe and appropriate level.

The invention belongs to the technical field of bio-based material testing equipment, and discloses a bio-based material photo-oxidative aging simulation testing device which comprises a box body, and a door body is arranged on the front face of the box body; the controller is fixedly arranged at the top of the box body and is used for controlling test parameters; the testing part is fixedly mounted on the inner wall of the top of the box body, is internally provided with illumination, temperature, humidity and oxygen concentration function devices, and is used for testing and evaluating the performance degradation rule and life expectation of the material; the rectangular box is fixedly mounted on the inner wall of the bottom of the box body, is rectangular in appearance, has a remarkable multi-dimensional adjustment function by arranging the rotating assembly, can ensure that the bio-based material is at the optimal illumination test angle in the test process, and can realize the optimal illumination test angle by combining longitudinal and transverse rotating mechanisms; and the bio-based material can rotate in all directions in a test area, so that accurate illumination angle adjustment is realized.

An object of the present disclosure is to provide a few-mode fiber testing method and a few-mode fiber testing device capable of acquiring a loss and inter-mode crosstalk for each mode at a connection point of a few-mode fiber by measurement only from one end of FUT. The few-mode fiber testing method according to the present disclosure includes receiving a test light pulse in a basic mode from one end of an optical fiber under test that is connected in series with few-mode fibers of the same type, measuring an intensity distribution relating to a distance from the one end of backward Brillouin scattering light generated by receiving a test light pulse, obtaining a transmittance of the backward Brillouin scattering light at a connection point of the optical fiber under test from the measured intensity distribution, and calculating a connection loss of the basic mode from the transmittance, calculating a ratio of an axial deviation amount to a mode field radius of the optical fiber under test at the connection point from the calculated connection loss, and calculating a connection loss of a higher-order mode and inter-mode crosstalk between different modes from the calculated ratio.